Abstract: The invention provides methods and compositions for treating wash water from concrete production with carbon dioxide. The treated wash water can be reused as mix water in fresh batches of concrete.

Abstract: The present disclosure provides methods and compositions for the multiplexed detection of multiple analytes from a sample. Analytes may be nucleic acid analytes. Detection of analytes may comprise contacting one or more sample subsets with hybridization probes, thereby generating one or more cumulative signal measurements capable of detecting the presence of absence of a plurality of analytes.

Abstract: A metrology system includes a controller communicatively coupled to one or more metrology tools. In another embodiment, the controller includes one or more processors configured to execute program instructions causing the one or more processors to receive one or more overlay metrology measurements of one or more metrology targets of the metrology sample from the one or more metrology tools; determine tilt from the one or more measurement overlay measurements; and determine one or more correctables for at least one of one or more lithography tools or the one or more metrology tools to adjust for the tilt, where the one or more correctables are configured to reduce an amount of tilt in the sample or overlay inaccuracy of the one or more overlay metrology measurements. The program instructions further cause the one or more processors to predict tilt with a simulator based on at least the determined tilt.

Abstract: The tool assembly includes a main body and a bypass assembly. The main body has an off-set through bore and a cavity to fit the bypass assembly. The cavity includes a cavity surface, a first fluid bypass port, a second fluid bypass port, and a pressure inlet port. There is also a flow restrictor in fluid connection with the pressure inlet port. The bypass assembly includes a bypass housing, a pressure chamber, a piston with a first piston position and a second piston position, and a spring assembly. A pressure differential created by fluid flow through the pressure chamber and flow restrictor actuates the piston between the first piston position and the second piston position. The proportional flow through the tool assembly and through the bypass ports can now be controlled to perform the downhole work, including drilling and hole cleaning.

Abstract: A metrology system includes a controller communicatively coupled to one or more metrology tools. In another embodiment, the controller includes one or more processors configured to execute program instructions causing the one or more processors to receive one or more overlay metrology measurements of one or more metrology targets of the metrology sample from the one or more metrology tools; determine tilt from the one or more measurement overlay measurements; and determine one or more correctables for at least one of one or more lithography tools or the one or more metrology tools to adjust for the tilt, where the one or more correctables are configured to reduce an amount of tilt in the sample or overlay inaccuracy of the one or more overlay metrology measurements. The program instructions further cause the one or more processors to predict tilt with a simulator based on at least the determined tilt.

Abstract: The tool assembly includes a main body and a bypass assembly. The main body has an off-set through bore and a cavity to fit the bypass assembly. The cavity includes a cavity surface, a first fluid bypass port, a second fluid bypass port, and a pressure inlet port. There is also a flow restrictor in fluid connection with the pressure inlet port. The bypass assembly includes a bypass housing, a pressure chamber, a piston with a first piston position and a second piston position, and a spring assembly. A pressure differential created by fluid flow through the pressure chamber and flow restrictor actuates the piston between the first piston position and the second piston position. The proportional flow through the tool assembly and through the bypass ports can now be controlled to perform the downhole work, including drilling and hole cleaning.

Abstract: Systems and methods for visualization of a molecule, comprising a set of particles, are provided. A set of three-dimensional coordinates is obtained, each coordinate describing a position for a corresponding particle. A cost function containing an error in a set of two-dimensional coordinates, where each two-dimensional coordinate corresponds to a three-dimensional coordinate in the set of three-dimensional coordinates, is minimized until an exit condition is achieved. The minimization alters the two-dimensional coordinate values. A set of physical properties SM is obtained, each such property representing a property shared by a pair of particles in the molecule. The coordinates are plotted as nodes of a two-dimensional graph after minimization, connected by a plurality of edges. An edge connects a coordinate pair in the graph that corresponds to a pair of particles in the molecule. A characteristic of the edge is determined by a physical property for the pair of particles.

Abstract: Reverse decoration can be used to detect defects in a device. The wafer can include NAND stacks or other devices. The defect can be a channel bridge, a void, or other types of defects. Reverse decoration can preserve a defect and/or can improve defect detection. A portion of a layer may be removed from a device. A layer also may be added to the device, such as on the defect, and some of the layer may be removed.

Abstract: Systems and methods for visualization of a molecule, comprising a set of particles, are provided. A set of three-dimensional coordinates is obtained, each coordinate describing a position for a corresponding particle. A cost function containing an error in a set of two-dimensional coordinates, where each two-dimensional coordinate corresponds to a three-dimensional coordinate in the set of three-dimensional coordinates, is minimized until an exit condition is achieved. The minimization alters the two-dimensional coordinate values. A set of physical properties SM is obtained, each such property representing a property shared by a pair of particles in the molecule. The coordinates are plotted as nodes of a two-dimensional graph after minimization, connected by a plurality of edges. An edge connects a coordinate pair in the graph that corresponds to a pair of particles in the molecule. A characteristic of the edge is determined by a physical property for the pair of particles.

Abstract: Systems and methods for two-dimensional visualization of a molecule, comprising the set of particles {p1, . . . , pN}, are provided. A set of N three-dimensional coordinates {x1, . . . , xN} is obtained, each xi in {x1, . . . , xN} describing a three-dimensional position for a corresponding particle pi in {p1, . . . , pN}. A cost function containing the error in a set of two-dimensional coordinates (c1, . . . , cN), where each ci in (c1, . . . , cN) corresponds to a three-dimensional coordinate xi in {x1, . . . , xN}, is minimized until an exit condition is achieved. The minimization alters the values of (c1, . . . , cN). A set of physical properties SM is obtained, each si,j in SM representing a physical property shared by a pair of particles (pi, pj) in {p1, . . . , pN}. Coordinates (c1, . . . , cN) are plotted as nodes of a two-dimensional graph after minimization. A plurality of edges for the graph is plotted.

