Abstract: The disclosure relates to a method for identifying adsorbates deposited on resonance plates. The method includes (i) calculating a candidate mass and candidate position of the adsorbate, disregarding the effect of stiffness, from the measurement of the frequencies of the plate and prior knowledge of the mass of the plate; (ii) using the calculated values as a starting point for calculating the final values of the mass and position of the adsorbate and the different stiffness coefficients from the measurement of the frequencies of the plate; (iii) comparing the values of the candidate mass of the adsorbate and of the calculated coefficients with a set of previously stored reference values corresponding to a catalogue of known adsorbates; and (iv) identifying the adsorbate deposited on the plate as the adsorbate belonging to the catalogue that is most similar to the obtained values.

Abstract: An analysis system includes a reflective substrate; a hollow elongate structure with two ends; two polymer supports coupled to the ends and joined to the substrate; a piezoelectric device coupled to the substrate and designed to produce vibrations in the elongate structure; a laser for emitting a beam; a beam splitter; a photodetector; an amplification module; and a processor. The laser beam passes through the cavity and is absorbed by the photodetector, which generates a signal that is transmitted to the amplification module. The amplification module separates the signal into a modulated component and an unmodulated component. The signal is transmitted to the processor to obtain the resonance frequency and reflectance and to provide the piezoelectric device with an excitation signal at the resonance frequency.

Abstract: An analysis system includes a reflective substrate; a hollow elongate structure with two ends; two polymer supports coupled to the ends and joined to the substrate; a piezoelectric device coupled to the substrate and designed to produce vibrations in the elongate structure; a laser for emitting a beam; a beam splitter; a photodetector; an amplification module; and a processor. The laser beam passes through the cavity and is absorbed by the photodetector, which generates a signal that is transmitted to the amplification module. The amplification module separates the signal into a modulated component and an unmodulated component. The signal is transmitted to the processor to obtain the resonance frequency and reflectance and to provide the piezoelectric device with an excitation signal at the resonance frequency.

Abstract: The disclosure relates to a method for identifying adsorbates deposited on resonance plates. The method includes (i) calculating a candidate mass and candidate position of the adsorbate, disregarding the effect of stiffness, from the measurement of the frequencies of the plate and prior knowledge of the mass of the plate; (ii) using the calculated values as a starting point for calculating the final values of the mass and position of the adsorbate and the different stiffness coefficients from the measurement of the frequencies of the plate; (iii) comparing the values of the candidate mass of the adsorbate and of the calculated coefficients with a set of previously stored reference values corresponding to a catalogue of known adsorbates; and (iv) identifying the adsorbate deposited on the plate as the adsorbate belonging to the catalogue that is most similar to the obtained values.

Abstract: The invention relates to a method and a system of mechanical resonance transduction for analyte analysis, suitable for its use in the identification of nanoparticles in the range between 1 MHz and 300 GHz, said method being characterized in that it comprises the following steps: a) disposing at least one analyte, possessing at least one mechanical vibration mode, on at least one mechanical resonator sensor that possesses at least one mechanical vibration mode, selectable in a plurality of working frequencies; b) monitoring the mechanical spectra of the of the analyte and the resonator sensor; c) varying the at least one mechanical vibration mode until at least one mechanical vibration mode reaches a strong coupling situation with the at least one mechanical vibration mode; d) collecting the frequency data at which the strong coupling occurs; e) estimating the resonance frequency and quality factor of the at least one mechanical vibration mode from the strong coupling frequency data obtained in step d).

Abstract: A method for obtaining the absorption position, mass and rigidity of a particle deposited on the surface of a resonator based on the relative change in the resonance frequency of said resonator in 3 or 4 flexural vibration modes. The rigidity of the particles is of great interest in the study of cells and other biological compounds that change state without significantly changing the mass.

Abstract: A method for obtaining the absorption position, mass and rigidity of a particle deposited on the surface of a resonator based on the relative change in the resonance frequency of said resonator in 3 or 4 flexural vibration modes. The rigidity of the particles is of great interest in the study of cells and other biological compounds that change state without significantly changing the mass.

Abstract: The invention relates to a spectrophotometer, especially a spectrophotometer that can carry out simultaneous analysis at different points on the same sample (4), with a high spatial resolution and without requiring a mechanical system for physical scanning along the sample. This is obtained by the provision of means for processing the light received by the photodetectors (5), said processing means having a correlation wherein each of the photodetectors (5) corresponds to a spatial point on the sample (4). In the case of dark field applications, the present invention ensures the standardization of the data using the same measure.

Abstract: The invention relates to a spectrophotometer, especially a spectrophotometer that can carry out simultaneous analysis at different points on the same sample (4), with a high spatial resolution and without requiring a mechanical system for physical scanning along the sample. This is obtained by the provision of means for processing the light received by the photodetectors (5), said processing means having a correlation wherein each of the photodetectors (5) corresponds to a spatial point on the sample (4). In the case of dark field applications, the present invention ensures the standardization of the data using the same measure.