Patents by Inventor Pirooz Hojabri
Pirooz Hojabri has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240044975Abstract: A test and measurement device includes an input configured to receive an analog signal from a Device Under Test (DUT), an Analog to Digital Converter (ADC) coupled to the input and structured to convert the analog signal to a digital signal, a receiver implemented in a first Field Programmable Gate Array (FPGA) and structured to accept the digital signal and perform signal analysis on the digital signal, a transmitter implemented in a second FPGA and structured to generate a digital output signal, and a Digital to Analog Converter (DAC) coupled to the transmitter and structured to convert the digital output signal from the transmitter to an analog signal, and structured to send the analog signal to the DUT. The receiver and the transmitter are coupled together by a high speed data link over which data about the current testing environment may be shared.Type: ApplicationFiled: October 17, 2023Publication date: February 8, 2024Applicant: Tektronix, Inc.Inventors: Pirooz Hojabri, Joshua J. O'Brien, Gregory A. Martin, Patrick Satarzadeh, Karen Hovakimyan
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Patent number: 11789070Abstract: A test and measurement device includes an input configured to receive an analog signal from a Device Under Test (DUT), an Analog to Digital Converter (ADC) coupled to the input and structured to convert the analog signal to a digital signal, a receiver implemented in a first Field Programmable Gate Array (FPGA) and structured to accept the digital signal and perform signal analysis on the digital signal, a transmitter implemented in a second FPGA and structured to generate a digital output signal, and a Digital to Analog Converter (DAC) coupled to the transmitter and structured to convert the digital output signal from the transmitter to an analog signal, and structured to send the analog signal to the DUT. The receiver and the transmitter are coupled together by a high speed data link over which data about the current testing environment may be shared.Type: GrantFiled: May 18, 2021Date of Patent: October 17, 2023Assignee: Tektronix, Inc.Inventors: Pirooz Hojabri, Joshua J. O'Brien, Gregory A. Martin, Patrick Satarzadeh, Karen Hovakimyan
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Patent number: 11329633Abstract: A mechanism is included for jointly determining filter coefficients for Finite Impulse Response (FIR) filters in a Linear, Memory-less Non-linear (LNL), Linear compensator. Calibration signals are applied to a signal converter input in a test and measurement system. Non-linear signal components are determined in signal output from the signal converter. Non-linear filter components are determined at the LNL compensator based on the calibration signals. The non-linear signal components are then compared to the non-linear filter components. The comparison is then resolved to determine filter coefficients for first stage Finite Impulse Response (FIR) filters and second stage FIR filters in the LNL.Type: GrantFiled: April 9, 2018Date of Patent: May 10, 2022Assignee: Tektronix, Inc.Inventors: Karen Hovakimyan, Pirooz Hojabri, Tigran Hovakimyan, Norayr Yengibaryan
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Publication number: 20210270893Abstract: A test and measurement device includes an input configured to receive an analog signal from a Device Under Test (DUT), an Analog to Digital Converter (ADC) coupled to the input and structured to convert the analog signal to a digital signal, a receiver implemented in a first Field Programmable Gate Array (FPGA) and structured to accept the digital signal and perform signal analysis on the digital signal, a transmitter implemented in a second FPGA and structured to generate a digital output signal, and a Digital to Analog Converter (DAC) coupled to the transmitter and structured to convert the digital output signal from the transmitter to an analog signal, and structured to send the analog signal to the DUT. The receiver and the transmitter are coupled together by a high speed data link over which data about the current testing environment may be shared.Type: ApplicationFiled: May 18, 2021Publication date: September 2, 2021Applicant: Tektronix, Inc.Inventors: Pirooz Hojabri, Joshua J. O'Brien, Gregory A. Martin, Patrick Satarzadeh, Karen Hovakimyan
