Abstract: A variable air hole covering flap device is provided and selectively opens or closes an air hole formed in a wheel deflector or a wheel cover to allow air to be introduced toward a brake. The air hole is opened only when brake cooling of a vehicle is more necessary than aerodynamic performance of the vehicle to properly control the aerodynamic performance and the brake cooling performance of the vehicle as necessary.

Abstract: A display panel includes a base layer having a display area and a non-display area including a pad area; a plurality of transistors on the base layer; a first protective layer covering the plurality of transistors; a conductive layer on the first protective layer; a second protective layer over the conductive layer; a first electrode and a second electrode on the second protective layer, the first and second electrodes being spaced from each other; a plurality of light emitting elements between the first electrode and the second electrode; a first contact electrode on the first electrode, the first contact electrode being in contact with one end portion of the light emitting element, and a second contact electrode on the second electrode, the second contact electrode being in contact with the other end portion of the at least one light emitting element; and a first pad in the pad area.

Abstract: Disclosed are a coating composition for a composite positive electrode active material and a method of preparing a composite positive electrode active material using the same.

Abstract: An organic light emitting display device includes scan lines arranged in horizontal lines, data lines intersecting the scan lines, a pixel array including pixels coupled to the scan lines and the data lines, the pixels including at least first color pixels, a panel tester including switching elements coupled to first ends of the data lines, the switching elements including at least first and second switching elements, and a first line coupled to the first switching elements and a second line coupled to the second switching elements. Data lines of K-th to (K+L)-th (where K and L are natural numbers) first color pixels arranged in a predetermined horizontal line are coupled to the first line through the first switching elements, and data lines of at least a part of remaining first color pixels arranged in the predetermined horizontal line are coupled to the second line through the second switching elements.

Abstract: The present application relates to a composition, a battery module and a battery pack. According to one example of the present application, the related manufacturing process can be improved and a battery module having excellent insulation can be provided.

Abstract: The present application relates to an adhesive composition capable of fixing a battery cell in a battery module and a battery pack. According to one example of the present application, there is provided a two-component urethane-based adhesive composition which has excellent storage stability and processability and is capable of providing physical properties required in related uses in a short time.

Abstract: The present disclosure relates to a system for detecting an anomaly and a method for setting a threshold thereof. The method includes setting a minimum true positive rate (TPR) and a differentiation slope based on a user input, creating a receiver operating characteristic (ROC) curve using anomaly data and normal data, estimating a true negative rate (TNR) from the ROC curve based on the minimum TPR and the differentiation slope, and estimating and setting the threshold based on the estimated TNR.

Abstract: In one example, a semiconductor device can comprise a substrate, a device stack, first and second internal interconnects, and an encapsulant. The substrate can comprise a first and second substrate sides opposite each other, a substrate outer sidewall between the first substrate side and the second substrate side, and a substrate inner sidewall defining a cavity between the first substrate side and the second substrate side. The device stack can be in the cavity and can comprise a first electronic device, and a second electronic device stacked on the first electronic device. The first internal interconnect can be coupled to the substrate and the device stack. The encapsulant can cover the substrate inner sidewall and the device stack and can fill the cavity. Other examples and related methods are disclosed herein.

Abstract: A display device according to an embodiment of the disclosure may include a substrate including a display area including a plurality of pixel areas each having an emission area and a non-display area surrounding at least one side of the display area, and a pixel provided in each of the pixel areas and including display element part. The display element part may include a first insulating layer disposed on the substrate, at least one light emitting element disposed on the first insulating layer and each having a first end and a second end in a longitudinal direction, a first layer disposed on the first insulating layer and the light emitting element and being in contact with a first area of each of the first and second ends of the light emitting element, a second layer disposed on the light emitting element and being in contact with a second area of each of the first and second ends of the light emitting element, and an interlayer insulating layer provided between the first layer and the second layer.

Abstract: Provided are a system and method for work quality assurance in vehicle manufacturing, which are capable of preventing defects in manufacturing, wherein the system for work quality assurance in vehicle manufacturing which assembles fastening objects to a vehicle transferred through a conveyor line through a working unit, includes a server configured to set a working area of the vehicle, assign work corresponding to the working area, check a position of the working unit in real time to calculate a stay period during which the working unit stays in the working area, receive work information from the working unit, and determine whether the work is successful on the basis of the stay period, the assigned work, and the work information.

