Abstract: An apparatus for inspecting a thermal assist type magnetic head is configured to include a scanning probe microscope unit comprising a cantilever having a probe with a magnetic film formed on the surface of a tip portion thereof; a prober unit which provides an alternating current to a terminal formed on the thermal assist type magnetic head element; a scattered light detection unit which detects scattered light generated from the probe; and a signal process unit which detects defect by using an output signal from the scanning probe microscope unit by scanning the surface of the thermal assist type magnetic head element with the probe in a state that the magnetic field is generated and the near-field light is stopped, and an output signal from the scattered light detection unit by scanning the surface with the probe while near-field light is generated and the magnetic field is off.

Abstract: To detect both of near-field light and magnetic field generated by a thermal assist type magnetic head and to perform inspection of the head, a cantilever of a scanning probe microscope has a lever in which a probe is formed, a thin magnetic film formed on a surface of the probe, and fine particles or thin film of noble metal or an alloy including noble metal formed on a surface of the magnetic film. An inspection apparatus has the cantilever, a displacement detection unit to detect vibration of the cantilever, a near-field light detection unit to detect scattered light caused by near-field light generated from a near-field light emitter and enhanced on the surface of the probe of the cantilever, and a processing unit to process signals obtained by detection with the displacement detection unit and the near-field light detection unit.

Abstract: An apparatus for inspecting a thermal assist type magnetic head is configured to include a scanning probe microscope unit comprising a cantilever having a probe with a magnetic film formed on the surface of a tip portion thereof; a prober unit which provides an alternating current to a terminal formed on the thermal assist type magnetic head element; a scattered light detection unit which detects scattered light generated from the probe; and a signal process unit which detects defect by using an output signal from the scanning probe microscope unit by scanning the surface of the thermal assist type magnetic head element with the probe in a state that the magnetic field is generated and the near-field light is stopped, and an output signal from the scattered light detection unit by scanning the surface with the probe while near-field light is generated and the magnetic field is off.

Abstract: An upward warp of a terminal pad of a flexible cable which is kept horizontal by a suction head is prevented by a pressing arm which contacts with an upper surface of a rear portion of the flexible cable.

Abstract: An upward warp of a terminal pad of a flexible cable which is kept horizontal by a suction head is prevented by a pressing arm which contacts with an upper surface of a rear portion of the flexible cable.

Abstract: A magnetic head assembly having a mounting base in which a mounting hole having a protruded peripheral edge is formed is easily mounted on a head clamp table positioning the magnetic head assembly by fitting the mounting hole on a boss pin or a receiving hole of a tray, with a pin or a hole on a mounting table and with a positioning pin on a head clamp table and positioning a suction collet with using a boss pin or a receiving hole of a tray as references, and sucking the mounting base of the magnetic head assembly by a handling robot without requiring high positioning accuracy.

Abstract: A magnetic head assembly having a mounting base in which a mounting hole having a protruded peripheral edge is formed is easily mounted on a head clamp table positioning the magnetic head assembly by fitting the mounting hole on a boss pin or a receiving hole of a tray, with a pin or a hole on a mounting table and with a positioning pin on a head clamp table and positioning a suction collet with using a boss pin or a receiving hole of a tray as references, and sucking the mounting base of the magnetic head assembly by a handling robot without requiring high positioning accuracy.

Abstract: A magnetic disk certifier includes a defect detector circuit comprising a low-pass filter for extracting a low frequency component of the read-out signal, the low frequency component containing a signal component of the error, a signal generator circuit for generating a signal having a predetermined frequency lower than the frequency of the read-out signal, a synthesizer circuit for synthesizing an output signal of the low-pass filter and the signal outputted from the signal generator circuit and a comparator for generating an error signal by comparing the synthesized signal from the synthesizer circuit with a predetermined reference level.

Abstract: A magnetic disk certifier includes a defect detector circuit comprising a low-pass filter for extracting a low frequency component of the read-out signal, the low frequency component containing a signal component of the error, a signal generator circuit for generating a signal having a predetermined frequency lower than the frequency of the read-out signal, a synthesizer circuit for synthesizing an output signal of the low-pass filter and the signal outputted from the signal generator circuit and a comparator for generating an error signal by comparing the synthesized signal from the synthesizer circuit with a predetermined reference level.