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Patent number: 11009546Abstract: A test and measurement device includes an input configured to receive an analog signal from a Device Under Test (DUT), an Analog to Digital Converter (ADC) coupled to the input and structured to convert the analog signal to a digital signal, a receiver implemented in a first Field Programmable Gate Array (FPGA) and structured to accept the digital signal and perform signal analysis on the digital signal, a transmitter implemented in a second FPGA and structured to generate a digital output signal, and a Digital to Analog Converter (DAC) coupled to the transmitter and structured to convert the digital output signal from the transmitter to an analog signal, and structured to send the analog signal to the DUT. The receiver and the transmitter are coupled together by a high speed data link over which data about the current testing environment may be shared.Type: GrantFiled: June 13, 2019Date of Patent: May 18, 2021Assignee: Tektronix, Inc.Inventors: Pirooz Hojabri, Joshua O'Brien, Gregory A. Martin, Patrick Satarzadeh, Karen Hovakimyan
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Patent number: 11005492Abstract: A signal source device includes at least one digital-to-analog converter, at least one connector, a first output path from the at least one digital-to-analog converter to the at least one connector, and a second output path from the at least one digital-to-analog converter to the at least one connector. A method of generating a analog signal includes generating at least one analog signal from at least one digital-to-analog converter, transmitting a first analog signal of the at least one analog signal along a first output path from the at least one digital-to-analog converter to at least one connector, and transmitting a second analog signal of the at least one analog signal along a second output path from the at least one digital-to-analog converter to the at least one connector.Type: GrantFiled: September 30, 2019Date of Patent: May 11, 2021Assignee: Tektronix, Inc.Inventors: Gregory A. Martin, Pirooz Hojabri
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Patent number: 10904042Abstract: A continuously or step variable passive noise filter for removing noise from a signal received from a DUT added by a test and measurement instrument channel. The noise filter may include, for example, a splitter splits a signal into at least a first split signal and a second split signal. A first path receives the first split signal and includes a variable attenuator and/or a variable delay line which may be set based on the channel response of the DUT which is connected. The variable attenuator and/or the variable delay line may be continuously or stepped variable, as will be discussed in more detail below. A second path is also included to receive the second split signal and a combiner combines a signal from the first path and a signal from the second path into a combined signal.Type: GrantFiled: August 29, 2018Date of Patent: January 26, 2021Assignee: Tektronix, Inc.Inventors: John J. Pickerd, Kan Tan, Pirooz Hojabri
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Patent number: 10895588Abstract: A test and measurement system including a plurality of channels and one or more processors. The one or more processors are configured to cause the test and measurement system to receive, via a first channel of the plurality of channels, a positive side of a reference differential signal pair, receive, via a second channel of the plurality of channels, a negative side of the reference differential signal pair, and produce a reference signal based the reference differential signal pair. A combined signal is received, from a combiner, that is a balanced signal produced from the reference differential signal pair. A de-embed filter is generated based on the reference signal and the combined signal and an additional signal is received from the combiner and an effect of the combiner is removed from the additional signal by applying the de-embed filter to the additional signal.Type: GrantFiled: April 20, 2018Date of Patent: January 19, 2021Assignee: Tektronix, Inc.Inventors: John J. Pickerd, Pirooz Hojabri, Kan Tan
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Publication number: 20200212926Abstract: A signal source device includes at least one digital-to-analog converter, at least one connector, a first output path from the at least one digital-to-analog converter to the at least one connector, and a second output path from the at least one digital-to-analog converter to the at least one connector. A method of generating a analog signal includes generating at least one analog signal from at least one digital-to-analog converter, transmitting a first analog signal of the at least one analog signal along a first output path from the at least one digital-to-analog converter to at least one connector, and transmitting a second analog signal of the at least one analog signal along a second output path from the at least one digital-to-analog converter to the at least one connector.Type: ApplicationFiled: September 30, 2019Publication date: July 2, 2020Applicant: Tektronix, Inc.Inventors: Gregory A. Martin, Pirooz Hojabri