Abstract: Reverse decoration can be used to detect defects in a device. The wafer can include NAND stacks or other devices. The defect can be a channel bridge, a void, or other types of defects. Reverse decoration can preserve a defect and/or can improve defect detection. A portion of a layer may be removed from a device. A layer also may be added to the device, such as on the defect, and some of the layer may be removed.

Abstract: Systems and methods for two-dimensional visualization of a molecule, comprising the set of particles {p1, . . . , pN}, are provided. A set of N three-dimensional coordinates {x1, . . . , xN} is obtained, each xi in {x1, . . . , xN} describing a three-dimensional position for a corresponding particle pi in {p1, . . . , pN}. A cost function containing the error in a set of two-dimensional coordinates (c1, . . . , cN), where each ci in (c1, . . . , cN) corresponds to a three-dimensional coordinate xi in {x1, . . . , xN}, is minimized until an exit condition is achieved. The minimization alters the values of (c1, . . . , cN). A set of physical properties SM is obtained, each si,j in SM representing a physical property shared by a pair of particles (pi, pj) in {p1, . . . , pN}. Coordinates (c1, . . . , cN) are plotted as nodes of a two-dimensional graph after minimization. A plurality of edges for the graph is plotted.

Abstract: Systems, servers, methods, media, and programs for managing meeting ratings in a distributed system are provided. A feedback application generates a calendar invitation for a meeting to a meeting leader and meeting attendees, hosts the meeting, provides a request for feedback to the meeting attendees, generates a summary of the feedback or a recommendation for the meeting leader based on the feedback and provides the meeting leader with the summary of the feedback or the recommendation. The feedback application can also determine that the meeting leader is eligible for a reward.

Abstract: Systems and methods for two-dimensional visualization of a molecule, comprising the set of particles {p1, . . . , pN}, are provided. A set of N three-dimensional coordinates {x1, . . . , xN} is obtained, each xi in {x1, . . . , xN} describing a three-dimensional position for a corresponding particle pi in {p1, . . . , pN}. A cost function containing the error in a set of two-dimensional coordinates (c1, . . . , cN), where each Ci in (c1, . . . , cN) corresponds to a three-dimensional coordinate xi in {x1, . . . , xN}, is minimized until an exit condition is achieved. The minimization alters the values of (c1, . . . , cN). A set of physical properties SM is obtained, each Si,j in SM representing a physical property shared by a pair of particles (pi, pj) in {p1, . . . , pN}. Coordinates (c1, . . . , cN) are plotted as nodes of a two-dimensional graph after minimization. A plurality of edges for the graph is plotted.

Abstract: A weather strip seal is provided for sealing between first and second structures, and a method for manufacturing such a strip seal. The weather strip seal includes a main leg made of a polymeric material, having one side and another side and terminating in first and second ends, a first sealing portion designed to press against the first structure and extending on the one side of the leg adjacent the first end, and a metal carrier for retaining the shape of the strip seal which has an asymmetrical substantially U-shaped cross-section having a first branch reinforcing a portion of the main leg and a second branch extending from the second end on the another side and terminating in a second sealing portion designed to sealingly press against the second structure. An ionomer tie layer is located between the metal surface and the at least one polymeric material.

Abstract: One embodiment relates to a method of reviewing defects using a scanning electron microscope (SEM). A defect location having a defect for review is selected, and the SEM is configured to be in a first imaging configuration. The selected defect location is imaged using the SEM to generate a first SEM image of the selected defect location. A determination is made as to whether the defect is visible or non-visible in the first SEM image. If the defect is non-visible in the first SEM image, then the SEM is configured to be into a second imaging configuration, the selected defect location is imaged using the SEM to generate a second SEM image of the selected defect location, and a further determination is made as to whether the defect is visible or non-visible in the second SEM image. Other embodiments, aspects and features are also disclosed.

Abstract: A weather strip seal is provided for sealing between first and second structures, and a method for manufacturing such a strip seal. The weather strip seal includes a main leg made of a polymeric material, having one side and another side and terminating in first and second ends, a first sealing portion designed to press against the first structure and extending on the one side of the leg adjacent the first end, and a metal carrier for retaining the shape of the strip seal which has an asymmetrical substantially U-shaped cross-section having a first branch reinforcing a portion of the main leg and a second branch extending from the second end on the another side and terminating in a second sealing portion designed to sealingly press against the second structure. An ionomer tie layer is located between the metal surface and the at least one polymeric material.

Abstract: System and method for adjusting the angle of a prosthetic ankle are disclosed. In one example, the system, such as an actuated prosthetic ankle joint, detects the surface angle and actively adjusts the members of the ankle to a preferred angle according to the respective slope of the incline/decline.

Abstract: In one aspect a system and method for providing a multi-port memory having a plurality of read ports, each read port including a filter coefficient value representing a dispersion compensation value associated with an optical link. The method includes processing an input optical signal using the filter coefficient values in the multi-port memory to generate an output optical signal for transmission on the optical link.

Abstract: One aspect of the present invention is a method of monitoring processes, optimizing processes, and diagnosing problems in the performance of a process tool for processing a workpiece. Another aspect of the present invention is a system configured for monitoring processes, optimizing processes, and diagnosing problems in the performance of a process tool for processing a workpiece. One embodiment of the present invention includes a software program that can be implemented in a computer for optimizing the performance of a process tool for processing a workpiece.