Abstract: A system for testing a first layer disposed over a capacitive sensing device includes a test probe having a substantially flat conductive test surface, a device under test (DUT) disposed over the capacitive sensing device, and a power supply operatively connected to the test probe. The DUT can include the first layer and one or more additional layers. The substantially flat conductive test surface is positioned over a surface of the DUT and applies power to the DUT. The capacitance between the test probe and at least one capacitive sensing element in the capacitive sensing device is then measured.

Abstract: A test system may be provided in which devices under test are loaded into test trays and tested at a plurality of test stations. To test a device under test at a given test station, the test tray may be installed into a test fixture at the test station. Test equipment at each test station may communicate with the device under test via the test fixture and the test tray. Each test tray may have a spring-loaded corner portion that may be used to secure the device under test to the test tray. The test tray may have contacts that mate with corresponding contacts at each test fixture and may have a built in cable that connects to the device under test. The test fixture may have a detector that can detect whether or not a test tray is present on the test fixture.

Abstract: A test system may be provided in which devices under test are tested using radio-frequency test stations. A test station may include a test host, a test unit coupled to the test host, and a shielded enclosure. The shielded enclosure may contain a test antenna coupled to the test unit via a radio-frequency cable. A computer-controlled loading arm may be used to place a device under test on a positioner within the test enclosure. The test enclosure may have an enclosure door that is opened and closed using a computer-controlled pneumatic cylinder. When the enclosure door is closed, a portion of the enclosure door may actuate one or more levers on the positioner, which may in turn actuate one or more positioning arms to press the device under test against one or more guide surfaces on the positioner, thereby precisely positioning the device under test within the test enclosure.

Abstract: A test system may be provided in which devices under test are tested using radio-frequency test stations. A test station may include a test host, a test unit coupled to the test host, and a shielded enclosure. The shielded enclosure may contain a test antenna coupled to the test unit via a radio-frequency cable. A computer-controlled loading arm may be used to place a device under test on a positioner within the test enclosure. The test enclosure may have an enclosure door that is opened and closed using a computer-controlled pneumatic cylinder. When the enclosure door is closed, a portion of the enclosure door may actuate one or more levers on the positioner, which may in turn actuate one or more positioning arms to press the device under test against one or more guide surfaces on the positioner, thereby precisely positioning the device under test within the test enclosure.

Abstract: A test system may be provided in which devices under test (DUTs) are loaded into test trays. Test trays may be moved between test stations using a conveyor belt. The test system may include loading equipment for placing test trays on the conveyor belt at desired intervals. Each test tray may be tested using test stations positioned along the conveyor belt. A first group of test stations may be configured to test DUTs in their upright orientation, whereas a second group of test stations may be configured to test DUTs in their inverted orientation. Test tray flipping equipment may be interposed between the first and second groups of test stations. The flipping equipment may include a movable arm configured to receive an incoming tray, grab the tray, lift the tray from the conveyor belt, rotate the tray, and drop off the tray back onto the conveyor belt.

Abstract: A test system may be provided in which devices under test are loaded into test trays. Each test tray may include clamps for retaining a device under test within the test tray. The test tray may be configured to transmit test tray identification information to facilitate tracking of the device under test associated with the test tray. The test tray may include engagement features configured to receive corresponding engagement features on a computer-controlled loading arm. The loading arm may be used to move the test tray and associated device under test to a test fixture for testing. A contact extending structure may be retained in the test tray and may be configured to mate with the device under test. Contact pads on the contact extending structure may be mated with corresponding contacts on the test fixture to form an electrical connection between the device under test and the test fixture.

Abstract: A test system may be provided in which devices under test (DUTs) are loaded into test trays. Test trays may be tested at test stations. Test trays may be moved between test stations using a conveyor belt system. Each test station may include test equipment for testing DUTs and automated loading equipment for latching incoming test trays moving along the conveyor belt. The automated loading equipment may include a first movable arm configured to pick up a test tray from the conveyor belt and a second movable arm. The first arm may hand off (transfer) the test tray to the second arm. The second arm may move the test tray towards associated test equipment for testing. Upon completion of testing, the second arm may drop off the test tray onto the conveyor belt. Multiple layers of test stations may be stacked on top of each other for improved test throughput.

Abstract: A test system may be provided in which devices under test (DUTs) are loaded into test trays. Test trays may be moved between test stations using a test conveyor belt. The test system may include loading equipment for placing test trays on the test conveyor belt at desired intervals. The loading equipment may include a feed conveyor belt, tray support structure, and at least one computer-controlled grabber. Test trays may be placed on the feed conveyor belt by test personnel or automated loader. The grabber may be used to transport an incoming test tray from the feed conveyor belt to the support structure. The test tray may be temporarily docked at the support structure. The grabber may then transport the test tray from the support structure to the test conveyor belt so that the DUT on the test tray can be passed to the various test stations for testing.

