Patents by Inventor Ruey-Hsin Liu

Ruey-Hsin Liu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20170229570
    Abstract: A semiconductor structure is disclosed. The semiconductor structure includes: a substrate; a gate structure formed over the substrate; a source region and a drain region formed in the substrate on either side of the gate structure, the source region and the drain region both having a first type of conductivity; and a field plate formed over the substrate between the gate structure and the drain region; wherein the field plate is coupled to the source region or a bulk electrode of the substrate. An associated method for fabricating the semiconductor structure is also disclosed.
    Type: Application
    Filed: February 5, 2016
    Publication date: August 10, 2017
    Inventors: CHIH-CHANG CHENG, FU-YU CHU, RUEY-HSIN LIU, KUANG-HSIN CHEN, CHIH-HSIN KO, SHIH-FEN HUANG
  • Publication number: 20170222063
    Abstract: A semiconductor structure includes a semiconductor substrate having a first electrical portion, a second electrical portion, and a bridged conductive layer. The first electrical portion includes a first semiconductor well, a second semiconductor well in the first semiconductor well, and a third semiconductor well and a fourth semiconductor well in the second semiconductor well. The second electrical portion includes a fifth semiconductor well, a semiconductor layer in the fifth semiconductor well, and a sixth semiconductor well and a seventh semiconductor well in the fifth semiconductor well. The semiconductor layer has separated first and second portions. The bridged conductive layer connects the fourth semiconductor well and the sixth semiconductor well.
    Type: Application
    Filed: April 14, 2017
    Publication date: August 3, 2017
    Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
    Inventors: Hsin-Chih CHIANG, Tung-Yang LIN, Chih-Chang CHENG, Ruey-Hsin LIU
  • Publication number: 20170222023
    Abstract: A method comprises providing a substrate with a second conductivity type, growing a first epitaxial layer having the second conductivity type, growing a second epitaxial layer having a first conductivity type, forming a trench in the first epitaxial layer and the second epitaxial layer, forming a gate electrode in the trench, applying an ion implantation process using first gate electrode as an ion implantation mask to form a drain-drift region, forming a field plate in the trench, forming a drain region in the second epitaxial layer, wherein the drain region has the first conductivity type and forming a source region in the first epitaxial layer, wherein the source region has the first conductivity type, and wherein the source region is electrically coupled to the field plate.
    Type: Application
    Filed: April 18, 2017
    Publication date: August 3, 2017
    Inventors: Po-Chih Su, Hsueh-Liang Chou, Chun-Wai Ng, Ruey-Hsin Liu
  • Publication number: 20170194483
    Abstract: A method comprises forming a buried layer over a substrate, forming an epitaxial layer over the buried layer, forming a first trench and a second trench in the buried layer and the epitaxial layer, wherein a width of the second trench is greater than a width of the first trench, depositing a dielectric layer in the first trench and the second trench, wherein the dielectric layer partially fills the second trench, removing the dielectric layer in the second trench and forming a first gate region in the first trench and a second gate region in the second trench.
    Type: Application
    Filed: March 21, 2017
    Publication date: July 6, 2017
    Inventors: Chun-Wai Ng, Hsueh-Liang Chou, Po-Chih Su, Ruey-Hsin Liu
  • Patent number: 9698044
    Abstract: A semiconductor structure includes a substrate, a first power device and a second power device in the substrate, at least one isolation feature between the first and second power device, and a trapping feature adjoining the at least one isolation feature in the substrate.
    Type: Grant
    Filed: December 1, 2011
    Date of Patent: July 4, 2017
    Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
    Inventors: Alex Kalnitsky, Chih-Wen Yao, Jun Cai, Ruey-Hsin Liu, Hsiao-Chin Tuan
  • Patent number: 9698227
    Abstract: An integrated circuit device includes a pad layer having a body portion with a first doping type laterally adjacent to a drift region portion with a second doping type, a trench formed in the pad layer, the trench extending through an interface of the body portion and the drift region portion, a gate formed in the trench and over a top surface of the pad layer along the interface of the body portion and the drift region portion, an oxide formed in the trench on opposing sides of the gate, and a field plate embedded in the oxide on each of the opposing sides of the gate.
    Type: Grant
    Filed: December 29, 2014
    Date of Patent: July 4, 2017
    Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Chun-Wai Ng, Hsueh-Liang Chou, Po-Chih Su, Ruey-Hsin Liu
  • Publication number: 20170186865
    Abstract: Power Metal-Oxide-Semiconductor Field-Effect Transistors (MOSFETs) and methods of forming the same are provided. A power MOSFET may comprise a first drift region formed at a side of a gate electrode, and a second drift region beneath the gate electrode, adjacent to the first drift region, with a depth less than a depth of the first drift region so that the first drift region and the second drift region together form a stepwise shape. A sum of a depth of the second drift region, a depth of the gate dielectric, and a depth of the gate electrode may be of substantially a same value as a depth of the first drift region. The first drift region and the second drift region may be formed at the same time, using the gate electrode as a part of the implanting mask.
