Abstract: A non-contact sensing system is provided for acquiring three-dimensional contour information of an object. The system is comprised of: a light source subsystem operable to scan a point of light in an area of illumination; a first imaging device having a field of view arranged to intersect with the illumination area and operable to capture image data; and a second imaging device having a field of view arranged to intersect with the illumination area and operable to capture image data. A first control module is in data communication with the first imaging device to determine contour information for an object in the field of view of the first imaging device and report the contour information for the object in a common coordinate system. A second control module is in data communication with the second imaging device to determine contour information for the object in the field of view of the second imaging device and report the contour information for the object in the common coordinate system.

Abstract: A structured light sensor system for measuring contour of a surface includes a control module that coordinates control of both a projection system and an imaging system to operate the structured light sensor system in three different modes. The imaging system is configured to selectively capture an image of light reflected off of the surface. In point mode, the imaging system is on for a first period during which the projection system projects a point of light onto the surface. In line mode, the imaging system is on for a second period during which the projection system projects onto the surface a first plurality of points of light forming a line of light. In area mode, the imaging system is on for a third period during which the projection system projects onto the surface a second plurality of points of light forming a plurality of lines of light.

Abstract: A non-contact sensing system is provided for acquiring three-dimensional contour information of an object. The system is comprised of: a light source subsystem operable to scan a point of light in an area of illumination; a first imaging device having a field of view arranged to intersect with the illumination area and operable to capture image data; and a second imaging device having a field of view arranged to intersect with the illumination area and operable to capture image data. A first control module is in data communication with the first imaging device to determine contour information for an object in the field of view of the first imaging device and report the contour information for the object in a common coordinate system. A second control module is in data communication with the second imaging device to determine contour information for the object in the field of view of the second imaging device and report the contour information for the object in the common coordinate system.

Abstract: A structured light sensor system for measuring contour of a surface includes a control module that coordinates control of both a projection system and an imaging system to operate the structured light sensor system in three different modes. The imaging system is configured to selectively capture an image of light reflected off of the surface. In point mode, the imaging system is on for a first period during which the projection system projects a point of light onto the surface. In line mode, the imaging system is on for a second period during which the projection system projects onto the surface a first plurality of points of light forming a line of light. In area mode, the imaging system is on for a third period during which the projection system projects onto the surface a second plurality of points of light forming a plurality of lines of light.

Abstract: A structured light sensor system for measuring contour of a surface includes an imaging lens system, an image capturing device, a first set of micro electromechanical system (MEMS) mirrors, and a control module. The imaging lens system focuses light reflected from the surface, wherein the imaging lens system has a corresponding lens plane. The image capturing device captures the focused light and generates data corresponding to the captured light, wherein the image capturing device has a corresponding image plane that is not parallel to the lens plane. The first set of MEMS mirrors direct the focused light to the image capturing device. The control module receives the data, determines a quality of focus of the captured light based on the received data, and controls the first set of MEMS mirrors based on the quality of focus to maintain a Scheimpflug tilt condition between the lens plane and the image plane.

Abstract: A structured light sensor system for measuring contour of a surface includes an imaging lens system, an image capturing device, a first set of micro electromechanical system (MEMS) mirrors, and a control module. The imaging lens system focuses light reflected from the surface, wherein the imaging lens system has a corresponding lens plane. The image capturing device captures the focused light and generates data corresponding to the captured light, wherein the image capturing device has a corresponding image plane that is not parallel to the lens plane. The first set of MEMS mirrors direct the focused light to the image capturing device. The control module receives the data, determines a quality of focus of the captured light based on the received data, and controls the first set of MEMS mirrors based on the quality of focus to maintain a Scheimpflug tilt condition between the lens plane and the image plane.

Abstract: A system and method for identifying significant bivariate checkpoints. The system includes a controller configured to receive measurements for a plurality of checkpoints and calculate the covariance and correlation for each checkpoint pair. The controller identifies significant bivariate checkpoints based on the covariance between the checkpoint pairs. Further, the controller may also calculate the correlation for each checkpoint pair and identify the significant bivariate checkpoints based on a combination of the covariance and the correlation between the checkpoints. Further, the controller may rank the significant bivariate checkpoints and provide the significant bivariate checkpoints to a principal component algorithm.

Abstract: A system and method for identifying significant bivariate checkpoints. The system includes a controller configured to receive measurements for a plurality of checkpoints and calculate the covariance and correlation for each checkpoint pair. The controller identifies significant bivariate checkpoints based on the covariance between the checkpoint pairs. Further, the controller may also calculate the correlation for each checkpoint pair and identify the significant bivariate checkpoints based on a combination of the covariance and the correlation between the checkpoints. Further, the controller may rank the significant bivariate checkpoints and provide the significant bivariate checkpoints to a principal component algorithm.