Patents by Inventor Shigeki Nishina
Shigeki Nishina has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Patent number: 11229971Abstract: Provided is a three-dimensional laminating and shaping apparatus 100 including a column unit 200 that is configured to output an electron beam EB and deflect the electron beam EB toward the front surface of a powder layer 32, an insulating portion that electrically insulates a three-dimensional structure 36 from a ground potential member, an ammeter 73 that is configured to measure the current value indicative of the current flowing into the ground after passing through the three-dimensional structure 36, a melting judging unit 410 that is configured to detect that the powder layer 32 is melted based on the current value measured by the ammeter 73 and generate a melting signal, and a deflection controller 420 that is configured to receive the melting signal to determine the condition for the irradiation with the electron beam.Type: GrantFiled: September 11, 2018Date of Patent: January 25, 2022Assignee: ADVANTEST CORPORATIONInventors: Shinji Sugatani, Shigeki Nishina, Jun Matsumoto, Masahiro Takizawa, Minoru Soma, Akio Yamada
-
Patent number: 10919105Abstract: Provided is a three-dimensional laminating and shaping apparatus 100 including a column unit 200 that is configured to output an electron beam EB and deflect the electron beam EB toward the front surface of a powder layer 32, an electron detector 72 that is configured to detect electrons that may be emitted in a predetermined direction from the front surface of the powder layer 32 when the powder layer 32 is irradiated with the electron beam EB, a melting judging unit 410 that is configured to generate a melting signal based on the strength of the detection signal from the electron detector 72, and a deflection controller 420 that is configured to receive the melting signal to determine the condition of the irradiation the electron beam.Type: GrantFiled: September 4, 2018Date of Patent: February 16, 2021Assignee: ADVANTEST CORPORATIONInventors: Shinji Sugatani, Shigeki Nishina, Jun Matsumoto, Masahiro Takizawa, Minoru Soma, Akio Yamada
-
Publication number: 20190118287Abstract: Provided is a three-dimensional laminating and shaping apparatus 100 including a column unit 200 that is configured to output an electron beam EB and deflect the electron beam EB toward the front surface of a powder layer 32, an insulating portion that electrically insulates a three-dimensional structure 36 from a ground potential member, an ammeter 73 that is configured to measure the current value indicative of the current flowing into the ground after passing through the three-dimensional structure 36, a melting judging unit 410 that is configured to detect that the powder layer 32 is melted based on the current value measured by the ammeter 73 and generate a melting signal, and a deflection controller 420 that is configured to receive the melting signal to determine the condition for the irradiation with the electron beam.Type: ApplicationFiled: September 11, 2018Publication date: April 25, 2019Inventors: Shinji SUGATANI, Shigeki NISHINA, Jun MATSUMOTO, Masahiro TAKIZAWA, Minoru SOMA, Akio YAMADA
-
Publication number: 20190118286Abstract: Provided is a three-dimensional laminating and shaping apparatus 100 including a column unit 200 that is configured to output an electron beam EB and deflect the electron beam EB toward the front surface of a powder layer 32, an electron detector 72 that is configured to detect electrons that may be emitted in a predetermined direction from the front surface of the powder layer 32 when the powder layer 32 is irradiated with the electron beam EB, a melting judging unit 410 that is configured to generate a melting signal based on the strength of the detection signal from the electron detector 72, and a deflection controller 420 that is configured to receive the melting signal to determine the condition of the irradiation the electron beam.Type: ApplicationFiled: September 4, 2018Publication date: April 25, 2019Inventors: Shinji SUGATANI, Shigeki NISHINA, Jun MATSUMOTO, Masahiro TAKIZAWA, Minoru SOMA, Akio YAMADA
-
Patent number: 9176008Abstract: An electromagnetic wave measurement device includes an electromagnetic wave outputter that outputs an electromagnetic wave having a frequency equal to or more than 0.01 THz and equal to or less than 100 THz toward a device under test. An electromagnetic wave detector detects the electromagnetic wave which has transmitted through the device under test. A relative position changer changes a relative position of an intersection of an optical path of the electromagnetic wave transmitting through the device under test and the device under test, with respect to the device under test, so that the intersection is at a predetermined relative position due to the refraction of the electromagnetic wave by the device under test. A characteristic value deriver derives a characteristic value of the electromagnetic wave based on a detection result of the electromagnetic wave detector, the characteristic value being associated with the predetermined relative position.Type: GrantFiled: April 25, 2013Date of Patent: November 3, 2015Assignee: ADVANTEST CORPORATIONInventors: Shigeki Nishina, Motoki Imamura, Akiyoshi Irisawa, Tomoyu Yamashita, Eiji Kato, Kodo Kawase
