Abstract: A lighthead mounting structure provides both precise alignment of a lighthead and an effective heat transfer path away from heat generating components of the lighthead. Cooperating aluminum brackets are configured to lock together and overlap to provide an effective heat transfer path.

Abstract: In testing transistor devices, measurements of the collector-emitter leakage current of the devices with the base open (i.e., I.sub.CEO) generally require long measuring intervals. This is due to the necessity of charging the Miller Capacitance of the device under test prior to taking the measurement. While the Miller Capacitance is charging, a small base current flows which makes an accurate reading of the I.sub.CEO very difficult. To shorten these measurement times, a voltage is applied to the base of the device to increase the charging rate of the Miller Capacitance. After a predetermined time, the voltage is disconnected thereby opening the base of the transistor device. The I.sub.CEO reading is then taken at the emitter of the device after it has stabilized to an approximate level of I.sub.CEO. As an alternative to the application of a voltage to the base, a feedback circuit is connected between the emitter and the base of the test device to provide an automatically adjusted driving current to the base.

Abstract: In making electronic components, it is usually necessary to test and sort the components in accordance with their characteristics. In carrying out such operations, the components are guided along a first portion of a path tangential to a rotatable member having notches spaced in the periphery thereof. The rotatable member is moved to engage one notch with each component to support such component and to space it from the other components in accordance with the spacing of the notches. The rotatable member controllably moves the articles along a second portion of a path adjacent the first portion. The rotatable member is then stopped and the leads of each supported component are straightened. The components are then fed to another rotatable member and controllably moved to a testing facility. While the other rotatable member is stopped, the leads of each component are engaged by contacts of the testing facility to determine certain characteristics of each component.