Patents by Inventor Shigeru Tanimoto

Shigeru Tanimoto has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Source level control for impedance meter
    Patent number: 5019781
    Abstract: An impedance meter with improved measurement accuracy obtained by controlling the level of the signal source. The impedance meter comprises a signal source, feedback amplifier, synchronous detector, A/D and control logic. The source level is maintaind by the control logic at a predetermined value by measuring the output of a synchronous detector and intermittently adjusting the level of the source thereby compensating for variations in test object's impedance. Control logic algorithms employed include successive substitution, bisection and linear interpolation.
    Type: Grant
    Filed: October 25, 1990
    Date of Patent: May 28, 1991
    Assignee: Hewlett-Packard Company
    Inventors: Shigeru Tanimoto, Kouichi Takeuchi
  • Apparatus which uses a simulated inductor in the measurement of an electrical parameter of a device under test
    Patent number: 4885528
    Abstract: The present invention relates to apparatus for measuring the AC electrical parameters of a circuit element (Device-Under-Test, DUT), such as a resistor, a capacitor or an inductor, at the desired frequency of a signal while applying a DC bias to the DUT. The present invention provides an apparatus capable of measurement with less error even in the lower-frequency range.
    Type: Grant
    Filed: March 3, 1989
    Date of Patent: December 5, 1989
    Assignee: Hewlett-Packard Company
    Inventors: Hideshi Tanaka, Kazuyuki Yagi, Shigeru Tanimoto, Yasuaki Komatsu, Koichi Yanagawa, Yoichi Kuboyama