-
Patent number: 8969807Abstract: A carrier includes attachment holes to which a catalyst attaches, and non-attachment holes to which the catalyst does not attach. An attachment quantity measurement device includes an electromagnetic wave output device that outputs a terahertz wave toward the carrier, an electromagnetic wave detector that detects the terahertz wave which has transmitted through the carrier, a reference value obtainer that obtains, based on a result detected by the electromagnetic wave detector, any one of an absorption rate, a group delay, and a dispersion of the terahertz wave in the non-attachment holes, and an attachment quantity obtainer that obtains, based on the result detected by the electromagnetic wave detector and the result obtained by the reference value obtainer, a weight or a density of the catalyst present in the attachment holes.Type: GrantFiled: November 16, 2012Date of Patent: March 3, 2015Assignee: Advantest CorporationInventors: Motoki Imamura, Shigeki Nishina
-
Publication number: 20130240736Abstract: An electromagnetic wave measurement device includes an electromagnetic wave outputter that outputs an electromagnetic wave having a frequency equal to or more than 0.01 THz and equal to or less than 100 THz toward a device under test. An electromagnetic wave detector detects the electromagnetic wave which has transmitted through the device under test. A relative position changer changes a relative position of an intersection of an optical path of the electromagnetic wave transmitting through the device under test and the device under test, with respect to the device under test, so that the intersection is at a predetermined relative position due to the refraction of the electromagnetic wave by the device under test. A characteristic value deriver derives a characteristic value of the electromagnetic wave based on a detection result of the electromagnetic wave detector, the characteristic value being associated with the predetermined relative position.Type: ApplicationFiled: April 25, 2013Publication date: September 19, 2013Applicant: ADVANTEST CORPORATIONInventors: Shigeki NISHINA, Motoki IMAMURA, Akiyoshi IRISAWA, Tomoyu YAMASHITA, Eiji KATO, Kodo KAWASE
-
Patent number: 8493057Abstract: A detector detects an electromagnetic wave having a frequency of 0.01 THz?f?100 THz and transmitted through a device under test (DUT). A changer changes a relative position of an intersection of an optical path of the electromagnetic wave and the DUT, with respect to the DUT. A deriver derives a characteristic value of the electromagnetic wave based on a detection result of the detector, while the characteristic value is associated with an assumed relative position, which is the relative position if the electromagnetic wave is not refracted by the DUT. A corrector changes the assumed relative position to an actual relative position, which is the relative position if the refraction of the electromagnetic wave by the DUT is considered. A corrected deriver derives the characteristic value associated with a predetermined relative position based on an output from the corrector.Type: GrantFiled: March 25, 2010Date of Patent: July 23, 2013Assignee: Advantest CorporationInventors: Shigeki Nishina, Motoki Imamura, Akiyoshi Irisawa, Tomoyu Yamashita, Eiji Kato, Kodo Kawase
-
Patent number: 8481938Abstract: According to the present invention, an electromagnetic wave measurement device includes an electromagnetic wave output device, an electromagnetic wave detector, a relative position changing unit, a delay period recording unit, a phase deriving unit, a delay-corrected phase deriving unit, a sinogram deriving unit, and an image deriving unit. The electromagnetic wave output device outputs an electromagnetic wave having a frequency equal to or more than 0.01 THz and equal to or less than 100 THz toward a device under test and a container storing at least a part of the device under test.Type: GrantFiled: March 25, 2010Date of Patent: July 9, 2013Assignee: Advantest CorporationInventors: Shigeki Nishina, Motoki Imamura, Akiyoshi Irisawa, Tomoyu Yamashita, Eiji Kato
-