    Type: Application
    Filed: March 14, 2017
    Publication date: June 29, 2017
    Inventors: Fu-Yu Chu, Chih-Chang Cheng, Tung-Yang Lin, Ruey-Hsin Liu
  • Publication number: 20170179280
    Abstract: A semiconductor device and the method of manufacturing the same are provided. The semiconductor device includes a substrate, a source region, a drain region, a filed plate and a gate electrode. The source region is of a first conductivity type located at a first side within the substrate. The drain region is of the first conductive type located at a second side within the substrate opposite to the first side. The field plate is located over the substrate and between the source region and the drain region. A portion of the gate electrode is located over the field plate.
    Type: Application
    Filed: December 21, 2015
    Publication date: June 22, 2017
    Inventors: YOGENDRA YADAV, CHI-CHIH CHEN, RUEY-HSIN LIU, CHIH-WEN YAO
  • Patent number: 9673297
    Abstract: A device includes a semiconductor layer of a first conductivity type, and a first and a second body region over the semiconductor layer, wherein the first and the second body regions are of a second conductivity type opposite the first conductivity type. A doped semiconductor region of the first conductivity type is disposed between and contacting the first and the second body regions. A gate dielectric layer is disposed over the first and the second body regions and the doped semiconductor region. A first and a second gate electrode are disposed over the gate dielectric layer, and overlapping the first and the second body regions, respectively. The first and the second gate electrodes are physically separated from each other by a space, and are electrically interconnected. The space between the first and the second gate electrodes overlaps the doped semiconductor region.
    Type: Grant
    Filed: October 31, 2014
    Date of Patent: June 6, 2017
    Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Chun-Wai Ng, Hsueh-Liang Chou, Ruey-Hsin Liu, Po-Chih Su
  • Patent number: 9653459
    Abstract: A MOS transistor comprises a substrate of a first conductivity, a first region of the first conductivity formed over the substrate, a second region of the first conductivity formed in the first region, a first drain/source region of a second conductivity formed in the second region, a second drain/source region of the second conductivity and a body contact region of the first conductivity, wherein the body contact region and the first drain/source region are formed in an alternating manner from a top view.
    Type: Grant
    Filed: July 3, 2012
    Date of Patent: May 16, 2017
    Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Hsueh-Liang Chou, Chun-Wai Ng, Po-Chih Su, Ruey-Hsin Liu
  • Publication number: 20170133374
    Abstract: A device includes a vertical transistor comprising a first buried layer over a substrate, a first well over the first buried layer, a first gate in a first trench, wherein the first trench is formed partially through the first buried layer, and wherein a dielectric layer and the first gate are in the first trench, a second gate in a second trench, wherein the second trench is formed partially through the first buried layer, and wherein the second trench is of a same depth as the first trench, a first drain/source region and a second drain/source region formed on opposite sides of the first trench and a first lateral transistor comprising a second buried layer formed over the substrate, a second well over the second buried layer and drain/source regions over the second well.
    Type: Application
    Filed: January 23, 2017
    Publication date: May 11, 2017
    Inventors: Chun-Wai Ng, Hsueh-Liang Chou, Po-Chih Su, Ruey-Hsin Liu
  • Patent number: 9627551
    Abstract: The disclosure provides an ultrahigh-voltage (UHV) semiconductor structure including a first electrical portion, a second electrical portion and a bridged conductive layer. In which, the first electrical portion and the second electrical portion are isolated, and directly connected to each other through the bridged conductive layer. Thus, there is no current leakage occurring in the UHV semiconductor structure disclosed in this disclosure. And a method for manufacturing the UHV semiconductor structure also provides herein.
    Type: Grant
    Filed: September 13, 2013
    Date of Patent: April 18, 2017
    Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
    Inventors: Hsin-Chih Chiang, Tung-Yang Lin, Chih-Chang Cheng, Ruey-Hsin Liu
  • Patent number: 9627265
    Abstract: A method comprises providing a substrate with a second conductivity type, growing a first epitaxial layer having the second conductivity type, growing a second epitaxial layer having a first conductivity type, forming a trench in the first epitaxial layer and the second epitaxial layer, forming a gate electrode in the trench, applying an ion implantation process using first gate electrode as an ion implantation mask to form a drain-drift region, forming a field plate in the trench, forming a drain region in the second epitaxial layer, wherein the drain region has the first conductivity type and forming a source region in the first epitaxial layer, wherein the source region has the first conductivity type, and wherein the source region is electrically coupled to the field plate.
    Type: Grant
    Filed: March 21, 2016
    Date of Patent: April 18, 2017
    Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Po-Chih Su, Hsueh-Liang Chou, Chun-Wai Ng, Ruey-Hsin Liu
  • Patent number: 9620635
    Abstract: An apparatus comprises a buried layer over a substrate, an epitaxial layer over the buried layer, a first trench extending through the epitaxial layer and partially through the buried layer, a second trench extending through the epitaxial layer and partially through the buried layer, a dielectric layer in a bottom portion of the first trench, a first gate region in an upper portion of the first trench, a second gate region in the second trench, wherein the second gate region is electrically coupled to the first gate region, a drain region in the epitaxial layer and a source region on an opposite side of the first trench from the drain region.
