Abstract: An image sensor and a manufacturing method thereof are provided. The image sensor includes a pixel sensing circuit, a pixel electrode, and an opto-electrical conversion layer. The pixel sensing circuit is corresponding to a plurality of pixel regions. The pixel electrode is disposed on the pixel sensing circuit. The pixel electrode includes a first electrode and a second electrode and is electrically connected to the pixel sensing circuit. The first electrode and the second electrode are coplanar, and have different polarities. The opto-electrical conversion layer is disposed on the pixel sensing circuit. The opto-electrical conversion layer includes a plurality of opto-electrical conversion portions, each of the opto-electrical conversion portions is corresponding to each of the pixel regions, and the opto-electrical conversion portions are separated from each other by a pixel isolation trench.

Abstract: Systems and methods are provided for edge bead removal. A laser beam of approximately a wavelength is received. The laser beam is delivered along a predetermined beam path. The laser beam is projected on an edge portion of a wafer for edge bead removal.

Abstract: Structures and formation methods of a semiconductor device structure are provided. The semiconductor device structure includes a fin structure over a semiconductor substrate and a gate stack covering a portion of the fin structure. The gate stack includes a work function layer and a gate dielectric layer. The semiconductor device structure also includes an isolation element over the semiconductor substrate and adjacent to the gate stack.

Abstract: A surface measuring device includes a rotary platform, a shifting lever, a measuring module, and a control module. The rotary platform carries an object under test and rotates the object under test at a rotating speed. The shifting lever is above the rotary platform. The measuring module disposed on the shifting lever moves to measurement positions on the shifting lever and performs a surface height measurement at a sampling frequency to sampling points on a surface of the object under test when located at one measurement position. The control module selectively adjusts the rotational speed for the rotary platform or the sampling frequency for the measuring module according to the measurement position of the measuring module on the shifting lever in order to fit a distance between the sampling points on at least one part of the surface of the object under test to a sampling rule.

Abstract: An optical apparatus applied to ophthalmology detection is disclosed. The optical apparatus includes a first light source module, a second light source module, and an interference module. The first light source module is formed by a laser light source and lens units and used to emit a first light signal. The second light source module is formed by fiber units and lens units. The second light source module is coupled to the first light source module in series. The second light source module is used to receive a first light signal and emit a second light signal. The interference module is coupled to the second light source module and used to receive the second light signal and provide a first incident light and a second incident light to an object to be detected and a reference mirror respectively.

Abstract: A developing method includes rotating a wafer. A developer solution is dispensed onto the rotated wafer through a first nozzle. The first nozzle is moved from a first position to a second position. The first position and the second position are over the wafer and within a perimeter of the wafer when viewed from a top of the wafer. The developer solution is dispensed through the first nozzle when moving the first nozzle from the first position to the second position. The first nozzle is moved back from the second position to the first position immediately after the first nozzle is moved from the first position to the second position. The developer solution is dispensed through the first nozzle when moving the first nozzle from the second position to the first position.

Abstract: The invention relates to a wireless tire pressure monitoring system provided on a tire or a rim of a vehicle. The system includes: a magnetometer for measuring a magnetic flux value; a pressure sensor for measuring a pressure value within the tire; a controller for receiving the magnetic flux value measured by the magnetometer and the pressure value measured by the pressure sensor, and determining whether the magnetic flux value fluctuates; and a wireless signal transmitter in signal communication with the controller, and controlled by the controller, wherein when the controller determines that the magnetic flux value fluctuates, the controller activates the wireless signal transmitter or raises the transmitting times per minute of the wireless signal transmitter and the wireless signal transmitter transmits a signal which represents the pressure value. The invention also relates to a method for operating a wireless tire pressure monitoring system.

Abstract: An optical measuring apparatus includes a first light source, a second light source and a switching unit. The first light source is used to emit a first light toward a first direction. The second light source is used to emit a second light toward a second direction. The switching unit selectively switches to a first mode or a second mode. When the switching unit switches to the first mode, it blocks the second light and let the first light emitted to an aiming region on eyeball to perform an optical aiming and determine an eye axis center position on the eyeball; when the switching unit switches to the second mode, the switching unit changes the second light from the second direction to the first direction to let the second light emitted to the eye axis center position on the eyeball to perform an optical measurement.

Abstract: This invention relates to a transmitter for a wireless tire pressure monitoring system. The transmitter includes: an insulating housing including a top and a sidewall extending downward from the periphery of the top, wherein the interior surface of the top and the interior surface of the sidewall are configured to define a cavity; an antenna made of metal wire, wherein the antenna is provided on the top and the sidewall of the insulating housing and continuously extends along the top and the sidewall; and a wireless signal transmission assembly covered by the insulating housing and electrically connected to the antenna.

Abstract: A tool and a method of developing are provided. In various embodiments, the method of developing includes rotating a wafer at a first rotating speed. The method further includes dispensing a developer solution onto the wafer at the first rotating speed by a first nozzle above the wafer, wherein the first nozzle moves back and forth along a path during dispensing the developer solution. The method further includes rotating the wafer at a second rotating speed to spread the developer solution onto the wafer uniformly. The method further includes dispensing a rinse solution onto the wafer at the second rotating speed by a second nozzle above the wafer.

