Abstract: According to various embodiments described herein, a microfluidics-chip based purification device and system for Sanger-sequencing reactions is provided. The device and system allow for the introduction into a sequencing system of a cartridge containing purification technologies specific to the sequencing contaminants or sequencing method where the simplified purification solution of a cartridge allows automation of the sample purification process, reduced consumption of purification reagents, and consistency in sampling by reducing the sampling errors and artifacts. These various embodiments therefore solve the need for a microfluidics-chip-based, Sanger-sequencing reaction purification system for CE devices. The microfluidic chips described can be used as a PCR chip by reorganizing the on-chip reagents, reaction wells and work flow steps.

Abstract: According to various embodiments described herein, a microfluidics-chip based purification device and system for Sanger-sequencing reactions is provided. The device and system allow for the introduction into a sequencing system of a cartridge containing purification technologies specific to the sequencing contaminants or sequencing method where the simplified purification solution of a cartridge allows automation of the sample purification process, reduced consumption of purification reagents, and consistency in sampling by reducing the sampling errors and artifacts. These various embodiments therefore solve the need for a microfluidics-chip-based, Sanger-sequencing reaction purification system for CE devices. The microfluidic chips described can be used as a PCR chip by reorganizing the on-chip reagents, reaction wells and work flow steps.

Abstract: According to various embodiments described herein, a microfiuidics-chip based purification device and system for Sanger-sequencing reactions is provided. The device and system allow for the introduction into a sequencing system of a cartridge containing purification technologies specific to the sequencing contaminants or sequencing method where the simplified purification solution of a cartridge allows automation of the sample purification process, reduced consumption of purification reagents, and consistency in sampling by reducing the sampling errors and artifacts. These various embodiments therefore solve the need for a microfiuidics-chip-based, Sanger-sequencing reaction purification system for CE devices. The microfiuidic chips described can be used as a PCR chip by reorganizing the on-chip reagents, reaction wells and work flow steps.

Abstract: An image processor includes an optical processor and a microwave processor. The optical processor is configured to extract optical image information from optical image data provided by a sensor, the optical image data representing an optical image of an object. The microwave image processor is configured to produce microwave image data representing a microwave image of the object in response to the extracted optical image information and microwave measurements provided by a microwave imager based on illuminating the object with microwave radiation.

Abstract: A distributed power generation system enabled for assured reliability comprises a direct current power source, a direct current to alternating current converter (DTAC), electrically coupled to the direct current power source, the DTAC comprising a reliability limiting component (RLC) and a sensor for sensing a measurable parameter of the RLC. A decision engine is communicatively coupled to the sensor, and is operable to determine a lifetime estimate for the RLC based on the measurable parameter. A service provider is communicatively coupled to the decision engine by a communication system to receive a signal communicating the lifetime estimate. The service provider schedules preventative maintenance based on the signal communicating the lifetime estimate.

Abstract: The nanostructure-based electronic device comprises a solid support, an organic template layer, a nanostructure and electrodes. The organic template layer is on the surface of the solid support, and has a surface comprising a pair of spaced, electrically-charged regions arranged in tandem in an electrically-neutral background. The nanostructure is elongate, is electrically-conducting, and extends between the charged regions. The electrodes are located the surface of the template layer and are at least co-extensive with the charged regions.

Abstract: In accordance with the invention, a system for assured reliability in DC to AC power converters with application to distributed power generation systems is presented.

Abstract: An imager captures successive images of an object. One image is then subtracted from another image to generate difference images. Each difference image is then correlated with itself or with one of the images used to generate the difference image to determine the relative motion between the imager an the object.

Abstract: A display for use in a printed circuit board inspection system for inspecting objects on a printed circuit board is capable of displaying a greater-than-two dimensional image of the shape of the surface of an object resident on the printed circuit board in at least two dimensions. The image of the object is generated based on optical imaging of the object under different illumination configurations.

Abstract: A wireless communications system integrated with the computer infrastructure of an organization so as to provide access to and permit utilization of features and capabilities of the computer infrastructure. The system has a portable unit having a user interface; a computer infrastructure interface; a voice recognition unit associated with the computer infrastructure interface, the voice recognition unit permitting a user of the portable unit to communicate with the computer infrastructure by voice communication; and a wireless communications link for connecting the user interface and the computer infrastructure interface, the wireless communications link covering an area designated by the organization for permitting the user of the portable unit to access the computer infrastructure when the portable unit is within the designated area.

Abstract: A system for forming an image of an object. The system includes a first scanning x-ray source for generating x-rays that diverge from a source point along a first scan path, the point being variable and determined by an input signal provided by a controller. A plurality of x-ray detectors are positioned with respect to the first scan path and are readout by the controller. A conveyor moves the object relative to the first scanning x-ray source and the plurality of x-ray detectors. The object is divided into a plurality of voxels, and the x-ray detectors are positioned such that x-rays pass through each voxel and arrive at one of the detectors when the source point is located at a plurality of points along the first scan path. The controller preferably generates a three-dimensional representation of the object from the x-ray measurements.

