Patents by Inventor Shintarou Yamada

Shintarou Yamada has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Mass spectrometry device
    Patent number: 11387090
    Abstract: A constructed unit is fixed to a base by means of a plurality of support posts while being spaced from the base. The constructed unit includes an orthogonal acceleration unit. An incidence regulator unit is fixed to the base by a pair of support posts while being spaced from the base and the constructed unit. The incidence regulator unit includes, among others, a pair of blades that define a slit, and heaters for heating the pair of blades.
    Type: Grant
    Filed: January 20, 2021
    Date of Patent: July 12, 2022
    Assignee: JEOL Ltd.
    Inventors: Yoshihiko Miwa, Yasunori Nishimura, Keiko Kaneda, Shintarou Yamada, Yuta Nakaoka
  • Mass Spectrometry Device
    Publication number: 20210225630
    Abstract: A constructed unit is fixed to a base by means of a plurality of support posts while being spaced from the base. The constructed unit includes an orthogonal acceleration unit. An incidence regulator unit is fixed to the base by a pair of support posts while being spaced from the base and the constructed unit. The incidence regulator unit includes, among others, a pair of blades that define a slit, and heaters for heating the pair of blades.
    Type: Application
    Filed: January 20, 2021
    Publication date: July 22, 2021
    Inventors: Yoshihiko Miwa, Yasunori Nishimura, Keiko Kaneda, Shintarou Yamada, Yuta Nakaoka
  • Mass spectrometer equipped with MALDI ion source and sample plate for MALDI ion source
    Patent number: 7855359
    Abstract: A mass spectrometer is equipped with a MAILDI ion source facilitating both individual management of sample plates and mass calibration based on information about distortion in the sample plates. Also, sample plates adapted to be used in the MALDI ion source are provided. Identification information about each sample plate and information about distortion, i.e., topography, in the surface of the sample plate are engraved on the surface of the sample plate. These sets of information are also registered as an electronic file. During measurement, these sets of information are read by observation means and used for individual management of sample plates and mass calibration of mass spectra.
    Type: Grant
    Filed: August 25, 2008
    Date of Patent: December 21, 2010
    Assignee: JEOL Ltd.
    Inventors: Shintarou Yamada, Nobuo Kudou, Takaya Sato
  • Mass Spectrometer Equipped With MALDI Ion Source and Sample Plate for MALDI Ion Source
    Publication number: 20090057552
    Abstract: A mass spectrometer is equipped with a MAILDI ion source facilitating both individual management of sample plates and mass calibration based on information about distortion in the sample plates. Also, sample plates adapted to be used in the MALDI ion source are provided. Identification information about each sample plate and information about distortion, i.e., topography, in the surface of the sample plate are engraved on the surface of the sample plate. These sets of information are also registered as an electronic file. During measurement, these sets of information are read by observation means and used for individual management of sample plates and mass calibration of mass spectra.
    Type: Application
    Filed: August 25, 2008
    Publication date: March 5, 2009
    Applicant: JEOL LTD.
    Inventors: Shintarou Yamada, Nobuo Kudou, Takaya Sato