Abstract: An apparatus for estimating blood pressure is provided. The apparatus may include a pulse wave sensor configured to measure from an object, a plurality of pulse wave signals having different wavelengths, a force sensor configured to measure a contact force applied by the object to the pulse wave sensor, and a processor configured to extract, from the plurality of pulse wave signals, at least one similarity feature indicating a similarity between the plurality of pulse wave signals, and estimate the blood pressure based on the similarity and the contact force that is measured at a point in time at which the at least one similarity feature is extracted.

Abstract: A method for determining a dispensing apparatus for a heat-dissipating material and according to one aspect of the present invention is provided. The method for determining a dispensing apparatus for a heat-dissipating material includes detecting an internal material of a dispensing apparatus from a heat-dissipating material discharged from the dispensing apparatus; and determining suitability of the dispensing apparatus based on the detected amount of the internal material.

Abstract: The present disclosure relates to a can for a secondary battery and a secondary battery. The can for the secondary battery can include a can body, in which an electrode assembly accommodation part accommodating an electrode assembly are formed. The can body can be opened to one side. The secondary battery can include a cover to cover one end of the can body to seal an opening and in which a through-hole through which an electrode lead of the electrode assembly passes. The can body can include a body heat pipe that transfers heat so that the heat is dissipated through the can body when the heat generated in the electrode lead is transferred from the cover to the can body.

Abstract: A silicon carbide ingot producing method is provided. The method produces a silicon carbide ingot in which an internal space of a reactor is depressurized and heated to create a predetermined difference in temperature between upper and lower portions of the internal space. The method produces a silicon carbide ingot in which a plane of a seed crystal corresponding to the rear surface of the silicon carbide ingot is lost minimally. Additionally, the method produces a silicon carbide ingot with few defects and good crystal quality.

Abstract: A display device may include a first gate electrode disposed on a substrate, a buffer layer disposed on the first gate electrode, a first active pattern on the buffer layer, the first active pattern overlapping the first gate electrode and including an oxide semiconductor, a second active pattern on the buffer layer, spaced apart from the first active pattern, and including an oxide semiconductor, the second active pattern including a channel region, and a source region and a drain region, a source pattern and a drain pattern respectively at ends of the first active pattern, a first insulation pattern disposed on the first active pattern, a second insulation pattern disposed on the channel region, a first oxygen supply pattern on the first insulation pattern, a second oxygen supply pattern on the second insulation pattern, and a second gate electrode on the second oxygen supply pattern.

Abstract: A display device includes: a base substrate; a first pixel electrode, a second pixel electrode, and a third pixel electrode arranged on the base substrate to be spaced apart from each other; a pixel defining film on the first pixel electrode, the second pixel electrode, and the third pixel electrode and including a first opening exposing the first pixel electrode, a second opening exposing the second pixel electrode and spaced apart from the first opening, and a third opening exposing the third pixel electrode and spaced apart from the first opening and the second opening; a first organic layer on the first pixel electrode exposed by the first opening; a second organic layer on the second pixel electrode exposed by the second opening; and a third organic layer on the third pixel electrode exposed by the third opening.

Abstract: An apparatus for diagnosing failure of a plant is provided. The apparatus for diagnosing failure of a plant includes: a data analyzer configured to provide data analysis information, which is information requiring analysis to diagnose failure of the plant, and a comprehensive diagnostic device configured to diagnose the failure using each of an algorithm-based diagnosing technique and a domain knowledge-based diagnosing technique based on the data analysis information, and to derive comprehensive diagnosis information for the failure by summarizing results of the algorithm-based diagnosing technique and the domain knowledge-based diagnosing technique.

Abstract: A plasma processing apparatus may include a support configured to receive a substrate, a gas distribution plate (GDP) including a plurality of nozzles facing the support, a main splitter configured to supply a process gas, and an additional splitter configured to supply an acceleration gas or a deceleration gas. The plurality of nozzles may include a plurality of central nozzles, a plurality of outer nozzles, a plurality of middle nozzles configured to spray the process gas and the acceleration gas, a plurality of first nozzles, and a plurality of second nozzles.

Abstract: A three-dimensional memory device includes an electrode structure including a plurality of electrode layers and a plurality of interlayer dielectric layers which are alternately stacked on a substrate; a first stairway structure and a second stairway structure defined in the electrode structure, and positioned at different heights from each other; a sidewall of the electrode structure formed due to a difference in height between the first stairway structure and the second stairway structure; and a dielectric support passing through the electrode structure, and isolating a corner portion of the sidewall from the plurality of electrode layers.

Abstract: A wafer having relaxation moduli different by 450 GPa or less, as determined by dynamic mechanical analysis, when loaded to 1 N and 18 N with a loading rate of 0.1 N/min at a temperature of 25° C.