Patents by Inventor Parisa Kamgar

Parisa Kamgar has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Measurement of device materials using non-Faradaic electrochemical impedance spectroscopy
    Patent number: 11311215
    Abstract: The invention includes method and materials designed to measure the material properties (e.g. thickness) of layers of material in a sensor using non-Faradaic EIS (Electrochemical Impedance Spectroscopy) methods. The methods are non-destructive, very sensitive and rapid. Typically in these methods, an AC voltage is applied to the desired material layer while the output current and therefore impedance is measured. This voltage can be applied in multiple frequencies in sweep mode in order to detect both the material and, for example, the thickness of the target material. In this way, EIS allows the characterization of properties of various layers of material disposed in devices such as electrochemical glucose sensors.
    Type: Grant
    Filed: April 4, 2019
    Date of Patent: April 26, 2022
    Assignee: MEDTRONIC MINIMED, INC.
    Inventors: Chi-En Lin, David Probst, Mohsen Askarinya, Akhil Srinivasan, Melissa Tsang, Michael E. Miller, Parisa Kamgar
  • MEASUREMENT OF DEVICE MATERIALS USING NON-FARADAIC ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY
    Publication number: 20200315504
    Abstract: The invention includes method and materials designed to measure the material properties (e.g. thickness) of layers of material in a sensor using non-Faradaic EIS (Electrochemical Impedance Spectroscopy) methods. The methods are non-destructive, very sensitive and rapid. Typically in these methods, an AC voltage is applied to the desired material layer while the output current and therefore impedance is measured. This voltage can be applied in multiple frequencies in sweep mode in order to detect both the material and, for example, the thickness of the target material. In this way, EIS allows the characterization of properties of various layers of material disposed in devices such as electrochemical glucose sensors.
    Type: Application
    Filed: April 4, 2019
    Publication date: October 8, 2020
    Applicant: MEDTRONIC MINIMED, INC.
    Inventors: Chi-En Lin, David Probst, Mohsen Askarinya, Akhil Srinivasan, Melissa Tsang, Michael E. Miller, Parisa Kamgar