Patents by Inventor Peiyan CAO

Peiyan CAO has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11941850
    Abstract: Disclosed herein is an image sensor with two radiation detectors, each having a planar surface for receiving radiation; and a calibration pattern. The planar surfaces of the radiation detectors are not coplanar. The image sensor can capture images of two portions of the calibration pattern, respectively using the radiation detectors. The image sensor can determine two transformations for the radiation detectors based on the images of the portions of the calibration pattern, respectively. The image sensor can capture images of two portions of a scene, respectively using the radiation detectors, determine projections of the images of the portions of the scene onto an image plane using the transformations, respectively, and form an image of the scene by stitching the projections.
    Type: Grant
    Filed: September 10, 2021
    Date of Patent: March 26, 2024
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventors: Yurun Liu, Peiyan Cao
  • Patent number: 11921056
    Abstract: Disclosed herein is an apparatus comprising: a first radiation source configured to produce a first divergent beam of radiation toward an object; a second radiation source configured to produce a second divergent beam of radiation toward the object; and an image sensor. The image sensor, the first radiation source and the second radiation source are configured to rotate around the object, and relative positions among the image sensor, the first radiation source and the second radiation source are fixed during rotation around the object. The method of using the apparatus is also disclosed herein.
    Type: Grant
    Filed: December 22, 2020
    Date of Patent: March 5, 2024
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventors: Peiyan Cao, Yurun Liu
  • Patent number: 11918394
    Abstract: Disclosed herein is a detector, comprising: a radiation absorption layer comprising an electric contact; a filter electrically connected to the electric contact and configured to attenuate signals from the electric contact below a first cutoff frequency; an integrator electrically connected to the filter and configured to integrate signals from the filter over a period of time.
    Type: Grant
    Filed: December 21, 2020
    Date of Patent: March 5, 2024
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventors: Peiyan Cao, Yurun Liu
  • Publication number: 20240064407
    Abstract: Disclosed herein is a method of using an image sensor comprising N sensing areas for capturing images of a scene, the N sensing areas being physically separate from each other, the method comprising: for i=1, . . . , P, and j=1, . . . , Q(i), positioning the image sensor at a location (i, j) and capturing a partial image (i, j) of the scene using the image sensor while the image sensor is at the location (i, j), thereby capturing in total R partial images, wherein R is the sum of Q(i), i=1, . . . , P, wherein P>1, wherein Q(i), i=1, . . . , P are positive integers and are not all 1, wherein for i=1, . . . , P, a location group (i) comprises the locations (i, j), j=1, . . . , Q(i), and wherein a minimum distance between 2 locations of 2 different location groups is substantially larger than a maximum distance between two locations of a same location group; and determining a combined image of the scene based on the R partial images.
    Type: Application
    Filed: October 17, 2023
    Publication date: February 22, 2024
    Inventors: Peiyan CAO, Yurun LIU
  • Patent number: 11906677
    Abstract: Disclosed herein is a method of recovering performance of a radiation detector, the radiation detector comprising: a radiation absorption layer configured to absorb radiation particles incident thereon and generate an electrical signal based on the radiation particles; an electronic system configured to process the electrical signal, the electronic system comprising a transistor, the transistor comprising a gate insulator with positive charge carriers accumulated therein due to exposure of the gate insulator to radiation; the method comprising: removing the positive charge carriers from the gate insulator by establishing an electric field across the gate insulator.
    Type: Grant
    Filed: March 2, 2022
    Date of Patent: February 20, 2024
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventors: Peiyan Cao, Yurun Liu
  • Patent number: 11904187
    Abstract: Disclosed herein is a method comprising: generating multiple radiation beams respectively from multiple locations toward an object and an image sensor, wherein the image sensor comprises an array of multiple active areas, and gaps among the multiple active areas, and capturing multiple partial images of the object with the image sensor using respectively radiations of the multiple radiation beams that have passed through and interacted with the object, wherein each point of the object is captured in at least one partial image of the multiple partial images.
    Type: Grant
    Filed: July 6, 2021
    Date of Patent: February 20, 2024
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventors: Peiyan Cao, Yurun Liu
  • Patent number: 11906676
    Abstract: Disclosed herein is a radiation detector, comprising a first pixel; a first reflector; and a first scintillator, wherein the first reflector is configured to guide essentially all photons emitted by the first scintillator into the first pixel. The first reflector is configured to reflect photons emitted by the first scintillator toward the first reflector. The first scintillator is essentially completely enclosed by the first reflector and the first pixel.
    Type: Grant
    Filed: September 10, 2021
    Date of Patent: February 20, 2024
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventors: Peiyan Cao, Yurun Liu
  • Patent number: 11901244
    Abstract: Disclosed herein is a method comprising: attaching a plurality of chips to a substrate, wherein each of the chips comprises only one pixel configured to detect radiation. Disclosed herein is a method comprising: attaching a wafer to a substrate, wherein the substrate comprises discrete electrodes, wherein the wafer comprises a radiation absorption layer and a plurality of electrical contacts, wherein each of the electrical contacts is connected to at least one of the discrete electrodes; identifying a defective area of the wafer; replacing a portion of the wafer with a chip configured to absorb radiation, the portion comprising the defective area.
