Patents by Inventor Shou Tai

Shou Tai has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Contact probe and probe device
    Publication number: 20020186030
    Abstract: A probe device having a contact probe including a film, a plurality of wiring patterns formed on the film with each wiring pattern having a front end portion projecting from the film so as to form contact pins, and a metal layer provided on the film. In one embodiment, the contact probe device includes first and second contact probes connected to each other, the first contact probe including a first film, and a plurality of first wiring patterns formed on the first film, each first wiring pattern having a front end portion projecting from the first film so as to form contact pins. The second contact probe includes a second film, and a plurality of second wiring patterns formed on the second film. The plurality of second wiring patterns are connected to the plurality of first wiring patterns, and the second contact probe is formed separately from the first contact probe.
    Type: Application
    Filed: February 19, 2002
    Publication date: December 12, 2002
    Applicant: MITSUBISHI MATERIALS CORPORATION
    Inventors: Hideaki Yoshida, Toshinori Ishii, Atushi Matsuda, Mituyoshi Ueki, Noriyoshi Tachikawa, Tadashi Nakamura, Naoki Katou, Shou Tai, Hayato Sasaki, Naohumi Iwamoto, Akihumi Mishima, Toshiharu Hiji, Akihiro Masuda
  • CONTACT PROBE AND PROBE DEVICE
    Publication number: 20010019276
    Abstract: A probe device having a contact probe including a film, a plurality of wiring patterns formed on the film with each wiring pattern having a front end portion projecting from the film so as to form contact pins, and a metal layer provided on the film. In one embodiment, the contact probe device includes first and second contact probes connected to each other, the first contact probe including a first film, and a plurality of first wiring patterns formed on the first film, each first wiring pattern having a front end portion projecting from the first film so as to form contact pins. The second contact probe includes a second film, and a plurality of second wiring patterns formed on the second film. The plurality of second wiring patterns are connected to the plurality of first wiring patterns, and the second contact probe is formed separately from the first contact probe.
    Type: Application
    Filed: May 23, 1997
    Publication date: September 6, 2001
    Inventors: HIDEAKI YOSHIDA, TOSHINORI ISHII, ATUSHI MATSUDA, MITSUYOSHI UEKI, NORIYOSHI TACHIKAWA, TADASHI NAKAMURA, NAOKI KATOU, SHOU TAI, HAYATO SASAKI, NAOHUMI IWAMOTO, AKIHUMI MISHIMA, TOSHIHARU HIJI, AKIHIRO MASUDA