Abstract: Described embodiments provide a scan chain including at least one pulse-triggered latch scan cell. The pulse-triggered latch scan cell includes a pulse-triggered latch adapted to latch data present at its input terminal to its output terminal based on a clock pulse applied to its clock terminal. A pulse generator is adapted to generate the clock pulse from either a rising edge or a falling edge of a clock signal, and the pulse generator includes a logic circuit adapted to generate either a rising edge-generated clock pulse or a falling edge-generated clock pulse based on a control signal.