Patents by Inventor Ralph G. Isaacs

Ralph G. Isaacs has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6041132
    Abstract: A method of computed tomographic inspection which uses a Euclidian reference ply model having a corresponding Non-Euclidian ply model which includes reference model plies to extract intensity data from Euclidian slice data (typically having a pixel format) derived from multiple slice X-ray scans using an X-ray scanning system such as the CT system. The multiple slice data is analyzed to determine intensity values for points corresponding to a subject ply of a corresponding reference model ply. The reference model may be a predetermined model such as a mathematically described CAD model file or based on such a CAD model. A preferred method of the present invention includes a transformation of the CAD model data to register the CAD model data to multiple slice data of a standardized object to generate the reference model. Intensity values preferably gray scale pixel values are assigned to points on the reference ply model from the slice data and displayed as a Non-Euclidian image on a monitor.
    Type: Grant
    Filed: July 29, 1997
    Date of Patent: March 21, 2000
    Assignee: General Electric Company
    Inventors: Ralph G. Isaacs, Joseph M. Portaz
  • Patent number: 5119408
    Abstract: A method for inspecting a component having dimensions larger than a fan beam angle of an x-ray inspection system includes the steps of: providing an x-ray beam having a selected fan angle in a source focal point; positioning a portion of the component substantially completely within the x-ray beam; rotating the component 360 degrees around a component inspection rotational axis; collecting the attenuated x-ray beam that passes through the component during rotation; generating a multiplicity of electrical signals responsive to the collected x-ray beam; incrementally moving the component inspection rotational axis about the x-ray source focal point to position another portion of the component within the x-ray beam; and repeating the steps of rotating the part 360 degrees about a component inspection rotational axis and incrementally moving the part inspection rotational axis about the x-ray source focal point until the entire component has passed through the fan beam.
    Type: Grant
    Filed: October 31, 1990
    Date of Patent: June 2, 1992
    Assignee: General Electric Company
    Inventors: Francis H. Little, Andrew J. Galish, Ralph G. Isaacs
  • Patent number: 4803639
    Abstract: An X-ray inspection system for manually or automatically performing digital fluoroscopy inspections and/or computed tomography inspections by X-ray examination of manufactured parts incorporates a computer system which automatically analyzes the inspected parts for flaws. The system includes apparatus for automatically positioning the parts in an X-ray machine for obtaining fluoroscopy and tomography views of the part and for acquiring data from the inspections at production rates. The system automatically identifies the location of rejectable flaws in the parts during the fluoroscopy scanning and subsequently identifies those locations for obtaining tomography scans, if the identified flaw location is questionable. The system can automatically reject parts containing flaws identified during the fluoroscopy inspections. This system operates in a real-time environment by providing analysis of one part while a subsequent part is being subjected to X-ray examination.
    Type: Grant
    Filed: February 25, 1986
    Date of Patent: February 7, 1989
    Assignee: General Electric Company
    Inventors: Douglas S. Steele, Larry C. Howington, James W. Schuler, Joseph J. Sostarich, Charles R. Wojciechowski, Theodore W. Sippel, Joseph M. Portaz, Ralph G. Isaacs, Henry J. Scudder, III, Thomas G. Kincaid, Kristina H. V. Hedengren, Rudolph A. A. Koegl, John P. Keaveney, Joseph Czechowski, III, John R. Brehm, James M. Brown, Jr., David W. Oliver, George E. Williams, Richard D. Miller