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Publication number: 20190383873Abstract: A test and measurement device includes an input configured to receive an analog signal from a Device Under Test (DUT), an Analog to Digital Converter (ADC) coupled to the input and structured to convert the analog signal to a digital signal, a receiver implemented in a first Field Programmable Gate Array (FPGA) and structured to accept the digital signal and perform signal analysis on the digital signal, a transmitter implemented in a second FPGA and structured to generate a digital output signal, and a Digital to Analog Converter (DAC) coupled to the transmitter and structured to convert the digital output signal from the transmitter to an analog signal, and structured to send the analog signal to the DUT. The receiver and the transmitter are coupled together by a high speed data link over which data about the current testing environment may be shared.Type: ApplicationFiled: June 13, 2019Publication date: December 19, 2019Inventors: Pirooz Hojabri, Joshua O'Brien, Gregory A. Martin, Patrick Satarzadeh, Karen Hovakimyan
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Patent number: 10502763Abstract: Disclosed are systems and methods related to a noise reduction device employing an analog filter and a corresponding inverse digital filter. The combination and placement of the filters within the systems aids in reducing noise introduced by processing the signal. In some embodiments, the combination of filters may also provide for increased flexibility when de-embedding device under test (DUT) link attenuation at higher frequencies. Further, the filters are adjustable, via a controller, to obtain an increased signal to noise ratio (SNR) relative to a signal channel lacking the combination of filters. Additional embodiments may be disclosed and/or claimed herein.Type: GrantFiled: December 30, 2016Date of Patent: December 10, 2019Assignee: Tektronix, Inc.Inventors: Barton T. Hickman, John J. Pickerd, Pirooz Hojabri, Patrick Satarzadeh, Khadar Baba Shaik
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Publication number: 20190312571Abstract: A mechanism is included for jointly determining filter coefficients for Finite Impulse Response (FIR) filters in a Linear, Memory-less Non-linear (LNL), Linear compensator. Calibration signals are applied to a signal converter input in a test and measurement system. Non-linear signal components are determined in signal output from the signal converter. Non-linear filter components are determined at the LNL compensator based on the calibration signals. The non-linear signal components are then compared to the non-linear filter components. The comparison is then resolved to determine filter coefficients for first stage Finite Impulse Response (FIR) filters and second stage FIR filters in the LNL.Type: ApplicationFiled: April 9, 2018Publication date: October 10, 2019Applicant: Tektronix, Inc.Inventors: Karen Hovakimyan, Pirooz Hojabri, Tigran Hovakimyan, Norayr Yengibaryan
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Patent number: 10432434Abstract: Systems and methods directed towards reducing noise introduced into a signal when processing the signal are discussed herein. In embodiments a signal may initially be split by a multiplexer into two or more frequency bands. Each of the frequency bands can then be forwarded through an assigned channel. One or more channels may include an amplifier to independently boost the signal band assigned to that channel prior to a noise source within the assigned channel. This results in boosting the signal band relative to noise introduced by the noise source. In some embodiments, a filter may also be implemented in one or more of the channels to remove noise from the channel that is outside the bandwidth of the signal band assigned to that channel. Additional embodiments may be described and/or claimed herein.Type: GrantFiled: June 8, 2017Date of Patent: October 1, 2019Assignee: Tektronix, Inc.Inventors: John J. Pickerd, Kan Tan, Pirooz Hojabri
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Publication number: 20190103999Abstract: A continuously or step variable passive noise filter for removing noise from a signal received from a DUT added by a test and measurement instrument channel. The noise filter may include, for example, a splitter splits a signal into at least a first split signal and a second split signal. A first path receives the first split signal and includes a variable attenuator and/or a variable delay line which may be set based on the channel response of the DUT which is connected. The variable attenuator and/or the variable delay line may be continuously or stepped variable, as will be discussed in more detail below. A second path is also included to receive the second split signal and a combiner combines a signal from the first path and a signal from the second path into a combined signal.Type: ApplicationFiled: August 29, 2018Publication date: April 4, 2019Applicant: Tektronix, Inc.Inventors: John J. Pickerd, Kan Tan, Pirooz Hojabri
