Patents by Inventor Russell M. Matney

Russell M. Matney has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6772638
    Abstract: A method for sizing cracks is disclosed using a combination of depth crack sizing methods to improve crack sizing accuracy for thin walled tubing and tight crack surface openings less than 0.001 inches for cracks of any depth. The tube or plate wall can consist of a single material or multiple metallic electrodeposited or otherwise intimately bonded layers of materials with different magnetic properties and the sizing method comprises known depth sizing methods such as shear wave, time of flight and the selective use of two unique depth sizing methods designated as Mode Converted Signal (MCS) and Full Skip Normalization (FSN) which provide correction factors for the known sizing methods.
    Type: Grant
    Filed: October 30, 2001
    Date of Patent: August 10, 2004
    Assignee: Framatome Anp, Inc.
    Inventors: Russell M. Matney, Mihai G. Pop, Joseph R. Wyatt, III
  • Publication number: 20030079545
    Abstract: A method for sizing crack is disclosed using a combination of depth crack sizing methods to improve crack sizing accuracy for thin walled tubing and tight crack surface opening less than 0.001 inches for cracks of any depth. The tube or plate wall can consist of a single material or multiple metallic electrodeposited or otherwise intimately bonded layers of materials with different magnetic properties and the sizing method comprises known depth sizing methods such as shear wave, time of flight and THE SELECTIVE USE OF two unique depth sizing methods designated as Mode Converted Signal (MCS) and Full Skip Normalization (FSN) which provide correction factors for the known sizing methods.
    Type: Application
    Filed: October 30, 2001
    Publication date: May 1, 2003
    Inventors: Russell M. Matney, Mihai G. Pop, Joseph R. Wyatt