Patents by Inventor Shoichiro Mochimaru

Shoichiro Mochimaru has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5528646
    Abstract: A sample vessel for X-ray microscopes comprising a first silicon base plate having an entrance window covered with a thin film of silicon nitride, and a second silicon base plate which has an exit window covered with a thin film of silicon nitride and matched with the entrance window. The second silicon base plate being connected the first base plate by way of a spacer so as to form a sealed space capable of accommodating samples to be observed. Disposed in the space is a mesh member made of a wire material having an angle of contact with water smaller than 90.degree. at a location adjacent to the thin film of silicon nitride covering the entrance window or a thin film of aluminium is evaporation-coated over the thin film of silicon nitride.
    Type: Grant
    Filed: April 18, 1995
    Date of Patent: June 18, 1996
    Assignee: Olympus Optical Co., Ltd.
    Inventors: Yoshinori Iketaki, Shoichiro Mochimaru, Yoshiaki Horikawa, Komei Nagai
  • Patent number: 5434901
    Abstract: In a soft X-ray microscope including a soft X-ray source for emitting soft X-rays, a condenser lens for focusing the soft X-rays onto a specimen under inspection, an objective lens for focusing soft X-rays emanating from the specimen, a soft X-ray detector for receiving the soft X-rays focused by the objective lens, and a visually observing optical system for forming a visible image of the specimen by converting an optical property of the specimen other than contrast and color into a contrast in brightness or color. The visually observing optical system may be formed as phase contrast microscope, dark field microscope, polarizing microscope, differential interference microscope, or fluorescent microscope. Then, alignment and focus adjustment can be performed by observing the visible image of the specimen without irradiating the specimen with the soft X-rays even if the specimen has substantially no contrast and color.
    Type: Grant
    Filed: December 7, 1993
    Date of Patent: July 18, 1995
    Assignee: Olympus Optical Co., Ltd.
    Inventors: Komei Nagai, Yoshiaki Horikawa, Yoshinori Iketaki, Shoichiro Mochimaru
  • Patent number: 5352897
    Abstract: A soft X-ray detector includes a surface electrode layer, a photoelectric conversion layer, and a semiconductor detector having an electrode connected to the photoelectric conversion layer, for detecting an electric charge produced In the photoelectric conversion layer. The photoelectric conversion layer and the surface electrode layer have thicknesses satisfying conditionsdA.gtoreq.0.183.lambda./KAdB.ltoreq.0.183.lambda./KBwhere dA is a thickness of the photoelectric conversion layer, dB is a thickness of the surface electrode layer, KA is an extinction coefficient of radiation of a wavelength .lambda. in a substance constituting the photoelectric conversion layer, and KB is an extinction coefficient of radiation of the wavelength .lambda.in a substance constituting the surface electrode layer. Thus, the soft X-ray detector has a high sensitivity to soft X rays and a lower sensitivity to visible light, so that only soft X rays can be selectively detected.
    Type: Grant
    Filed: March 15, 1993
    Date of Patent: October 4, 1994
    Assignee: Olympus Optical Co., Ltd.
    Inventors: Yoshiaki Horikawa, Yoshinori Iketaki, Shoichiro Mochimaru, Koumei Nagai
  • Patent number: 5291339
    Abstract: A Schwarzschild optical system comprising a concave mirror having an opening formed at the center thereof and a convex mirror arranged in opposite to the opening of the concave mirror, and has a numerical aperture of at least 0.25 on the object side, the concave mirror being formed to have an aspherical surface. This Schwarzschild optical system has a relatively large numerical aperture, a relatively large departure between the centers of curvature of the concave mirror and the convex mirror, and favorably corrected aberrations.
    Type: Grant
    Filed: November 29, 1991
    Date of Patent: March 1, 1994
    Assignee: Olympus Optical Co., Ltd.
    Inventors: Shoichiro Mochimaru, Yoshiaki Horikawa, Mikiko Kato
  • Patent number: 5241426
    Abstract: A condenser optical system is provided for bringing a beam of light from a light source to a focus at a desired position. The condenser optical system has a reflecting surface including a quadric surface of revolution represented by Equation (1) described below. The reflecting surface satisfies the conditions of Equations (2) and (3) described below when the condenser optical system is disposed so that the light beam from the light source is incident, substantially parallel to a rotary axis of the quadric surface, on the reflecting surface:z=Cy.sup.2 /{1+(1-pC.sup.2 y.sup.2).sup.1/2 } (1)Ch<22 (2)78-4.theta..sub.
    Type: Grant
    Filed: April 22, 1992
    Date of Patent: August 31, 1993
    Assignee: Olympus Optical Co., Ltd.
    Inventors: Shoichiro Mochimaru, Yoshiaki Horikawa