Abstract: Embodiments of the invention include apparatus and methods of non-invasively detecting one or more constituents of a target using multiple wavelength photothermal optical coherence tomography.

Abstract: A method and a system for Uniform Frequency Sample Clocking to directly sample the OCT signal with a temporally-non-linear sampling clock derived from a k-space wavemeter on the external sample clock input port of a digitizer.

Abstract: The invention provides systems and methods for producing an OCT image from a swept laser source. In certain embodiments, methods of the invention involve producing light from a swept laser source, splitting the light into a first and a second portion, in which the first portion is sent to an OCT interferometer to produce an OCT signal and the second portion is sent to a uniform frequency sample clock, processing the second portion into an external clock signal that is accepted by a digitizer, sending the OCT signal and the clock signal to the digitizer, and generating an OCT image from a combination of the OCT signal and the clock signal.

Abstract: A method and a system for Uniform Frequency Sample Clocking to directly sample the OCT signal with a temporally-non-linear sampling clock derived from a k-space wavemeter on the external sample clock input port of a digitizer.

Abstract: A method and a system for Uniform Frequency Sample Clocking to directly sample the OCT signal with a temporally-non-linear sampling clock derived from a k-space wavemeter on the external sample clock input port of a digitizer. The Uniform Frequency Sample Clocking comprises at least one Pathway, which includes characterizing the swept light source, creating a digital representation of the waveform based from the characterization data, and generating a clock signal using a waveform generator to output the clock signal to a digitizer external clock.

Abstract: A method and a system for Uniform Frequency Sample Clocking to directly sample the OCT signal with a temporally-non-linear sampling clock derived from a k-space wavemeter on the external sample clock input port of a digitizer.