Patents by Inventor Scott Ellis Hemmings

Scott Ellis Hemmings has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10812701
    Abstract: A method is provided for operating a tunable acoustic gradient (TAG) lens imaging system. The method includes: (a) providing a smart lighting pulse control routine/circuit (SLPCRC) that provides a first mode of exposure control corresponding to a points from focus (PFF) mode of the TAG lens imaging system and a second mode of exposure control corresponding to an extended depth of focus (EDOF) mode of the TAG lens imaging system; (b) placing a workpiece in a field of view of the TAG lens imaging system; and (c) periodically modulating a focus position of the TAG lens imaging system without macroscopically adjusting the spacing between elements in the TAG lens imaging system, wherein the focus position is periodically modulated over a plurality of focus positions along a focus axis direction in a focus range including a surface height of the workpiece, at a modulation frequency of at least 30 kHz.
    Type: Grant
    Filed: December 13, 2018
    Date of Patent: October 20, 2020
    Assignee: Mitutoyo Corporation
    Inventors: Vahan Senekerimyan, Joseph Andrew Summers, Scott Ellis Hemmings, Mark Lawrence Delaney, Paul Gerard Gladnick, Bjorn Erik Bertil Jansson
  • Publication number: 20200195836
    Abstract: A method is provided for operating a tunable acoustic gradient (TAG) lens imaging system. The method includes: (a) providing a smart lighting pulse control routine/circuit (SLPCRC) that provides a first mode of exposure control corresponding to a points from focus (PFF) mode of the TAG lens imaging system and a second mode of exposure control corresponding to an extended depth of focus (EDOF) mode of the TAG lens imaging system; (b) placing a workpiece in a field of view of the TAG lens imaging system; and (c) periodically modulating a focus position of the TAG lens imaging system without macroscopically adjusting the spacing between elements in the TAG lens imaging system, wherein the focus position is periodically modulated over a plurality of focus positions along a focus axis direction in a focus range including a surface height of the workpiece, at a modulation frequency of at least 30 kHz.
    Type: Application
    Filed: December 13, 2018
    Publication date: June 18, 2020
    Inventors: Vahan Senekerimyan, Joseph Andrew Summers, Scott Ellis Hemmings, Mark Lawrence Delaney, Paul Gerard Gladnick, Bjorn Erik Bertil Jansson
  • Patent number: 10215547
    Abstract: A method is disclosed for operating a coordinate measuring machine (CMM) including a workpiece scanning probe. The method provides two different measurement sampling period durations in the scanning probe: a first shorter sampling duration provides a faster measurement having a first accuracy, a second longer sampling duration provides a slower measurement having a second (better) accuracy. The shorter sampling duration may be repeatedly interleaved or alternated with the longer sampling duration to provide sufficient accuracy and response time for motion control purposes during ongoing operation of the CMM. The longer sampling duration may provide high accuracy probe measurements to combine with position coordinate values from encoders located on motion axes of the CMM (outside the scanning probe) to provide high accuracy workpiece measurements at a desired frequency, or upon demand. A probe measurement timing subsystem may determine initiation times of the first and second sampling durations.
    Type: Grant
    Filed: March 31, 2017
    Date of Patent: February 26, 2019
    Assignee: Mitutoyo Corporation
    Inventors: Scott Ellis Hemmings, Andrew Patzwald
  • Publication number: 20190004092
    Abstract: A set of respective self-configuring probe interface circuit boards (SC-MPIC's) are disclosed for use with a measurement system comprising host electronics and respective interchangeable measurement probes. Member SC-MPICs each comprises: a local circuit (LS) for probe identification, signal processing and inter-board signal control; and higher-direction and lower-direction connectors “pointing” toward and away from the measurement probe, respectively. Member SC-MPICs establish a processing hierarchy by generating lower board present signals on their higher-direction connector, higher board present signals on their lower-direction connector, and determining whether they are the highest and/or lowest SC-MPIC based on receiving those signals from adjacent SC-MPICs. They can independently perform probe identification matching operations using probe identification data from compatible and incompatible probes, and the highest SC-MPIC does this first.
    Type: Application
    Filed: June 26, 2018
    Publication date: January 3, 2019
    Inventor: Scott Ellis Hemmings
  • Patent number: 9970744
    Abstract: A method is disclosed for operating a coordinate measuring machine (CMM) including a CMM control system, a surface scanning probe that measures a workpiece surface by outputting probe workpiece measurements, and a probe measurement timing subsystem. The method comprises: operating the CMM control system to output a measurement synchronization trigger signal at predictable times; operating the probe measurement timing subsystem to determine a pre-trigger lead time that is a fraction of a current duration of a probe workpiece measurement sample period, to initiate a current instance of the probe measurement sample period at the pre-trigger lead time before a next predictable time of the measurement synchronization trigger signal; operating the CMM control system to latch a current set of CMM position coordinate values; and operating the surface scanning probe to output the current instance of the probe workpiece measurement in association with the current set of CMM position coordinate values.
    Type: Grant
    Filed: June 24, 2016
    Date of Patent: May 15, 2018
    Assignee: Mitutoyo Corporation
    Inventors: Scott Ellis Hemmings, Andrew Patzwald
  • Publication number: 20170370689
    Abstract: A method is disclosed for operating a coordinate measuring machine (CMM) including a workpiece scanning probe. The method provides two different measurement sampling period durations in the scanning probe: a first shorter sampling duration provides a faster measurement having a first accuracy, a second longer sampling duration provides a slower measurement having a second (better) accuracy. The shorter sampling duration may be repeatedly interleaved or alternated with the longer sampling duration to provide sufficient accuracy and response time for motion control purposes during ongoing operation of the CMM. The longer sampling duration may provide high accuracy probe measurements to combine with position coordinate values from encoders located on motion axes of the CMM (outside the scanning probe) to provide high accuracy workpiece measurements at a desired frequency, or upon demand. A probe measurement timing subsystem may determine initiation times of the first and second sampling durations.
    Type: Application
    Filed: March 31, 2017
    Publication date: December 28, 2017
    Inventors: Scott Ellis Hemmings, Andrew Patzwald
  • Publication number: 20170370688
    Abstract: A method is disclosed for operating a coordinate measuring machine (CMM) including a CMM control system, a surface scanning probe that measures a workpiece surface by outputting probe workpiece measurements, and a probe measurement timing subsystem. The method comprises: operating the CMM control system to output a measurement synchronization trigger signal at predictable times; operating the probe measurement timing subsystem to determine a pre-trigger lead time that is a fraction of a current duration of a probe workpiece measurement sample period, to initiate a current instance of the probe measurement sample period at the pre-trigger lead time before a next predictable time of the measurement synchronization trigger signal; operating the CMM control system to latch a current set of CMM position coordinate values; and operating the surface scanning probe to output the current instance of the probe workpiece measurement in association with the current set of CMM position coordinate values.
    Type: Application
    Filed: June 24, 2016
    Publication date: December 28, 2017
    Inventors: Scott Ellis Hemmings, Andrew Patzwald