Abstract: Some embodiments relate to a manufacturing method for a semiconductor device. In this method, a semiconductor workpiece, which includes a metal gate electrode thereon, is provided. An opening is formed in the semiconductor workpiece to expose a surface of the metal gate. Formation of the opening leaves a polymeric residue on the workpiece. To remove the polymeric residue from the workpiece, a cleaning solution that includes an organic alkali component is used. Other embodiments related to a semiconductor device resulting from the method.

Abstract: A method for processing a semiconductor wafer is provided. The method includes performing a discharging process over the semiconductor wafer in a discharging chamber which is enclosed. The method further includes processing the semiconductor wafer by use of a first processing module after the discharging process. During the discharging process, charged particles applied on the semiconductor wafer are tuned based on the characteristics of the surface of the semiconductor wafer.

Abstract: An image sensor and a manufacturing method thereof are provided. The image sensor includes a pixel sensing circuit, a pixel electrode, and an opto-electrical conversion layer. The pixel sensing circuit is corresponding to a plurality of pixel regions. The pixel electrode is disposed on the pixel sensing circuit. The pixel electrode includes a first electrode and a second electrode and is electrically connected to the pixel sensing circuit. The first electrode and the second electrode are coplanar, and have different polarities. The opto-electrical conversion layer is disposed on the pixel sensing circuit. The opto-electrical conversion layer includes a plurality of opto-electrical conversion portions, each of the opto-electrical conversion portions is corresponding to each of the pixel regions, and the opto-electrical conversion portions are separated from each other by a pixel isolation trench.

Abstract: An image sensor is provided. The image sensor includes a pixel sensing circuit corresponding to at least a first pixel region and a second pixel region adjacent to each other, a pixel electrode disposed on the pixel sensing circuit, and a opto electrical conversion layer including a photo sensing layer and a carrier transport layer disposed on the pixel sensing circuit and the pixel electrode. The pixel electrode is electrically connected to the pixel sensing circuit and includes a plurality of first electrodes and a plurality of second electrodes. The first electrodes and the second electrodes are coplanar and have different polarities. The first electrode or the second electrode located in the first pixel region is adjacent to the first electrode or the second electrode having the same polarity located in the second pixel region.

Abstract: Structures and formation methods of a semiconductor device structure are provided. The semiconductor device structure includes a fin structure over a semiconductor substrate. The semiconductor device structure also includes a gate stack covering a portion of the fin structure, and the gate stack includes a work function layer and a metal filling over the work function layer. The semiconductor device structure further includes an isolation element over the semiconductor substrate and adjacent to the gate stack. The isolation element is in direct contact with the work function layer and the metal filling.

Abstract: A catheter apparatus includes a replaceable module, a main body portion and a sensing module. The main body portion includes a tube, a urine guide opening and an elastic unit. The replaceable module includes a control unit. A first terminal of the tube is coupled to the replaceable module and a second terminal of the tube is inserted into the bladder. The urine guide opening is disposed at the second terminal of the tube and used to guide urine into the tube when the second terminal of the tube is inserted into the bladder. The elastic unit is disposed at the second terminal of the tube and coupled to the control unit. The sensing module is coupled to the control unit and used to sense whether the second terminal of the tube is inserted to the correct position in the bladder and transmit sensing result to the control unit.

Abstract: Structures and formation methods of a semiconductor device structure are provided. The semiconductor device structure includes a fin structure over a semiconductor substrate and a gate stack covering a portion of the fin structure. The gate stack includes a work function layer and a gate dielectric layer. The semiconductor device structure also includes an isolation element over the semiconductor substrate and adjacent to the gate stack.

Abstract: A surface measurement device includes a rotating platform, a motion lever, a measuring module and a control module. The rotating platform rotates an object at a rotating speed. The motion lever is above the rotating platform. The measuring module moves to a variety of measuring positions on the motion lever. When the measuring module is at one of the measuring positions, the measuring module measures the heights of a plurality of sampling points on the surface of the object in a sampling frequency. The control module selectively modifies the rotating speed of the rotating platform or the sampling frequency of the measuring module according to the measuring position of the measuring module to make the distance between the sampling points in at least a region of the surface of the object match a sampling rule.

Abstract: A surface measuring device includes a rotary platform, a shifting lever, a measuring module, and a control module. The rotary platform carries an object under test and rotates the object under test at a rotating speed. The shifting lever is above the rotary platform. The measuring module disposed on the shifting lever moves to measurement positions on the shifting lever and performs a surface height measurement at a sampling frequency to sampling points on a surface of the object under test when located at one measurement position. The control module selectively adjusts the rotational speed for the rotary platform or the sampling frequency for the measuring module according to the measurement position of the measuring module on the shifting lever in order to fit a distance between the sampling points on at least one part of the surface of the object under test to a sampling rule.

Abstract: A method for driving a display includes a host transmitting a plurality of dynamic frame images to the display, a display panel of the display displaying the plurality of dynamic frame images according to a first gamma table, the host activating a panel self refresh function of the display, and the display panel displaying at least one prior frame image according to a second gamma table after the panel self refresh function is activated. The same grey scale in the first gamma table and the second gamma table corresponds to different gamma voltages. The prior frame images are stored in a memory of the display, and the at least one prior frame image includes at least one dynamic frame image of the plurality of dynamic frame images.