Abstract: An imaging control apparatus includes a hardware processor. The hardware processor is capable of sending, to a console, a command indicating permission of radiation emission. The console controls a radiation emitting apparatus that emits radiation. The hardware processor is also capable of outputting a first control signal to a radiographic imaging apparatus that generates a radiograph based on the first control signal.

Abstract: A radiographic image capturing system is described. If a hardware processor determines that an image processor and an image analyzing unit are capable of sharing image data via an identical memory, the image processor stores image data in the memory and the image analyzing unit analyzes the image data with reference to the memory. If the hardware processor determines that the image processor and the image analyzing unit can send and receive the data via a wired network, the image processor transfers the data to the image analyzing unit, and the image analyzing unit analyzes the data. If the hardware processor determines that the image processor and the image analyzing unit can send and receive the data via a wireless network, the image processor compresses the data or decimates partial data and transfers the data to the image analyzing unit, and the image analyzing unit decompresses and analyzes the data.

Abstract: An imaging control apparatus includes a hardware processor. The hardware processor is capable of sending, to a console, a command indicating permission of radiation emission. The console controls a radiation emitting apparatus that emits radiation. The hardware processor is also capable of outputting a first control signal to a radiographic imaging apparatus that generates a radiograph based on the first control signal.

Abstract: An imaging control apparatus includes a hardware processor. The hardware processor is capable of sending, to a console, a command indicating permission of radiation emission. The console controls a radiation emitting apparatus that emits radiation. The hardware processor is also capable of outputting a first control signal to a radiographic imaging apparatus that generates a radiograph based on the first control signal.

Abstract: A radiographic image capturing system is described. If a hardware processor determines that an image processor and an image analyzing unit are capable of sharing image data via an identical memory, the image processor stores image data in the memory and the image analyzing unit analyzes the image data with reference to the memory. If the hardware processor determines that the image processor and the image analyzing unit can send and receive the data via a wired network, the image processor transfers the data to the image analyzing unit, and the image analyzing unit analyzes the data. If the hardware processor determines that the image processor and the image analyzing unit can send and receive the data via a wireless network, the image processor compresses the data or decimates partial data and transfers the data to the image analyzing unit, and the image analyzing unit decompresses and analyzes the data.

Abstract: An imaging control apparatus includes a hardware processor. The hardware processor is capable of sending, to a console, a command indicating permission of radiation emission. The console controls a radiation emitting apparatus that emits radiation. The hardware processor is also capable of outputting a first control signal to a radiographic imaging apparatus that generates a radiograph based on the first control signal.

Abstract: A radiographic image capturing system is described. If a hardware processor determines that an image processor and an image analyzing unit are capable of sharing image data via an identical memory, the image processor stores image data in the memory and the image analyzing unit analyzes the image data with reference to the memory. If the hardware processor determines that the image processor and the image analyzing unit can send and receive the data via a wired network, the image processor transfers the data to the image analyzing unit, and the image analyzing unit analyzes the data. If the hardware processor determines that the image processor and the image analyzing unit can send and receive the data via a wireless network, the image processor compresses the data or decimates partial data and transfers the data to the image analyzing unit, and the image analyzing unit decompresses and analyzes the data.

Abstract: A radiographic apparatus includes: a hardware processor which generates image data of a radiographic image upon reception of external radiation, is capable of storing the generated image data in a storage, is capable of communicating with an external device via a communication unit, is capable of operating itself in a normal imaging mode or a memory imaging mode, and is capable of concurrently determining for a plurality of types of predetermined conditions whether each condition is satisfied. The hardware processor switches from the normal imaging mode to the memory imaging mode based on occurrence of the determination that at least one of a plurality of first predetermined conditions is satisfied in the normal imaging mode.

Abstract: A radiographic communication system includes a radiographic device and an information processor. The radiographic device receives radiation to generate data of a radiographic image and that operates as a primary device in wireless communication. The information processor operates as a secondary device in the wireless communication. The information processor includes a memory, an operation interface, a communicator and a hardware processor. The memory stores combination information including a communication identifier and an address of the radiographic device. The operation interface is associated with the combination information. The hardware processor uses the communicator to establish communication with the radiographic device based on the communication identifier in the combination information in response to an operation of the operation interface.

Abstract: A radiographic image capturing system is described. If a hardware processor determines that an image processor and an image analyzing unit are capable of sharing image data via an identical memory, the image processor stores image data in the memory and the image analyzing unit analyzes the image data with reference to the memory. If the hardware processor determines that the image processor and the image analyzing unit can send and receive the data via a wired network, the image processor transfers the data to the image analyzing unit, and the image analyzing unit analyzes the data. If the hardware processor determines that the image processor and the image analyzing unit can send and receive the data via a wireless network, the image processor compresses the data or decimates partial data and transfers the data to the image analyzing unit, and the image analyzing unit decompresses and analyzes the data.

Abstract: A vehicle boundary layer air flow control structure is provided with a vehicle body and a side view mirror. The vehicle body includes an exterior contoured surface with an air flow deflector. The side view mirror is attached to the vehicle body to provide a diagonally rearward direction to be viewed from a driver's seat. The air flow deflector has a downward air flow guiding surface provided in a vehicle body region of the exterior contoured surface of the vehicle body along which an air flow heading toward the side view mirror passes. The downward air flow guiding surface extends in an air flow direction of the air flow with respect to the side view mirror to divert the air flow underneath the side view mirror.