    Type: Grant
    Filed: June 1, 2015
    Date of Patent: April 11, 2017
    Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Chun-Wai Ng, Hsueh-Liang Chou, Po-Chih Su, Ruey-Hsin Liu
  • Patent number: 9601616
    Abstract: Power Metal-Oxide-Semiconductor Field-Effect Transistors (MOSFETs) and methods of forming the same are provided. A power MOSFET may comprise a first drift region formed at a side of a gate electrode, and a second drift region beneath the gate electrode, adjacent to the first drift region, with a depth less than a depth of the first drift region so that the first drift region and the second drift region together form a stepwise shape. A sum of a depth of the second drift region, a depth of the gate dielectric, and a depth of the gate electrode may be of substantially a same value as a depth of the first drift region. The first drift region and the second drift region may be formed at the same time, using the gate electrode as a part of the implanting mask.
    Type: Grant
    Filed: May 5, 2016
    Date of Patent: March 21, 2017
    Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Fu-Yu Chu, Chih-Chang Cheng, Tung-Yang Lin, Ruey-Hsin Liu
  • Patent number: 9583610
    Abstract: A method of forming a manufacture includes forming a trench in a doped layer; and forming a gate dielectric layer along sidewalls of an upper portion of the trench. The method further includes forming a first conductive feature along sidewalls of the gate dielectric layer, wherein the first conductive feature has a first depth in the trench. The method further includes forming an insulating layer covering the first conductive feature and the first insulating layer. The method further includes forming a second conductive feature along sidewalls of the second insulating layer, wherein the second conductive feature has a second depth in the trench different from the first depth.
    Type: Grant
    Filed: September 29, 2015
    Date of Patent: February 28, 2017
    Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
    Inventors: Chih-Chang Cheng, Fu-Yu Chu, Ruey-Hsin Liu
  • Patent number: 9583618
    Abstract: A metal-oxide-semiconductor field effect transistor (MOSFET) includes a substrate and a gate structure over a top surface of the substrate. The MOSFET further includes a source in the substrate on a first side of the gate structure and a drain in the substrate on a second side of the gate structure opposite the first side. A surface portion of the substrate extending from the source to the drain has an asymmetric dopant concentration profile.
    Type: Grant
    Filed: June 27, 2013
    Date of Patent: February 28, 2017
    Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
    Inventors: Chih-Chang Cheng, Fu-Yu Chu, Ruey-Hsin Liu
  • Patent number: 9553029
    Abstract: A method includes forming a buried layer in a substrate, growing an epitaxial layer over the substrate, etching the epitaxial layer and the buried layer to form a first trench and a second trench, wherein the first trench and the second trench are of a same depth and a width of the second trench is greater than a width of the first trench, forming a dielectric layer in a bottom portion of the first trench, forming a first gate electrode in an upper portion of the first trench and filling the second trench with a gate electrode material, forming gate electrodes for a plurality of lateral transistors formed in the substrate, forming a body region, forming a first drain/source region over the body region and forming a second drain/source region over the epitaxial layer.
    Type: Grant
    Filed: September 5, 2015
    Date of Patent: January 24, 2017
    Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Chun-Wai Ng, Hsueh-Liang Chou, Po-Chih Su, Ruey-Hsin Liu
  • Publication number: 20170005193
    Abstract: An LDMOS transistor with a dummy gate comprises an extended drift region over a substrate, a drain region in the extended drift region, a channel region in the extended drift region, a source region in the channel region, a first dielectric layer with a first thickness formed over the extended drift region, a second dielectric layer with a second thickness formed over the extended drift region and the channel region, wherein the first thickness is greater than the second thickness, and wherein the first dielectric layer and the second dielectric layer form two steps, a first gate formed over the first dielectric layer and a second gate formed above the second dielectric layer.
    Type: Application
    Filed: September 19, 2016
    Publication date: January 5, 2017
    Inventors: Chun-Wai Ng, Ruey-Hsin Liu, Jun Cai, Hsueh-Liang Chou, Chi-Chih Chen
  • Patent number: 9520467
    Abstract: The present disclosure provides an FET structure including a substrate of a first conductive type having a top surface, a first gate over the top surface, a source and a drain of a second conductive type in the substrate, and a first channel under the first gate. A dopant concentration of a first conductive type includes double Gaussian peaks measured less than 200 nm beneath the top surface, from one end of the first gate to the other end of the first gate along the first channel. In some embodiments, the FET structure further including a second gate over the top surface and a second channel under the second gate. A dopant concentration of a first conductive type includes a single Gaussian peak measured less than 200 nm beneath the top surface, from one end of the second gate to the other end of the second gate along the second channel.
    Type: Grant
    Filed: August 31, 2015
    Date of Patent: December 13, 2016
    Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
    Inventors: Fu-Yu Chu, Chih-Chang Cheng, Ruey-Hsin Liu