Patents by Inventor Po-Wei Tsou

Po-Wei Tsou has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Testkey and testing system which reduce leakage current
    Patent number: 11614486
    Abstract: A testkey includes two switching circuits and two compensation circuits. The first switching circuit transmits a test signal to a first DUT when the first DUT is being tested and functions as high impedance when the first DUT is not being tested. The second switching circuit transmits the test signal to a second DUT when the second DUT is being tested and functions as high impedance when the second DUT is not being tested. When the first DUT is not being tested and the second DUT is being tested, the first compensation circuit provides first compensation current for reducing the leakage current of the first switching circuit. When the first DUT is being tested and the second DUT is not being tested, the second compensation circuit provides second compensation current for reducing the leakage current of the second switching circuit.
    Type: Grant
    Filed: August 19, 2021
    Date of Patent: March 28, 2023
    Assignee: UNITED MICROELECTRONICS CORP.
    Inventors: Po-Wei Tsou, Chang-Ting Lo
  • TESTKEY AND TESTING SYSTEM WHICH REDUCE LEAKAGE CURRENT
    Publication number: 20230020783
    Abstract: A testkey includes two switching circuits and two compensation circuits. The first switching circuit transmits a test signal to a first DUT when the first DUT is being tested and functions as high impedance when the first DUT is not being tested. The second switching circuit transmits the test signal to a second DUT when the second DUT is being tested and functions as high impedance when the second DUT is not being tested. When the first DUT is not being tested and the second DUT is being tested, the first compensation circuit provides first compensation current for reducing the leakage current of the first switching circuit. When the first DUT is being tested and the second DUT is not being tested, the second compensation circuit provides second compensation current for reducing the leakage current of the second switching circuit.
    Type: Application
    Filed: August 19, 2021
    Publication date: January 19, 2023
    Applicant: UNITED MICROELECTRONICS CORP.
    Inventors: Po-Wei Tsou, Chang-Ting Lo
  • Test circuit for testing a device-under-test by using a voltage-setting unit to pull an end of the device-under-test to a predetermined voltage
    Patent number: 9939463
    Abstract: A test circuit includes a pull-up device, a pull-down device, a switch circuit and a voltage-setting unit. The pull-up device is used to receive a first control signal and coupled to a first end of the device-under-test. The pull-down device is used to receive a second control signal and coupled to the first end of the device-under-test. The switch unit is controlled by a switch signal, used to receive a testing signal and coupled to a second end of the device-under-test. The voltage-setting unit is controlled by a third control signal, used to pull the second end of the device-under-test to a predetermined voltage.
    Type: Grant
    Filed: April 6, 2016
    Date of Patent: April 10, 2018
    Assignee: UNITED MICROELECTRONICS CORP.
    Inventor: Po-Wei Tsou
  • TEST CIRCUIT FOR TESTING A DEVICE-UNDER-TEST BY USING A VOLTAGE-SETTING UNIT TO PULL AN END OF THE DEVICE-UNDER-TEST TO A PREDETERMINED VOLTAGE
    Publication number: 20170292976
    Abstract: A test circuit includes a pull-up device, a pull-down device, a switch circuit and a voltage-setting unit. The pull-up device is used to receive a first control signal and coupled to a first end of the device-under-test. The pull-down device is used to receive a second control signal and coupled to the first end of the device-under-test. The switch unit is controlled by a switch signal, used to receive a testing signal and coupled to a second end of the device-under-test. The voltage-setting unit is controlled by a third control signal, used to pull the second end of the device-under-test to a predetermined voltage.
    Type: Application
    Filed: April 6, 2016
    Publication date: October 12, 2017
    Inventor: Po-Wei Tsou