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Patent number: 10097222Abstract: Disclosed is a noise filter. The noise filter includes an input port to receive an analog signal. The noise filter further includes a multiplexer coupled to the input port. The multiplexer separates the analog signal into a plurality of frequency bands. The frequency bands include a high frequency band and a low frequency band. The noise filter also includes a low-band variable attenuator coupled to the multiplexer. The low-band variable attenuator adjustably attenuates the low frequency band relative to the high frequency band.Type: GrantFiled: September 29, 2017Date of Patent: October 9, 2018Assignee: Tektronix, Inc.Inventors: John J. Pickerd, Pirooz Hojabri
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Publication number: 20180123626Abstract: Disclosed is a noise filter. The noise filter includes an input port to receive an analog signal. The noise filter further includes a multiplexer coupled to the input port. The multiplexer separates the analog signal into a plurality of frequency bands. The frequency bands include a high frequency band and a low frequency band. The noise filter also includes a low-band variable attenuator coupled to the multiplexer. The low-band variable attenuator adjustably attenuates the low frequency band relative to the high frequency band.Type: ApplicationFiled: September 29, 2017Publication date: May 3, 2018Applicant: Tektronix, Inc.Inventors: John J. Pickerd, Pirooz Hojabri
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Publication number: 20180026816Abstract: Systems and methods directed towards reducing noise introduced into a signal when processing the signal are discussed herein. In embodiments a signal may initially be split by a multiplexer into two or more frequency bands. Each of the frequency bands can then be forwarded through an assigned channel. One or more channels may include an amplifier to independently boost the signal band assigned to that channel prior to a noise source within the assigned channel. This results in boosting the signal band relative to noise introduced by the noise source. In some embodiments, a filter may also be implemented in one or more of the channels to remove noise from the channel that is outside the bandwidth of the signal band assigned to that channel. Additional embodiments may be described and/or claimed herein.Type: ApplicationFiled: June 8, 2017Publication date: January 25, 2018Inventors: John J. Pickerd, Kan Tan, Pirooz Hojabri
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Publication number: 20170328932Abstract: Disclosed are systems and methods related to a noise reduction device employing an analog filter and a corresponding inverse digital filter. The combination and placement of the filters within the systems aids in reducing noise introduced by processing the signal. In some embodiments, the combination of filters may also provide for increased flexibility when de-embedding device under test (DUT) link attenuation at higher frequencies. Further, the filters are adjustable, via a controller, to obtain an increased signal to noise ratio (SNR) relative to a signal channel lacking the combination of filters. Additional embodiments may be disclosed and/or claimed herein.Type: ApplicationFiled: December 30, 2016Publication date: November 16, 2017Inventors: Barton T. Hickman, John J. Pickerd, Pirooz Hojabri, Patrick Satarzadeh, Khadar Baba Shaik
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Patent number: 8698659Abstract: A machine-implemented method can include receiving a common input signal over M parallel time-interleaved (TI) analog to digital converter (ADC) channels, determining a multiple-input, multiple-output finite impulse response (FIR) filter structure for correcting bandwidth mismatches between the M parallel TIADC channels, and providing a common output signal comprising TI data corresponding to the M parallel TIADC corrected channels.Type: GrantFiled: November 21, 2012Date of Patent: April 15, 2014Assignee: Tektronix, Inc.Inventors: Karen Hovakimyan, Pirooz Hojabri, Masood Yousefi
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Publication number: 20140022101Abstract: A machine-implemented method can include receiving a common input signal over M parallel time-interleaved (TI) analog to digital converter (ADC) channels, determining a multiple-input, multiple-output finite impulse response (FIR) filter structure for correcting bandwidth mismatches between the M parallel TIADC channels, and providing a common output signal comprising TI data corresponding to the M parallel TIADC corrected channels.Type: ApplicationFiled: November 21, 2012Publication date: January 23, 2014Applicant: TEKTRONIX, INC.Inventors: Karen HOVAKIMYAN, Pirooz HOJABRI, Masood YOUSEFI