Patents by Inventor Ryota SATOH

Ryota SATOH has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20190261906
    Abstract: Provided is a technique for calculating an oxygen extraction fraction by using MRI where the oxygen extraction fraction in a brain including brain parenchyma is calculated via a simple processing without an impact on an examinee, such as administration of caffeine. For this purpose, an MRI apparatus of the present invention measures a complex image of nuclear magnetic resonance signals, and calculates from thus measured complex image, a physical property distribution for obtaining a physical property image reflecting the oxygen extraction fraction. Then, thus calculated physical property distribution is separated into tissue-specific physical property distributions for at least two tissues (separated tissue images). After converting any of the separated tissue images into the oxygen extraction fraction, a distribution of the oxygen extraction fraction is estimated based on the condition that a value of any selected pixel is substantially equal to a mean value of pixels surrounding the selected pixel.
    Type: Application
    Filed: October 11, 2017
    Publication date: August 29, 2019
    Applicant: Hitachi, Ltd.
    Inventors: Toru SHIRAI, Ryota SATOH, Yo TANIGUCHI, Hisaaki OCHI, Yoshihisa SOTOME, Yoshitaka BITO, Takenori MURASE
  • Publication number: 20190128991
    Abstract: In calculating a local magnetic field distribution caused by a magnetic susceptibility difference between living tissues, using MRI, a local frequency distribution with a high SNR is calculated in a short computation time. Multi-echo complex images obtained by measurement of at least two different echo times using the MRI are converted into low-resolution images. A global frequency distribution caused by global magnetic field changes and an offset phase distribution including a reception phase and a transmission phase are separated from a phase distribution of the low-resolution multi-echo complex images. Thus calculated global frequency distribution and the offset phase distribution are enhanced in resolution. A local frequency distribution of each echo is calculated from the measured multi-echo complex images, the high-resolution global frequency distribution, and the high-resolution offset phase distribution.
    Type: Application
    Filed: March 17, 2017
    Publication date: May 2, 2019
    Inventors: Toru SHIRAI, Ryota SATOH, Yo TANIGUCHI, Hisaaki OCHI, Takenori MURASE, Yoshitaka BITO
  • Publication number: 20190076049
    Abstract: Accuracy degradation due to a signal loss is reduced, and susceptibility is calculated with high accuracy where, by using an MRI, at least one echo is acquired where spatial magnetic field inhomogeneity is reflected, and a complex image is calculated from the acquired echo. Three masks are calculated from the calculated complex image; a low-signal region mask representing a low signal region, a first high-signal region mask representing a high signal and high fat content region, and a second high-signal region mask representing a high signal and low fat content region. In calculating a susceptibility image from a frequency image or a magnetic field image generated from the complex image, the susceptibility image is obtained under the constraint that a region defined by the low-signal region is set as a background and the susceptibility of the region defined by the second high-signal region mask is set to a specific value.
    Type: Application
    Filed: May 24, 2017
    Publication date: March 14, 2019
    Inventors: Ryota SATOH, Toru SHIRAI, Yo TANIGUCHI, Yoshitaka BITO, Hisaaki OCHI, Yoshihisa SOTOME
  • Patent number: 10180474
    Abstract: Provided is a technique in calculating a magnetic susceptibility distribution by using an MRI, for reducing artifacts and noise and improving precision in the magnetic susceptibility distribution being calculated. According to this technique, a magnetic field distribution is obtained via a phase image from a complex image acquired through MRI. Under the constraint based on a relational expression between the magnetic field and the magnetic susceptibility, smoothing process is performed iteratively on the magnetic susceptibility distribution calculated from the magnetic field distribution. Specifically, a minimization process for minimizing through the iterative operation, an error function defined by a predetermined initial magnetic susceptibility distribution and the magnetic field distribution is performed, thereby calculating the magnetic susceptibility distribution.
    Type: Grant
    Filed: October 19, 2015
    Date of Patent: January 15, 2019
    Assignee: Hitachi, Ltd.
    Inventors: Toru Shirai, Ryota Satoh, Yo Taniguchi, Hisaaki Ochi, Takenori Murase, Yoshitaka Bito
  • Publication number: 20180059198
    Abstract: Provided is a technique in calculating a magnetic susceptibility distribution by using an MRI, for reducing artifacts and noise and improving precision in the magnetic susceptibility distribution being calculated. According to this technique, a magnetic field distribution is obtained via a phase image from a complex image acquired through MRI. Under the constraint based on a relational expression between the magnetic field and the magnetic susceptibility, smoothing process is performed iteratively on the magnetic susceptibility distribution calculated from the magnetic field distribution. Specifically, a minimization process for minimizing through the iterative operation, an error function defined by a predetermined initial magnetic susceptibility distribution and the magnetic field distribution is performed, thereby calculating the magnetic susceptibility distribution.
    Type: Application
    Filed: October 19, 2015
    Publication date: March 1, 2018
    Inventors: Toru SHIRAI, Ryota SATOH, Yo TANIGUCHI, Hisaaki OCHI, Takenori MURASE, Yoshitaka BITO