Abstract: Aspects are generally directed to a compact and low-noise electric field detector, methods of operation, and methods of production thereof. In one example, an electric field detector includes a proof mass, a source of concentrated charge coupled to the proof mass, and a substrate having a substrate offset space defined therein, the proof mass being suspended above the substrate offset space. The electric field detector further includes a sense electrode disposed on the substrate within the substrate offset space and proximate the proof mass, the sense electrode being configured to measure a change in capacitance relative to the proof mass from movement of the proof mass in response to a received electric field at the source of concentrated charge. The electric field detector includes a control circuit coupled to the sense electrode and configured to determine a characteristic of the electric field based on the measured change in capacitance.

Abstract: Aspects are generally directed to a compact and low-noise electric field detector, methods of operation, and methods of production thereof. In one example, an electric field detector includes a proof mass, a source of concentrated charge coupled to the proof mass, and a substrate having a substrate offset space defined therein, the proof mass being suspended above the substrate offset space. The electric field detector further includes a sense electrode disposed on the substrate within the substrate offset space and proximate the proof mass, the sense electrode being configured to measure a change in capacitance relative to the proof mass from movement of the proof mass in response to a received electric field at the source of concentrated charge. The electric field detector includes a control circuit coupled to the sense electrode and configured to determine a characteristic of the electric field based on the measured change in capacitance.

Abstract: Aspects are generally directed to a compact and low-noise electric field detector, methods of operation, and methods of production thereof. In one example, an electric field detector includes a proof mass, a source of concentrated charge coupled to the proof mass, and a substrate having a substrate offset space defined therein, the proof mass being suspended above the substrate offset space. The electric field detector further includes a sense electrode disposed on the substrate within the substrate offset space and proximate the proof mass, the sense electrode being configured to measure a change in capacitance relative to the proof mass from movement of the proof mass in response to a received electric field at the source of concentrated charge. The electric field detector includes a control circuit coupled to the sense electrode and configured to determine a characteristic of the electric field based on the measured change in capacitance.

Abstract: Aspects and embodiments are generally directed to electric field detector systems and methods. In one example, an electric field detector system includes a proof-mass including a source of concentrated charge, a plurality of supports, each individual support of the plurality supports being coupled to the proof-mass, a plurality of sensors, each individual sensor of the plurality of sensors positioned to measure a resonant frequency of a corresponding support of the plurality of supports, and a controller coupled to each individual sensor of the plurality of sensors, the controller configured to measure a characteristic of an electric field imparted on the proof-mass based on at least a first resonant frequency of the measured resonant frequencies.

Abstract: Aspects are generally directed to a compact and low-noise magnetic field detector, methods of operation, and methods of production thereof. In one example, a magnetic field detector includes a proof mass, a magnetic dipole source coupled to the proof mass, and a substrate having a substrate offset space defined therein, the proof mass being suspended above the substrate offset space. The magnetic field detector further includes a sense electrode disposed on the substrate within the substrate offset space and positioned proximate the proof mass, the sense electrode being configured to measure a change in capacitance relative to the proof mass from movement of the proof mass in response to a received magnetic field at the magnetic dipole source. The magnetic field detector includes a control circuit coupled to the sense electrode and configured to determine a characteristic of the magnetic field based on the measured change in capacitance.

Abstract: Aspects are generally directed to a compact and low-noise electric field detector, methods of operation, and methods of production thereof. In one example, an electric field detector includes a proof mass, a source of concentrated charge coupled to the proof mass, and a substrate having a substrate offset space defined therein, the proof mass being suspended above the substrate offset space. The electric field detector further includes a sense electrode disposed on the substrate within the substrate offset space and proximate the proof mass, the sense electrode being configured to measure a change in capacitance relative to the proof mass from movement of the proof mass in response to a received electric field at the source of concentrated charge. The electric field detector includes a control circuit coupled to the sense electrode and configured to determine a characteristic of the electric field based on the measured change in capacitance.

Abstract: Aspects and embodiments are generally directed to electric field detector systems and methods. In one example, an electric field detector system includes a proof-mass including a source of concentrated charge, a plurality of supports, each individual support of the plurality supports being coupled to the proof-mass, a plurality of sensors, each individual sensor of the plurality of sensors positioned to measure a resonant frequency of a corresponding support of the plurality of supports, and a controller coupled to each individual sensor of the plurality of sensors, the controller configured to measure a characteristic of an electric field imparted on the proof-mass based on at least a first resonant frequency of the measured resonant frequencies.

Abstract: An imaging system exposes an object within a region to a beam of penetrating radiation. The beam of penetrating radiation is sensed on a side opposite the region from a source of the beam. An attenuation of the beam caused by passing the beam through the object is determined, the attenuation is compared to a threshold attenuation. If the attenuation exceeds the threshold attenuation, a parameter of the imaging system is adjusted based on the determined attenuation.

Abstract: An imaging system exposes an object within a region to a beam of penetrating radiation. The beam of penetrating radiation is sensed on a side opposite the region from a source of the beam. An attenuation of the beam caused by passing the beam through the object is determined, the attenuation is compared to a threshold attenuation. If the attenuation exceeds the threshold attenuation, a parameter of the imaging system is adjusted based on the determined attenuation.

Abstract: An imaging system exposes an object within a region to a beam of penetrating radiation. The beam of penetrating radiation is sensed on a side opposite the region from a source of the beam. An attenuation of the beam caused by passing the beam through the object is determined, the attenuation is compared to a threshold attenuation. If the attenuation exceeds the threshold attenuation, a parameter of the imaging system is adjusted based on the determined attenuation.

Abstract: An imaging system exposes an object within a region to a beam of penetrating radiation. The beam of penetrating radiation is sensed on a side opposite the region from a source of the beam. An attenuation of the beam caused by passing the beam through the object is determined, the attenuation is compared to a threshold attenuation. If the attenuation exceeds the threshold attenuation, a parameter of the imaging system is adjusted based on the determined attenuation.

Abstract: An object within a region is exposed to a first beam of penetrating radiation. The first beam of penetrating radiation is sensed on a side opposite the region from a source of the first beam. An attenuation of the first beam caused by passing the first beam through the object is determined, the attenuation is compared to a threshold attenuation. If the attenuation exceeds the threshold attenuation, a parameter of a second of beam of penetrating radiation is adjusted based on the determined attenuation.

Abstract: An object within a region is exposed to a first beam of penetrating radiation. The first beam of penetrating radiation is sensed on a side opposite the region from a source of the first beam. An attenuation of the first beam caused by passing the first beam through the object is determined, the attenuation is compared to a threshold attenuation. If the attenuation exceeds the threshold attenuation, a parameter of a second of beam of penetrating radiation is adjusted based on the determined attenuation.

Abstract: An object within a region is exposed to a first beam of penetrating radiation. The first beam of penetrating radiation is sensed on a side opposite the region from a source of the first beam. An attenuation of the first beam caused by passing the first beam through the object is determined, the attenuation is compared to a threshold attenuation. If the attenuation exceeds the threshold attenuation, a parameter of a second of beam of penetrating radiation is adjusted based on the determined attenuation.

Abstract: A representation of an amount of energy incident on a radiation sensor formed from multiple sensing elements coupled together along a direction parallel to a direction of propagation of the incident radiation is received. The radiation sensor has an adjustable border positioned between any two of the multiple sensing elements. From the representation, an amount of energy incident on the radiation sensor is determined. A position of the border is selected based on the amount of energy incident on the radiation sensor. After selecting the position of the border, an absorption characteristic of a region imaged by the radiation sensor is determined.