Abstract: An imaging system includes an optical (visible-light or near IR) imaging system and a microwave imaging system. The optical imaging system captures an optical image of the object, produces optical image data representing the optical image and extracts optical image information from the optical image data. The microwave imaging system produces microwave image data representing a microwave image of the object in response to the optical image information.

Abstract: An imaging system that is capable of capturing images of moving objects as they are moving with minimal blurring by moving a point source of illumination such that the position from which illumination is projected is changed as the object moves to ensure that the position of the image projected onto an imaging plane remains substantially effectively stationary. The position from which illumination is projected functions as a point source of illumination. A image sensor of the imaging system is positioned in the imaging plane and receives illumination projected from the position of the illumination source that passes through the moving object. The image sensor produces electrical signals in response to the received illumination.

Abstract: An apparatus and method for inspecting parts. The apparatus includes an x-ray source for illuminating a part from a plurality of locations with respect to the part and an imaging detector for forming a plurality of measured x-ray images of the part, one such measured x-ray image corresponding to each of the illumination locations. A controller compares each of the measured x-ray images with a corresponding calibration image. The controller provides a defective part indication if one of the measured x-ray images differs from the corresponding calibration image by more than a threshold value in part of the measured x-ray image. The controller localizes defects on the part by comparing two or more of the measured x-ray images with two or more corresponding calibration images. The calibration images can be constructed from measured images of defect free parts.

Abstract: An imaging system and method for using the same is disclosed. The imaging system includes an x-ray detection array or plurality of detection arrays, a point x-ray source, and a controller. The point x-ray source moves relative to a detection array, each of the x-ray detectors subtending a solid angle at the point source that depends on the relative position of the point source and the detection array and on the location of the detector in the detection array. The signal generated by each x-ray detector depends on a calibration parameter that is independent of the solid angle subtended by that x-ray detector at the point source. The controller stores a table of calibration values that determines the calibration parameter for each of the x-ray detectors. The controller corrects the signals generated by the x-ray detectors for solid angle and for variations in the calibration parameter.

Abstract: An x-ray imaging system includes an x-ray source for projecting imaging radiation onto a sampled object that is secured by a support member and a detector support assembly having multiple detecting modules distributed in a sparse configuration for detecting imaging radiation that has passed through the object. The x-ray source and the detector support assembly are on opposite sides of the support member. Relative displacement is provided between the object and the imaging radiation. By providing the relative displacements and illuminating the object with pulses of imaging radiation at selected intervals, a time series of successive sub-images corresponding to overlapping regions of the object is captured by each module. Computational algorithms combine the captured sub-images to form a composite three-dimensional description of the sampled object. There are multiple pulses of x-ray illumination for each region of the object, and each pulse irradiates more than one detecting module.

Abstract: A display for use in a printed circuit board inspection system for inspecting objects on a printed circuit board is capable of displaying a greater-than-two dimensional image of the shape of the surface of an object resident on the printed circuit board in at least two dimensions. The image of the object is generated based on optical imaging of the object under different illumination configurations.

Abstract: A method and apparatus for inspecting structural features of selected portions of an electronic device using a direct conversion X-ray detector. An manufactured device under inspection is positioned under an irradiating beam of X-rays. Those X-rays that are transmitted through the device are collected by a direct conversion detector, which converts the collected X-rays directly into electrical signals in an X-ray conversion layer. The electrical signals have an intensity that is non-uniformly proportional to the intensity of the transmitted X-rays such that the electrical signals represent the radiographic density of at least portions of the electronic device under inspection. A signal analysis system then converts the electrical signals into numerical information that is representative of specific features of the device under inspection.

Abstract: An imaging system and method for using the same is disclosed. The imaging system includes an x-ray detection array or plurality of detection arrays, a point x-ray source, and a controller. The point x-ray source moves relative to a detection array, each of the x-ray detectors subtending a solid angle at the point source that depends on the relative position of the point source and the detection array and on the location of the detector in the detection array. The signal generated by each x-ray detector depends on a calibration parameter that is independent of the solid angle subtended by that x-ray detector at the point source. The controller stores a table of calibration values that determines the calibration parameter for each of the x-ray detectors. The controller corrects the signals generated by the x-ray detectors for solid angle and for variations in the calibration parameter.

Abstract: An apparatus and method for inspecting parts. The apparatus includes an x-ray source for illuminating a part from a plurality of locations with respect to the part and an imaging detector for forming a plurality of measured x-ray images of the part, one such measured x-ray image corresponding to each of the illumination locations. A controller compares each of the measured x-ray images with a corresponding calibration image. The controller provides a defective part indication if one of the measured x-ray images differs from the corresponding calibration image by more than a threshold value in part of the measured x-ray image. The controller localizes defects on the part by comparing two or more of the measured x-ray images with two or more corresponding calibration images. The calibration images can be constructed from measured images of defect free parts.