Patents by Inventor Ragnar Dworschak

Ragnar Dworschak has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7217921
    Abstract: A method of separating ions includes providing a FAIMS analyzer region including an ion inlet orifice for providing ions thereto, and providing a sample holder along a side of the ion inlet orifice that is opposite the FAIMS analyzer. A sample material is applied to the sample holder such that sample material is disposed about first and second points along the sample holder, a distance between the first and second points being greater than a maximum dimension of the ion inlet orifice. The first point is aligned with the ion inlet orifice, and the sample material disposed about the first point is irradiated with laser light of a predetermined wavelength. Next, the sample holder is moved relative to the ion inlet so as to align the second point with the ion inlet orifice, and the sample material disposed about the second point is irradiated with laser light of a predetermined wavelength.
    Type: Grant
    Filed: January 21, 2005
    Date of Patent: May 15, 2007
    Assignee: Thermo Finnigan LLC
    Inventors: Roger Guevremont, Ragnar Dworschak
  • Patent number: 7135674
    Abstract: A method of separating ions comprises applying a spot of a sample material to a target plate. The target plate is mounted in fluid communication with an ion inlet orifice of a FAIMS analyzer region and externally to the FAIMS analyzer region. Using a laser light source that is disposed external to the FAIMS analyzer region, the target plate is irradiated with light of a predetermined wavelength, the light of a predetermined wavelength being selected to affect the sample material applied to the target plate so as to produce ions of the sample material. The ions of the sample material are directed along an ion flow path between the target plate and FAIMS analyzer region, via the ion inlet orifice. A flow of a gas is directed counter-current to the ion flow path and passing through the target plate. The flow of gas through the target plate assists in desolvation of ions and directs neutral molecules away from the FAIMS analyzer region.
    Type: Grant
    Filed: January 21, 2005
    Date of Patent: November 14, 2006
    Assignees: Thermo Finnigan LLC, University of Florida
    Inventors: Roger Guevremont, Ragnar Dworschak, Richard A. Yost, Christopher Karl Hilton, Michael William Belford
  • Publication number: 20050161597
    Abstract: A method of separating ions comprises applying a spot of a sample material to a target plate. The target plate is mounted in fluid communication with an ion inlet orifice of a FAIMS analyzer region and externally to the FAIMS analyzer region. Using a laser light source that is disposed external to the FAIMS analyzer region, the target plate is irradiated with light of a predetermined wavelength, the light of a predetermined wavelength being selected to affect the sample material applied to the target plate so as to produce ions of the sample material. The ions of the sample material are directed along an ion flow path between the target plate and FAIMS analyzer region, via the ion inlet orifice. A flow of a gas is directed counter-current to the ion flow path and passing through the target plate. The flow of gas through the target plate assists in desolvation of ions and directs neutral molecules away from the FAIMS analyzer region.
    Type: Application
    Filed: January 21, 2005
    Publication date: July 28, 2005
    Applicants: Ionalytics Corporation, University of Florida
    Inventors: Roger Guevremont, Ragnar Dworschak, Richard Yost, Christopher Hilton, Michael Belford
  • Publication number: 20050161598
    Abstract: A method of separating ions includes providing a FAIMS analyzer region including an ion inlet orifice for providing ions thereto, and providing a sample holder along a side of the ion inlet orifice that is opposite the FAIMS analyzer. A sample material is applied to the sample holder such that sample material is disposed about first and second points along the sample holder, a distance between the first and second points being greater than a maximum dimension of the ion inlet orifice. The first point is aligned with the ion inlet orifice, and the sample material disposed about the first point is irradiated with laser light of a predetermined wavelength. Next, the sample holder is moved relative to the ion inlet so as to align the second point with the ion inlet orifice, and the sample material disposed about the second point is irradiated with laser light of a predetermined wavelength.
    Type: Application
    Filed: January 21, 2005
    Publication date: July 28, 2005
    Applicant: Ionalytics Corporation
    Inventors: Roger Guevremont, Ragnar Dworschak