Abstract: A test system may be provided in which devices under test undergo various types of testing. A first test location may have test equipment for testing input/output devices in the devices under test. A second test location may have test equipment for testing wireless communications circuitry in the devices under test. A mobile storage cart having shelves may be used to store the devices under test and to convey the devices under test between test locations. The storage cart may be configured to engage with a stationary frame structure at a test location. Actuators underneath the storage cart may be used to position the storage cart in a desired location. Distance sensors may be used to obtain status information about each shelf in the storage cart. A computer-controlled loading structure may be used to load the devices under test from the storage cart into test enclosures.

Abstract: A test system may be provided in which devices under test are loaded into test trays and tested at a plurality of test stations. To test a device under test at a given test station, the test tray may be installed into a test fixture at the test station. Test equipment at each test station may communicate with the device under test via the test fixture and the test tray. Each test tray may have a spring-loaded corner portion that may be used to secure the device under test to the test tray. The test tray may have contacts that mate with corresponding contacts at each test fixture and may have a built in cable that connects to the device under test. The test fixture may have a detector that can detect whether or not a test tray is present on the test fixture.

Abstract: A method for transitioning a video system is disclosed. The method generally includes a first step for (A) executing in a processing circuit a standby code stored in a nonvolatile memory while the video system is in an off state, the off state defining a low power configuration for the processing circuit and a power off condition for the video system, the standby code being responsive to a plurality of wake up conditions to wake up the video system. In a second step, the method may (B) store an application code in a volatile memory while in the off state, the application code configured to operate the video system while in an on state of the video system. The method generally includes a third step for (C) transitioning from the off state to the on state upon detection of at least one of the wake up conditions. A step for (D) executing in the processing circuit the application code while in the on state to decode video may also exist in the method.

Abstract: A method for transitioning a video system is disclosed. The method generally includes a first step for (A) executing in a processing circuit a standby code stored in a nonvolatile memory while the video system is in an off state, the off state defining a low power configuration for the processing circuit and a power off condition for the video system, the standby code being responsive to a plurality of wake up conditions to wake up the video system. In a second step, the method may (B) store an application code in a volatile memory while in the off state, the application code configured to operate the video system while in an on state of the video system. The method generally includes a third step for (C) transitioning from the off state to the on state upon detection of at least one of the wake up conditions. A step for (D) executing in the processing circuit the application code while in the on state to decode video may also exist in the method.

Abstract: A method for transitioning a video system is disclosed. The method generally includes a first step for (A) executing in a processing circuit a standby code stored in a nonvolatile memory while the video system is in an off state, the off state defining a low power configuration for the processing circuit and a power off condition for the video system, the standby code being responsive to a plurality of wake up conditions to wake up the video system. In a second step, the method may (B) store an application code in a volatile memory while in the off state, the application code configured to operate the video system while in an on state of the video system. The method generally includes a third step for (C) transitioning from the off state to the on state upon detection of at least one of the wake up conditions. A step for (D) executing in the processing circuit the application code while in the on state to decode video may also exist in the method.

Abstract: The present invention concerns a system comprising a server, a digital recorder, a memory, an optical disc and a drive. The server may be configured to broadcast a software update through an off air network. The digital recorder may be configured to receive an off air download and download the software update. The memory may be configured to store the software update. The drive may be mounted in the digital recorder. The drive may be configured to write the software update from the memory to a writable optical disc. The digital recorder may be upgraded with the software update from the writable optical disc.

Abstract: A method for transitioning a video system is disclosed. The method generally includes a first step for (A) executing in a processing circuit a standby code stored in a nonvolatile memory while the video system is in an off state, the off state defining a low power configuration for the processing circuit and a power off condition for the video system, the standby code being responsive to a plurality of wake up conditions to wake up the video system. In a second step, the method may (B) store an application code in a volatile memory while in the off state, the application code configured to operate the video system while in an on state of the video system. The method generally includes a third step for (C) transitioning from the off state to the on state upon detection of at least one of the wake up conditions. A step for (D) executing in the processing circuit the application code while in the on state to decode video may also exist in the method.

Abstract: An integrated heated conduit includes an inner conduit through which a fluid may be transferred. The inner conduit may also serve as a first electrical conductor, or an insulator may be provided on the outer surface of the conduit and a first electrical conductor may then be formed about the outer surface of this insulator. A polymeric, self-regulating heating element is provided on the outer surface of the first conductor. A second conductor is provided about the outer surface of the heating element to complete a current path across the heating element. The entire assembly may optionally be sheathed in an electrically and/or thermally insulating outer layer.