Patents by Inventor Paridhi GULATI

Paridhi GULATI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11159169
    Abstract: Analog circuits are often non-linear, and the non-linearities can hurt performance. Designers would trade off power consumption to achieve better linearity. An efficient and effective calibration technique can address the non-linearities and reduce the overall power consumption. A dither signal injected to the analog circuit can be used to expose the non-linear behavior in the digital domain. To detect the non-linearities, a counting approach is applied to isolate non-linearities independent of the input distribution. The approach is superior to and different from other approaches in many ways.
    Type: Grant
    Filed: May 18, 2020
    Date of Patent: October 26, 2021
    Assignee: ANALOG DEVICES, INC.
    Inventors: Ahmed Mohamed Abdelatty Ali, Paridhi Gulati
  • Publication number: 20200280320
    Abstract: Analog circuits are often non-linear, and the non-linearities can hurt performance. Designers would trade off power consumption to achieve better linearity. An efficient and effective calibration technique can address the non-linearities and reduce the overall power consumption. A dither signal injected to the analog circuit can be used to expose the non-linear behavior in the digital domain. To detect the non-linearities, a counting approach is applied to isolate non-linearities independent of the input distribution. The approach is superior to and different from other approaches in many ways.
    Type: Application
    Filed: May 18, 2020
    Publication date: September 3, 2020
    Applicant: Analog Devices, Inc.
    Inventors: Ahmed Mohamed Abdelatty ALI, Paridhi GULATI
  • Patent number: 10763878
    Abstract: Background calibration techniques can effectively to correct for memory, kick-back, and order-dependent errors in interleaved switched-capacitor track-and-hold (T/H) circuits and amplifiers. The techniques calibrate for errors in both the track/sample phase and the hold-phase, and account for the effects of interleaving, buffer/amplifier sharing, incomplete resetting, incomplete settling, chopping, and randomization on the offset, gain, memory, and kick-back errors. Moreover, the techniques can account for order-dependent and state-dependent hold-phase non-linearities. By correcting for these errors, the proposed techniques improve the noise performance, linearity, gain/offset matching, frequency response (and bandwidth), and order-dependence errors. The techniques also help increase the speed (sample rate and bandwidth) and linearity of T/H circuits and amplifiers while simplifying the analog circuitry and clocking needed.
    Type: Grant
    Filed: March 25, 2019
    Date of Patent: September 1, 2020
    Assignee: ANALOG DEVICES, INC.
    Inventors: Ahmed Mohamed Abdelatty Ali, Paridhi Gulati, Bryan S. Puckett, Huseyin Dinc
  • Patent number: 10659069
    Abstract: Analog circuits are often non-linear, and the non-linearities can hurt performance. Designers would trade off power consumption to achieve better linearity. An efficient and effective calibration technique can address the non-linearities and reduce the overall power consumption. A dither signal injected to the analog circuit can be used to expose the non-linear behavior in the digital domain. To detect the non-linearities, a counting approach is applied to isolate non-linearities independent of the input distribution. The approach is superior to and different from other approaches in many ways.
    Type: Grant
    Filed: December 14, 2018
    Date of Patent: May 19, 2020
    Assignee: ANALOG DEVICES, INC.
    Inventors: Ahmed Mohamed Abdelatty Ali, Paridhi Gulati
  • Patent number: 10547319
    Abstract: Multi-step ADCs performs multi-step conversion by generating a residue for a subsequent stage to digitize. To generate a residue, a stage in the multi-step ADC would reconstruct the input signal to the stage using a feedforward digital to analog converter (DAC). Non-linearities in the DAC can directly affect the overall performance of the multi-step ADC. To reduce power consumption and complexity of analog circuit design, digital background calibration schemes are implemented to address the non-linearities. The non-linearities that the calibration schemes address can include reference, DAC, and quantization non-linearities.
    Type: Grant
    Filed: September 21, 2018
    Date of Patent: January 28, 2020
    Assignee: ANALOG DEVICES, INC.
    Inventors: Ahmed Mohamed Abdelatty Ali, Paridhi Gulati
  • Publication number: 20190305791
    Abstract: Background calibration techniques can effectively to correct for memory, kick-back, and order-dependent errors in interleaved switched-capacitor track-and-hold (T/H) circuits and amplifiers. The techniques calibrate for errors in both the track/sample phase and the hold-phase, and account for the effects of interleaving, buffer/amplifier sharing, incomplete resetting, incomplete settling, chopping, and randomization on the offset, gain, memory, and kick-back errors. Moreover, the techniques can account for order-dependent and state-dependent hold-phase non-linearities. By correcting for these errors, the proposed techniques improve the noise performance, linearity, gain/offset matching, frequency response (and bandwidth), and order-dependence errors. The techniques also help increase the speed (sample rate and bandwidth) and linearity of T/H circuits and amplifiers while simplifying the analog circuitry and clocking needed.
    Type: Application
    Filed: March 25, 2019
    Publication date: October 3, 2019
    Applicant: Analog Devices, Inc.
    Inventors: Ahmed Mohamed Abdelatty ALI, Paridhi GULATI, Bryan S. PUCKETT, Huseyin DINC
  • Publication number: 20190245550
    Abstract: Analog circuits are often non-linear, and the non-linearities can hurt performance. Designers would trade off power consumption to achieve better linearity. An efficient and effective calibration technique can address the non-linearities and reduce the overall power consumption. A dither signal injected to the analog circuit can be used to expose the non-linear behavior in the digital domain. To detect the non-linearities, a counting approach is applied to isolate non-linearities independent of the input distribution. The approach is superior to and different from other approaches in many ways.
    Type: Application
    Filed: December 14, 2018
    Publication date: August 8, 2019
    Applicant: Analog Devices, Inc.
    Inventors: Ahmed Mohamed Abdelatty ALI, Paridhi GULATI
  • Publication number: 20190131992
    Abstract: Multi-step ADCs performs multi-step conversion by generating a residue for a subsequent stage to digitize. To generate a residue, a stage in the multi-step ADC would reconstruct the input signal to the stage using a feedforward digital to analog converter (DAC). Non-linearities in the DAC can directly affect the overall performance of the multi-step ADC. To reduce power consumption and complexity of analog circuit design, digital background calibration schemes are implemented to address the non-linearities. The non-linearities that the calibration schemes address can include reference, DAC, and quantization non-linearities.
    Type: Application
    Filed: September 21, 2018
    Publication date: May 2, 2019
    Applicant: Analog Devices, Inc.
    Inventors: Ahmed Mohamed Abdelatty Ali, Paridhi GULATI