Abstract: A surface-treated copper foil according to exemplary embodiments includes a copper foil layer and a protrusion layer formed on one surface of the copper foil layer. Pores are formed inside the protrusion layer or around a boundary between the copper foil layer and the protrusion layer. Abnormal growth of the protrusions may be prevented through the pores and thus a bonding force with the insulation layer may be improved.

Abstract: An apparatus for measuring thickness and a method therefor are disclosed, in which the precision is improved, the measuring time is shortened, the reliability is upgraded, and the flatness of thickness also can be precisely measured. The apparatus for measuring thickness according to the present invention includes a test piece retaining part for retaining a test piece and for moving it along X, Y and Z axes. The apparatus further includes a sensing part having a sensor retaining part for retaining an upper sensor, and having a test piece retaining part supporting table for supporting the test piece retaining part and having a lower sensor fixed thereon. The test piece retaining part includes: an X axis carrying part capable of moving in the direction of X axis, a Y axis carrying part capable of moving in the direction of Y axis, and a Z axis carrying part capable of moving in the direction of Z axis.