Publication number: 20130075612Abstract: A carrier includes attachment holes to which a catalyst attaches, and non-attachment holes to which the catalyst does not attach. An attachment quantity measurement device includes an electromagnetic wave output device that outputs a terahertz wave toward the carrier, an electromagnetic wave detector that detects the terahertz wave which has transmitted through the carrier, a reference value obtainer that obtains, based on a result detected by the electromagnetic wave detector, any one of an absorption rate, a group delay, and a dispersion of the terahertz wave in the non-attachment holes, and an attachment quantity obtainer that obtains, based on the result detected by the electromagnetic wave detector and the result obtained by the reference value obtainer, a weight or a density of the catalyst present in the attachment holes.Type: ApplicationFiled: November 16, 2012Publication date: March 28, 2013Applicant: ADVANTEST CORPORATIONInventors: Motoki IMAMURA, Shigeki NISHINA
-
Patent number: 8378703Abstract: The present invention restrains adverse effects caused by refraction of a terahertz wave by a device under test when the terahertz wave is fed to the device under test for measurement. A container 10 contains at least part of a device under test 1 to be measured by a terahertz wave measurement device. The container 10 includes a gap portion 11 that internally arranges at least a part of the device under test 1, and an enclosure portion 12 that includes a first curved surface portion S1, and a second curved surface portion S2, and arranges the gap portion 11 between the first curved surface portion S1 and the second curved surface portion S2, thereby enclosing the gap portion 11. Moreover, a relationship n1<n2 holds where n2 is the refractive index of the enclosure portion, and n1 is the refractive index of the device under test. Further, both the first curved surface portion S1 and the second curved surface portion S2 are convex surfaces.Type: GrantFiled: June 17, 2009Date of Patent: February 19, 2013Assignee: Advantest CorporationInventors: Akiyoshi Irisawa, Shigeki Nishina
-
Patent number: 8330110Abstract: A container according to the present invention contains at least a part of a device under test to be measured by a terahertz wave measurement device. The container includes a gap portion that internally disposes at least a part of the device under test, and an enclosure portion that includes a first flat surface portion and a second flat surface portion, and disposes the gap portion between the first flat surface portion and the second flat surface portion, thereby enclosing the gap portion. Moreover, a relationship n1?0.1?n2?n1+0.1 holds where n2 is a refractive index of the enclosure portion, and n1 is a refractive index of the device under test. Further, the first flat surface portion intersects with a travel direction of the terahertz wave at the right angle.Type: GrantFiled: November 12, 2009Date of Patent: December 11, 2012Assignee: Advantest CorporationInventors: Shigeki Nishina, Shigeaki Naitoh
-
Patent number: 8210035Abstract: The present invention precisely measures characteristic values (such as the absorption coefficient) of an electromagnetic wave when a density of a PM in a DPF which collects the PM in an exhaust gas. The DPF receives the exhaust gas, and collects the PM in the exhaust gas. The DPF includes first hole portions which are open at a first end on a side for receiving the exhaust gas, and are closed at a second end on a side opposite to the first end, second hole portions which are closed at the first end and are open at the second end, and third hole portions which are closed at the first end. The first hole portion and the second hole portion are adjacent to each other. The third hole portions are adjacent to each other. The PM in the exhaust gas passing through partition walls which partition the first hole portion and the second hole portion adjacent to each other is collected by the partition walls.Type: GrantFiled: October 29, 2009Date of Patent: July 3, 2012Assignee: Advantest CorporationInventors: Motoki Imamura, Shigeki Nishina
-
Patent number: 8183528Abstract: According to the present invention, the CT is carried out based on parameters other than the absorption rate. An electromagnetic wave measurement device includes an electromagnetic wave output device 2 which outputs an electromagnetic wave at a frequency equal to or more than 0.Type: GrantFiled: June 18, 2009Date of Patent: May 22, 2012Assignee: Advantest CorporationInventors: Eiji Kato, Shigeki Nishina, Motoki Imamura, Akiyoshi Irisawa, Tomoyu Yamashita
-
Patent number: 8053733Abstract: A desired spatial resolution upon a measurement can be attained by making an electromagnetic wave including a terahertz wave (frequency thereof is equal to or more than 0.01 [THz], and equal to or less than 100 [THz]) incident to a device under test. An electromagnetic wave measurement device includes an incident lens which makes an electromagnetic wave to be measured having a frequency equal to or more than 0.Type: GrantFiled: November 12, 2009Date of Patent: November 8, 2011Assignee: Advantest CorporationInventors: Shigeki Nishina, Motoki Imamura