    Type: Grant
    Filed: December 21, 2020
    Date of Patent: February 13, 2024
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventors: Peiyan Cao, Yurun Liu
  • Publication number: 20240045086
    Abstract: Disclosed herein is a method comprising emitting particles of radiation from a first position on a radiation source toward a scene; capturing a first partial image of the scene by an image sensor using the particles of radiation from only the first position; emitting particles of radiation from a second position on the radiation source toward the scene, the second position being different from the first position relative to the scene; capturing a second partial image of the scene by the image sensor using the particles of radiation from only the second position; forming an image of the scene by stitching the partial images; wherein the image sensor has dead zones among radiation detectors arranged in strips; wherein a portion of the scene in the first partial image is formed by the particles of radiation from only the first position falls on the dead zones of the image sensor.
    Type: Application
    Filed: October 23, 2023
    Publication date: February 8, 2024
    Inventors: Peiyan CAO, Yurun LIU
  • Publication number: 20240036220
    Abstract: Disclosed herein are apparatuses for detecting radiation and methods of making them. The method comprises forming a recess into a semiconductor substrate, wherein a portion of the semiconductor substrate extends into the recess and is surrounded by the recess; depositing semiconductor nanocrystals into the recess, the semiconductor nanocrystals having a different composition from the semiconductor substrate; forming a first doped semiconductor region in the semiconductor substrate; forming a second doped semiconductor region in the semiconductor substrate; wherein the first doped semiconductor region and the second doped semiconductor region form a p-n junction that separates the portion from the rest of the semiconductor substrate.
    Type: Application
    Filed: October 5, 2023
    Publication date: February 1, 2024
    Inventors: Yurun LIU, Peiyan CAO
  • Patent number: 11882378
    Abstract: Disclosed herein is a method, comprising sending radiation beam groups (i, j), i=1, . . . , M and j=1, . . . , Ni toward a same scene, wherein each radiation beam group comprises multiple parallel fan radiation beams sent simultaneously, wherein for each value of i, the radiation beam groups (i, j), j=1, . . . , Ni are parallel to each other and are sent one group at a time, and wherein no two radiation particle paths of two respective radiation beam groups with 2 different values of i are parallel to each other; for i=1, . . . , M and j=1, . . . , Ni, capturing with radiation of the radiation beam group (i, j) a partial image (i, j) of the scene; for each value of i, stitching the partial images (i, j), j=1, . . . , Ni; and reconstructing a 3-dimensional image of the scene from the stitched images (i), i=1, . . . , M.
    Type: Grant
    Filed: June 20, 2023
    Date of Patent: January 23, 2024
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventors: Yurun Liu, Peiyan Cao
  • Publication number: 20240003830
    Abstract: Disclosed herein is a method, comprising: capturing portion images of scene portions (i), i=1, . . . , N of a scene with radiation detectors of an image sensor. For i=1, . . . , N, Qi portion images of the scene portion (i) are respectively captured by Qi radiation detectors of the P radiation detectors, Qi being an integer greater than 1. The Qi portion images are of the portion images. The method further includes, for i=1, . . . , N, generating an enhanced portion image (i) from the Qi portion images of the scene portion (i). Generating the enhanced portion image (i) is based on positions and orientations of the Qi radiation detectors with respect to the image sensor and displacements between Qi imaging positions of the scene with respect to the image sensor. The scene is at the Qi imaging positions when the Qi radiation detectors respectively capture the Qi portion images.
    Type: Application
    Filed: September 14, 2023
    Publication date: January 4, 2024
    Inventors: Yurun LIU, Peiyan CAO
  • Patent number: 11860322
    Abstract: Disclosed herein is a radiation detector, comprising: an avalanche photodiode (APD) with a first side coupled to an electrode and configured to work in a linear mode; a capacitor module electrically connected to the electrode and comprising a capacitor, wherein the capacitor module is configured to collect charge carriers from the electrode onto the capacitor; a current sourcing module in parallel to the capacitor, the current sourcing module configured to compensate for a leakage current in the APD and comprising a current source and a modulator; wherein the current source is configured to output a first electrical current and a second electrical current; wherein the modulator is configured to control a ratio of a duration at which the current source outputs the first electrical current to a duration at which the current source outputs the second electrical current.
    Type: Grant
    Filed: November 7, 2022
    Date of Patent: January 2, 2024
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventors: Peiyan Cao, Yurun Liu
  • Patent number: 11852760
    Abstract: Disclosed herein is a method comprising: aligning a collimator and a plurality of radiation detectors of an image sensor by: moving the radiation detectors along a first direction; moving the collimator along a second direction perpendicular to the first direction; rotating the collimator about an axis perpendicular to the first direction and the second direction; wherein the plurality of radiation detectors are configured to capture images of portions of a scene at different image capturing positions, respectively, and to form an image of the scene by stitching the images of the portions.
