Patents by Inventor Rahul Kalyan

Rahul Kalyan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Identifying test coverage gaps for integrated circuit designs based on node testability and physical design data
    Patent number: 12265776
    Abstract: Test coverage for a circuit design may be determined by obtaining node testability data and physical location data for each node of a plurality of nodes in the circuit design. A determination is made that one or more low test coverage areas within the circuit design include untested nodes based on the node testability data and the physical location data of each node of the plurality of nodes. Test coverage data is generated for the circuit design including at least an identification of the one or more low test coverage areas.
    Type: Grant
    Filed: October 6, 2021
    Date of Patent: April 1, 2025
    Assignee: NXP USA, Inc.
    Inventors: Anurag Jindal, Kapil Narula, Rahul Kalyan, Hongkun Liang
  • IDENTIFYING TEST COVERAGE GAPS FOR INTEGRATED CIRCUIT DESIGNS BASED ON NODE TESTABILITY AND PHYSICAL DESIGN DATA
    Publication number: 20220129613
    Abstract: Test coverage for a circuit design may be determined by obtaining node testability data and physical location data for each node of a plurality of nodes in the circuit design. A determination is made that one or more low test coverage areas within the circuit design include untested nodes based on the node testability data and the physical location data of each node of the plurality of nodes. Test coverage data is generated for the circuit design including at least an identification of the one or more low test coverage areas.
    Type: Application
    Filed: October 6, 2021
    Publication date: April 28, 2022
    Inventors: Anurag Jindal, Kapil Narula, Rahul Kalyan, Hongkun Liang