Abstract: A vehicle boundary layer air flow control structure is provided with a vehicle body and a side view mirror. The vehicle body includes an exterior contoured surface with an air flow deflector. The side view mirror is attached to the vehicle body to provide a diagonally rearward direction to be viewed from a driver's seat. The air flow deflector has an inward longitudinal air flow guiding surface provided in a vehicle body region of the exterior contoured surface of the vehicle body along which an air flow heading toward the side view mirror passes. The inward longitudinal air flow guiding surface extends in an air flow direction of the air flow with respect to the side view mirror to divert the air flow inward of the side view mirror with respect to a vehicle widthwise direction.

Abstract: A vehicle boundary layer air flow control structure is provided with a vehicle body and a side view mirror. The vehicle body includes an exterior contoured surface with an air flow deflector. The side view mirror is attached to the vehicle body to provide a diagonally rearward direction to be viewed from a driver's seat. The air flow deflector has a downward air flow guiding surface provided in a vehicle body region of the exterior contoured surface of the vehicle body along which an air flow heading toward the side view mirror passes. The downward air flow guiding surface extends in an air flow direction of the air flow with respect to the side view mirror to divert the air flow underneath the side view mirror.

Abstract: A vehicle boundary layer air flow control structure is provided with a vehicle body and a side view mirror. The vehicle body includes an exterior contoured surface with an air flow deflector. The side view mirror is attached to the vehicle body to provide a diagonally rearward direction to be viewed from a driver's seat. The air flow deflector has an inward longitudinal air flow guiding surface provided in a vehicle body region of the exterior contoured surface of the vehicle body along which an air flow heading toward the side view mirror passes. The inward longitudinal air flow guiding surface extends in an air flow direction of the air flow with respect to the side view mirror to divert the air flow inward of the side view mirror with respect to a vehicle widthwise direction.

Abstract: A silicon ingot is manufactured by pulling a nitrogen doped silicon single crystal. The oxygen concentration in the crystal is controlled during the pulling, so as to maintain a relationship between the oxygen and nitrogen concentration in the ingot, corresponding to the formula Oi=C1?[C2×(Log Ni)], where C1 and C2 are first and second constants, and Oi is the oxygen concentration and Ni is the nitrogen concentration in the ingot. C1 and C2 will vary depending on the defect criteria. For example, for one criteria C1 may equal to 146.3×1017 and C2 may equal to 9×1017, and Ni may be within the range of approximately 3×1015 to approximately 3×1014 atoms/cm3, while for a stricter defect criteria C1 may equal 127×1017 and C2 may equal 8×1017, and Ni may be within the range proximately 1×1015 to approximately 1×1014 atoms/cm3.

Abstract: A headlamp gasket is adapted to be disposed between a vehicle exterior body panel and a headlamp housing. The headlamp gasket comprises a base portion and a resilient lip portion. The base portion is configured and arranged to be fixedly coupled to the headlamp housing. The resilient lip portion extends from the base portion to a free end. The lip portion is configured and arranged to bend at a consistent bending position throughout a longitudinal length of the lip portion upon engagement with the vehicle exterior body panel to accommodate spacing variations between the headlamp housing and the vehicle exterior body panel.

Abstract: A method for producing a silicon ingot through pulling up a silicon single crystal according to the Czochralski method, wherein the silicon single crystal is pulled up while being doped with nitrogen in such a condition as to form a part having a nitrogen content of 5×1013 atoms/cm3 to 1×1015 atoms/cm3. A silicon wafer having a nitrogen content of 5×1013 atoms/cm3 to 1×1015 atoms/cm3 which is suitable for being treated with heat in a non-oxidizing atmosphere is manufactured of an ingot produced by using the method. The method can be used for producing a silicon wafer being doped with nitrogen and having satisfactory characteristics for use in a semiconductor device.

Abstract: An epitaxial silicon wafer which comprises a silicon wafer produced by a method characterized as comprising pulling up a silicon single crystal under a condition wherein when an oxygen concentration is 7×1017 atoms/cm3 a nitrogen concentration is about 3×1015 atoms/cm3 or less, and when an oxygen concentration is 1.6×1018 atoms/cm3 a nitrogen concentration is about 3×1014 atoms/cm3 or less, and, an epitaxial film formed on the wafer. The epitaxial film, being formed on such a wafer, has crystal defects, which are observed as LPD of 120 nm or more on the epitaxial film, in a range of 20 pieces/200-mm wafer or less. The epitaxial silicon wafer contains nitrogen atoms doped therein and also has satisfactory characteristics as that for use in a semiconductor device.

Abstract: X-rays are irradiated to a sample to be measured including at least one layer of film formed on a substrate; an interference oscillation curve of the X-rays incident on the sample to be measured is measured; and a concentration of an element adhered on a surface of the sample to be measured and/or segregated in an interface of the film is measured. The interference oscillation curve is fitted to an analysis formula expressing an X-ray reflectance to thereby determining a density of a region of the sample to be measured, where the element is adhered or is segregated, and a concentration of the element is computed based on the density.

Abstract: A film thickness measuring method comprises the steps of measuring reflectances of X-rays on a film, extracting interference oscillations from the measured X-ray reflectances, and Fourier transforming the interference oscillations to compute a film thickness of the film, an average reflectance being given by fitting the measured X-ray reflectances to an analysis formula including a term of a product of a power function of an incident angle, which expresses attenuation of reflectances on a smooth surface of the film and an exponent function which expresses influence of roughness of the surface of the film, and a constant term expressing a background added to the product; the interference oscillations being given by using the measured X-ray reflectances and the average reflectance. The film thickness measuring method can extract interference oscillations of a reflectance curve by a method including arbitrariness and by a simple procedure.