Patents by Inventor Sheng-Chi Chan

Sheng-Chi Chan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10591646
    Abstract: An infrared anti-reflection film structure, an anti-reflection film layer, including a material of zinc oxide, comprising a top anti-reflection film layer and a bottom anti-reflection film layer, wherein the top anti-reflection film layer is disposed on a top side of the base material and the bottom anti-reflection film layer is disposed on a bottom side of the base material; and the base material is manufactured by a floating zone crystal growth method. Through the silicon base material manufactured by the high purity crystal growth method, the silicon base material replaces germanium as the high refractive index material and base material. And coating the anti-reflection film layer on the surface of the silicon base material, so as to apply the infrared anti-reflection film structure to the thermal imaging technology.
    Type: Grant
    Filed: December 20, 2017
    Date of Patent: March 17, 2020
    Assignee: National Chung-Shan Institute of Science and Technology
    Inventors: Shih-Hao Chan, Shiang-Feng Tang, Shao-Ze Tseng, Kun-Chi Lo, Sheng-Hui Chen, Wen-Jen Lin
  • Publication number: 20190318464
    Abstract: A fingerprint identification module test system includes a light source, a projection surface, a low-end image pickup device and a judgment module. The light source emits and projects a light beam onto an under-test fingerprint identification module. After the light beam is reflected by the under-test fingerprint identification module and projected onto the projection surface, a projected image is formed on the projection surface. Then, the low-end image pickup device photographs the projected image to acquire an under-test corresponding to the under-test fingerprint identification module. According to the result of comparing the under-test image with the predetermined image, the judgment module judges whether the under-test fingerprint identification module complies with the production specifications. Since the fingerprint identification module test system uses parity devices to test the under-test fingerprint identification module, the fingerprint identification module test system is cost-effective.
    Type: Application
    Filed: May 25, 2018
    Publication date: October 17, 2019
    Inventors: SHENG-CHI CHAN, JUI-TING CHIEN, PEI-MING HSU
  • Publication number: 20190187334
    Abstract: An infrared anti-reflection film structure, an anti-reflection film layer, including a material of zinc oxide, comprising a top anti-reflection film layer and a bottom anti-reflection film layer, wherein the top anti-reflection film layer is disposed on a top side of the base material and the bottom anti-reflection film layer is disposed on a bottom side of the base material; and the base material is manufactured by a floating zone crystal growth method. Through the silicon base material manufactured by the high purity crystal growth method, the silicon base material replaces germanium as the high refractive index material and base material. And coating the anti-reflection film layer on the surface of the silicon base material, so as to apply the infrared anti-reflection film structure to the thermal imaging technology.
    Type: Application
    Filed: December 20, 2017
    Publication date: June 20, 2019
    Inventors: Shih-Hao Chan, Shiang-Feng Tang, Shao-Ze Tseng, Kun-Chi Lo, Sheng-Hui Chen, Wen-Jen Lin
  • Patent number: 10237545
    Abstract: An image pickup module test system includes a computing device, an optical reflector, a block gauge and a fixing device. A test program is executed in the computing device. The image pickup module is fixed at a position in front of the optical reflector by the fixing device. The image pickup device acquires an image of the image pickup module and the block gauge that is reflected from the optical reflector. The test program analyzes the image to obtain a feature point of the image pickup module and a feature point of the block gauge. Moreover, the test program judges whether an installation location of at least one lens unit of the image pickup module complies with a production specification according to the standard length value corresponding to the single pixel of the image and the feature point of the image pickup module.
    Type: Grant
    Filed: May 30, 2018
    Date of Patent: March 19, 2019
    Assignee: PRIMAX ELECTRONICS LTD
    Inventors: Shih-Jung Huang, Sheng-Chi Chan
  • Publication number: 20060181768
    Abstract: A focus assisting method for a binocular image-taking apparatus. The binocular image-taking apparatus aims at a target such that the image of the target is received by an image-taking member. The image of the target received by the image-taking member is magnified to a predetermined ratio and the magnified image thereof is displayed on a display member. The position of an objective lens with respect to a beam splitter is adjusted to obtain an optimal clarified image of the target on the display member. The magnified image of the target on the display member is restored to an original size.
    Type: Application
    Filed: August 19, 2005
    Publication date: August 17, 2006
    Inventors: Sheng-Chi Chan, Shih-Hsun Chan