Abstract: A method and apparatus for generating high-order harmonics in a solid-state medium comprising integrated semiconductor devices and electronics. The high-order harmonics interact with and are modified by the internal electric field associated with the operation of the integrated semiconductor devices and electronics. Measurement of the high-order harmonics after modification by the internal electric fields amounts to high resolution (temporal and spatial) dynamic imaging of the internal electric fields associated with the integrated semiconductor devices and electronics.

Abstract: A method and apparatus for generating high-order harmonics in a solid-state medium comprising integrated semiconductor devices and electronics. The high-order harmonics interact with and are modified by the internal electric field associated with the operation of the integrated semiconductor devices and electronics. Measurement of the high-order harmonics after modification by the internal electric fields amounts to high resolution (temporal and spatial) dynamic imaging of the internal electric fields associated with the integrated semiconductor devices and electronics.

Abstract: A method and apparatus is disclosed for generating tunable attosecond-scale radiation pulses, with a frequency in range of mid-infrared to ultra-violet, from a silicon medium. The invention utilizes an intense laser pulse to drive a high harmonic generation (HHG) process in a silicon medium and a weak secondary field to control the HHG process. The weak secondary field has a frequency equal to the second harmonic of the intense laser pulse. The spatial, temporal and spectral properties of the HHG process and the emitted harmonic beam are tuned by adjusting the relative delay between the two fields and the intensity of the weak secondary field.

Abstract: A method and apparatus is disclosed for generating tunable attosecond-scale radiation pulses, with a frequency in range of mid-infrared to ultra-violet, from a silicon medium. The invention utilizes an intense laser pulse to drive a high harmonic generation (HHG) process in a silicon medium and a weak secondary field to control the HHG process. The weak secondary field has a frequency equal to the second harmonic of the intense laser pulse. The spatial, temporal and spectral properties of the HHG process and the emitted harmonic beam are tuned by adjusting the relative delay between the two fields and the intensity of the weak secondary field.

Abstract: A method of accurately and precisely providing desired functionality to an electronic or opto-electronic component is disclosed in which a Femtosecond laser pulse is used to ablate material from a surface of or from within a component. The component is in active operation during the ablation process in order to facilitate the ablation process. The process also involves detection and feedback to indicate when a repair is sufficiently complete. The detection is also performed while the component is powered allowing in-situ detection and ablation. Of course, forms of facilitation other than feedback such as monitoring are also applicable to the invention.

Abstract: A method of making connections between arrays of optical components such as waveguides, fibers and diode lasers, by linking them with optical waveguides written directly in three-dimensional blocks or wafers of a transparent dielectric material such as glass. If arrays are to be connected, any element can be connected to any other element, providing the flexibility to make cross-connects. In a particular embodiment, femtosecond laser dielectric modification is employed to manufacture the optical connector.

Abstract: A method of accurately and precisely providing desired functionality to an electronic or opto-electronic component is disclosed in which a Femtosecond laser pulse is used to ablate material from a surface of or from within a component. The component is in active operation during the ablation process in order to facilitate the ablation process. The process also involves detection and feedback to indicate when a repair is sufficiently complete. The detection is also performed while the component is powered allowing in-situ detection and ablation. Of course, forms of facilitation other than feedback such as monitoring are also applicable to the invention.

Abstract: A method and apparatus is provided for propagating photoelectrons in a semiconductor material and for controlling the direction of photoelectrons produced in a semiconductor material. A selected region of the semiconductor material is irradiated with two beams of light that overlap in space and time. The two interfering light beams have a predetermined phase relationship and are harmonically related such that the frequency of one is approximately a multiple of two of the other. Each of the beams of light produce substantially a same number of photoelectrons in the semiconductor material. As the phase relationship between the two beams is varied, the direction of propagation of the photoelectrons produced, varies.

Abstract: A plasma is induced in a transmissive medium, and causes a chirp to be impressed on an optical pulse. The chirped pulse when passed through a dispersing means is then compressed. Applications of this pulse compression technique include the generation of short pulses of infrared at high power levels. Picosecond pulses of 10 micron energy are generated by switching a 2 picosecond portion from the output of a multi-atmosphere laser oscillator, and amplifying the portion in a CO.sub.2 gain module operated at gain saturation to cause a plasma front to propagate with the portion being amplified. A blue chirp of the pulse results. The pulse is passed through a dispersive medium, and a substantial decrease in pulse width and increase in energy density occurs during successive passes of the pulse through the gain module. Pulses as short as 500 femtoseconds have been produced at power densities of the order of 10.sup.12 watts/cm.sup.2. A TE/CO.sub.

Abstract: A method and apparatus for switching an infrared radiation signal laser beam in which a semiconductor, capable of transmitting the signal beam without damage, is provided and upon which the signal beam is incident at an angle which may preferably be Brewster's angle. The surface of the semiconductor is irradiated by a second laser beam which has a sufficiently high frequency to produce free carriers in the semiconductor and which has a sufficient radiation intensity and time duration to produce a free carrier density greater than the critical density for the signal beam resulting in substantially total reflection of the signal beam from the semiconductor surface. In particular, a pulsed CO.sub.2 laser beam which is incident on a polycrystalline n-type germanium semiconductor is reflected by irradiating the semiconductor with a pulsed ruby or Nd:glass laser beam.