Patents by Inventor Sebastian Borck

Sebastian Borck has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10649194
    Abstract: An arrangement and method for supplying immersion media and a method for setting optical parameters of a medium, includes a media supply unit for the controlled supply of a medium or of a mixture into a contact region between an optical lens and a specimen slide, on which a specimen may be arranged. An image capture unit is provided for capturing image data on the basis of detection radiation from the object space along a detection beam path extending through the contact region. An evaluation unit is provided to establish current image parameters on the basis of captured image data, to compare said current image parameters to intended image parameters and to establish a desired mixing ratio of at least two components of the medium depending on the comparison.
    Type: Grant
    Filed: September 26, 2018
    Date of Patent: May 12, 2020
    Assignee: Carl Zeiss Microscopy GmbH
    Inventors: Thomas Kalkbrenner, Sebastian Borck, Jörg Siebenmorgen
  • Publication number: 20190101740
    Abstract: An arrangement and method for supplying immersion media and a method for setting optical parameters of a medium, includes a media supply unit for the controlled supply of a medium or of a mixture into a contact region between an optical lens and a specimen slide, on which a specimen may be arranged. An image capture unit is provided for capturing image data on the basis of detection radiation from the object space along a detection beam path extending through the contact region. An evaluation unit is provided to establish current image parameters on the basis of captured image data, to compare said current image parameters to intended image parameters and to establish a desired mixing ratio of at least two components of the medium depending on the comparison.
    Type: Application
    Filed: September 26, 2018
    Publication date: April 4, 2019
    Applicant: Carl Zeiss Microscopy GmbH
    Inventors: Thomas KALKBRENNER, Sebastian Borck, Jörg Siebenmorgen
  • Publication number: 20120140057
    Abstract: Currently, relatively weak light sources with low light intensities are used in wide-field microscopes. Inevitably, focusing in the pupil plane thereby results in low light intensities in the sample, since the output of the light source is distributed over a very large sample area. However, there are also wide-field technologies requiring very high intensities, for example, photo-activates localization (PAL) microscopy. It is the object of the invention to allow, with little expenditure, the flexible adjustment of the illumination light intensity in the sample. For this purpose, a laser (2) is used for a light source, and a variable lens (10) is arranged in the illumination beam path thus making a variable adjustment of a bean cross section of the illumination light in an intermediate image plane possible, wherein a divergence of the illumination light is identical for different beam cross sections. In this way, the size of the visual field of the microscope can be flexibly adjusted.
    Type: Application
    Filed: August 4, 2010
    Publication date: June 7, 2012
    Inventors: Sebastian Borck, Michael Hilbert, Michael Gölles
  • Publication number: 20120008197
    Abstract: The invention relates to a microscope, more particularly to a fluorescence microscope, for the structured illumination microscopy, comprising a microscope light path having an optical axis, including a beam splitter for coupling illumination light into the microscope light path, including an illumination pattern unit disposed, in particular, in the microscope light path for the purpose of generating an illuminated pattern on, or in, a sample to be examined, comprising a rotary device for the purpose of effecting relative rotation about the optical axis between the illumination pattern and the sample to be examined.
    Type: Application
    Filed: July 5, 2011
    Publication date: January 12, 2012
    Inventors: Sebastian Borck, Wolfgang Bathe