    Type: Grant
    Filed: September 10, 2021
    Date of Patent: December 26, 2023
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventors: Peiyan Cao, Yurun Liu
  • Publication number: 20230411433
    Abstract: Disclosed herein is an imaging system, comprising: an image sensor which comprises: a system printed circuit board (system PCB); M group printed circuit boards (group PCBs (i), i=1, . . . , M) mounted on a mounting surface of the system PCB; and Ni radiation detectors mounted on the group PCB (i), for i=1, . . . , M, wherein M and Ni, i=1, . . . , M are integers greater than 1, wherein the image sensor is configured to scan a scene in a scanning direction, and wherein, for each group PCB (i), there is not a plane which (A) is parallel to a normal direction of the mounting surface of the system PCB, (B) is parallel to the scanning direction, (C) divides all active areas of the Ni radiation detectors into 2 groups of active areas, and (D) does not intersect any active area of all the active areas of the Ni radiation detectors.
    Type: Application
    Filed: August 30, 2023
    Publication date: December 21, 2023
    Inventors: Peiyan CAO, Yurun LIU
  • Publication number: 20230410250
    Abstract: Disclosed herein is a method, comprising: for i=1, . . . , N, one by one, exposing a radiation detector to a radiation beam (i) thereby causing the radiation detector to capture a partial image (i) of the radiation beam (i), wherein N is an integer greater than 1; for i=1, . . . , N, determining, in the partial image (i), Mi pinpointing picture elements of a boundary image (i) of a boundary (i) of the radiation beam (i), wherein Mi is a positive integer; and stitching the partial images (i), i=1, . . . , N resulting in a combined image based on the Mi (i=1, . . . , N) pinpointing picture elements.
    Type: Application
    Filed: August 25, 2023
    Publication date: December 21, 2023
    Inventors: Peiyan CAO, Yurun LIU
  • Patent number: 11848347
    Abstract: Disclosed herein is an image sensor and a method of making the image sensor. The image sensor may comprise one or more packages of semiconductor radiation detectors. Each of the one or more packages may comprise a radiation detector that comprises a radiation absorption layer on a first strip of semiconductor wafer and an electronics layer on a second strip of semiconductor wafer. The radiation absorption layer may be continuous along the first strip of semiconductor wafer with no coverage gap. The first strip and the second strip may be longitudinally aligned and bonded together. The radiation detector may be mounted on a printed circuit board (PCB) and electrically connected to the PCB close to an edge of the radiation detector.
    Type: Grant
    Filed: December 10, 2019
    Date of Patent: December 19, 2023
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventors: Peiyan Cao, Chongshen Song, Yurun Liu
  • Publication number: 20230402486
    Abstract: Disclosed herein is a method, comprising: capturing via an exposure a first image with a first radiation detector which comprises a first active area and a first dummy area, wherein the first dummy area is disposed between application-specific integrated circuit (ASIC) chips of the first radiation detector, and wherein the first image comprises (A) first regular picture elements corresponding to the first active area and (B) first dummy picture elements corresponding to the first dummy area; and determining values of the first dummy picture elements based on values of the first regular picture elements.
    Type: Application
    Filed: August 25, 2023
    Publication date: December 14, 2023
    Inventors: Peiyan CAO, Yurun LIU
  • Publication number: 20230397897
    Abstract: Disclosed herein is an image sensor comprising: a plurality of X-ray detectors; an actuator configured to move the plurality of X-ray detectors to a plurality of positions along a direction, wherein the image sensor is configured to capture, by using the detectors, images of portions of a scene at the positions, respectively; wherein each image of the portion has at least one edge that is at an angle with the direction; and wherein the image sensor is configured to form an image of the scene by stitching the images of the portions.
    Type: Application
    Filed: August 30, 2023
    Publication date: December 14, 2023
    Inventors: Yurun LIU, Peiyan CAO
  • Patent number: 11837624
    Abstract: Disclosed herein are a radiation detector and a method of making it. The radiation detector is configured to absorb radiation particles incident on a semiconductor single crystal of the radiation detector and to generate charge carriers. The semiconductor single crystal may be a CdZnTe single crystal or a CdTe single crystal. The method may comprise forming a recess into a substrate of semiconductor; forming a semiconductor single crystal in the recess; and forming a heavily doped semiconductor region in the substrate. The semiconductor single crystal has a different composition from the substrate. The heavily doped region is in electrical contact with the semiconductor single crystal and embedded in a portion of intrinsic semiconductor of the substrate.
    Type: Grant
    Filed: March 28, 2022
    Date of Patent: December 5, 2023
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventors: Peiyan Cao, Yurun Liu