-
Publication number: 20110094300Abstract: The present invention precisely measures characteristic values (such as the absorption coefficient) of an electromagnetic wave when a density of a PM in a DPF which collects the PM in an exhaust gas. The DPF receives the exhaust gas, and collects the PM in the exhaust gas. The DPF includes first hole portions which are open at a first end on a side for receiving the exhaust gas, and are closed at a second end on a side opposite to the first end, second hole portions which are closed at the first end and are open at the second end, and third hole portions which are closed at the first end. The first hole portion and the second hole portion are adjacent to each other. The third hole portions are adjacent to each other. The PM in the exhaust gas passing through partition walls which partition the first hole portion and the second hole portion adjacent to each other is collected by the partition walls.Type: ApplicationFiled: October 29, 2009Publication date: April 28, 2011Applicant: ADVANTEST CORPORATIONInventors: Motoki IMAMURA, Shigeki NISHINA
-
Publication number: 20110097649Abstract: The present invention measures a quantity of attachment (such as density) of a material (such as catalyst and promoter) attached to a carrier. A carrier 1 includes attachment holes 12 to which a catalyst 24 attaches, and non-attachment holes 14 to which the catalyst 24 does not attach, where extension directions of the attachment holes 12 and the non-attachment holes 14 are parallel with each other (perpendicular to a first end surface 1a), and are opened on the first end surface 1a and a second end surface 1b. An attachment quantity measurement device includes an electromagnetic wave output device 2 that outputs a terahertz wave at a frequency equal to or more than 0.Type: ApplicationFiled: October 29, 2009Publication date: April 28, 2011Applicant: ADVANTEST CORPORATIONInventors: Motoki IMAMURA, Shigeki NISHINA
-
Publication number: 20110075127Abstract: A desired spatial resolution upon a measurement can be attained by making an electromagnetic wave including a terahertz wave (frequency thereof is equal to or more than 0.01 [THz], and equal to or less than 100 [THz]) incident to a device under test. An electromagnetic wave measurement device includes an incident lens which makes an electromagnetic wave to be measured having a frequency equal to or more than 0.Type: ApplicationFiled: November 12, 2009Publication date: March 31, 2011Applicant: ADVANTEST CORPORATIONInventors: Shigeki NISHINA, Motoki IMAMURA
-
Publication number: 20110057103Abstract: A container according to the present invention contains at least a part of a device under test to be measured by a terahertz wave measurement device. The container includes a gap portion that internally disposes at least a part of the device under test, and an enclosure portion that includes a first flat surface portion and a second flat surface portion, and disposes the gap portion between the first flat surface portion and the second flat surface portion, thereby enclosing the gap portion. Moreover, a relationship n1?0.1?n2?n1+0.1 holds where n2 is a refractive index of the enclosure portion, and n1 is a refractive index of the device under test. Further, the first flat surface portion intersects with a travel direction of the terahertz wave at the right angle.Type: ApplicationFiled: November 12, 2009Publication date: March 10, 2011Applicant: ADVANTEST CorporationInventors: Shigeki NISHINA, Shigeaki NAITOH
-
Publication number: 20110001048Abstract: According to the present invention, an electromagnetic wave measurement device includes an electromagnetic wave output device, an electromagnetic wave detector, a relative position changing unit, a delay period recording unit, a phase deriving unit, a delay-corrected phase deriving unit, a sinogram deriving unit, and an image deriving unit. The electromagnetic wave output device outputs an electromagnetic wave having a frequency equal to or more than 0.01 [THz] and equal to or less than 100 [THz] toward a device under test and a container storing at least a part of the device under test. The electromagnetic wave detector detects the electromagnetic wave which has transmitted through the device under test. The relative position changing unit changes a relative position of an intersection at which an optical path of the electromagnetic wave transmitting through the device under test and the device under test intersect with respect to the device under test.Type: ApplicationFiled: March 25, 2010Publication date: January 6, 2011Applicant: ADVANTEST CORPORATIONInventors: Shigeki NISHINA, Motoki IMAMURA, Akiyoshi IRISAWA, Tomoyu YAMASHITA, Eiji KATO