Patents by Inventor Roger Mitsuo Ikeda

Roger Mitsuo Ikeda has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8052286
    Abstract: A method includes generating a plurality of beams that each illuminate a separate portion of a spatial light modulator. The spatial light modulator has a first dimension of a first length and a second dimension of a second length. Each of the beams spans a portion of the first length of the first dimension and a portion of the second length of the second dimension. The method also includes scrolling the plurality of beams along the second dimension of the spatial light modulator while maintaining at least a first gap between each of the plurality of beams.
    Type: Grant
    Filed: March 29, 2011
    Date of Patent: November 8, 2011
    Assignee: Texas Instruments Incorporated
    Inventors: Philip Scott King, Gregory James Hewlett, Roger Mitsuo Ikeda, Jeffrey Scott Farris
  • Publication number: 20110211167
    Abstract: A method includes generating a plurality of beams that each illuminate a separate portion of a spatial light modulator. The spatial light modulator has a first dimension of a first length and a second dimension of a second length. Each of the beams spans a portion of the first length of the first dimension and a portion of the second length of the second dimension. The method also includes scrolling the plurality of beams along the second dimension of the spatial light modulator while maintaining at least a first gap between each of the plurality of beams.
    Type: Application
    Filed: March 29, 2011
    Publication date: September 1, 2011
    Applicant: TEXAS INSTRUMENTS INCORPORATED
    Inventors: Philip Scott King, Gregory James Hewlett, Roger Mitsuo Ikeda, Jeffrey Scott Farris
  • Patent number: 7918563
    Abstract: A method includes generating a plurality of beams that each illuminate a separate portion of a spatial light modulator. The spatial light modulator has a first dimension of a first length and a second dimension of a second length. Each of the beams spans a portion of the first length of the first dimension and a portion of the second length of the second dimension. The method also includes scrolling the plurality of beams along the second dimension of the spatial light modulator while maintaining at least a first gap between each of the plurality of beams.
    Type: Grant
    Filed: August 1, 2007
    Date of Patent: April 5, 2011
    Assignee: Texas Instruments Incorporated
    Inventors: Philip Scott King, Gregory James Hewlett, Roger Mitsuo Ikeda, Jeffrey Scott Farris
  • Publication number: 20090033875
    Abstract: A method includes generating a plurality of beams that each illuminate a separate portion of a spatial light modulator. The spatial light modulator has a first dimension of a first length and a second dimension of a second length. Each of the beams spans a portion of the first length of the first dimension and a portion of the second length of the second dimension. The method also includes scrolling the plurality of beams along the second dimension of the spatial light modulator while maintaining at least a first gap between each of the plurality of beams.
    Type: Application
    Filed: August 1, 2007
    Publication date: February 5, 2009
    Applicant: Texas Instruments Incorporated
    Inventors: Philip Scott King, Gregory James Hewlett, Roger Mitsuo Ikeda, Jeffrey Scott Farris
  • Patent number: 7379619
    Abstract: A digital keystone correction process locates image points in a corrected image from image points in a distorted image that was produced by misalignment of the axis of a sensor such as a camera. The correction process locates corrected image points by constructing intercept points that are the intersections of the extended sides of a quadrilateral in the distorted image plane that is constructed from a known rectangular feature in the subject plane. Reference points are located by drawing a line through each intercept point and the distorted image point. Distances are found from the intercept points to the image points and the reference points. The distances are scaled and corrected with an offset to locate the coordinates of the image points in the corrected image plane. This process can correct alignment errors of pitch, yaw, and roll between the subject plane and an image plane such as photographic film.
    Type: Grant
    Filed: March 9, 2005
    Date of Patent: May 27, 2008
    Assignee: Texas Instruments Incorporated
    Inventors: Roger Mitsuo Ikeda, Jeffrey Matthew Kempf