Patents by Inventor Shu-Sheng Lee

Shu-Sheng Lee has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7791730
    Abstract: A surface plasmon resonance meter is provided, including a backlight module, a line-slot plate, a parabolic mirror, a linear polarizer, a sensing chip, a prism and a photo detector array. The line-slot plate includes a light outlet. A light beam travels in the backlight module, and leaves the backlight module through the light outlet. The position of the line-slot plate is matched on a predetermined focal point of the parabolic mirror. The light beam is reflected by the parabolic mirror to be a parallel light beam, and travels trough the linear polarizer to the prism. The prism includes a light entering surface, a detection surface and a light exiting surface. The light beam enters the prism through the light entering surface, contacts the sensing chip with total internal reflection, and finally leaves the prism through the light exiting surface to be received by the photo detector array.
    Type: Grant
    Filed: April 13, 2009
    Date of Patent: September 7, 2010
    Assignee: National Taiwan University
    Inventors: Chih-Kung Lee, Shu-Sheng Lee, Chih-Hsiang Sung, Yi-Hao Chen
  • Publication number: 20100053625
    Abstract: A surface plasmon resonance meter is provided, including a backlight module, a line-slot plate, a parabolic mirror, a linear polarizer, a sensing chip, a prism and a photo detector array. The line-slot plate includes a light outlet. A light beam travels in the backlight module, and leaves the backlight module through the light outlet. The position of the line-slot plate is matched on a predetermined focal point of the parabolic mirror. The light beam is reflected by the parabolic mirror to be a parallel light beam, and travels trough the linear polarizer to the prism. The prism includes a light entering surface, a detection surface and a light exiting surface. The light beam enters the prism through the light entering surface, contacts the sensing chip with total internal reflection, and finally leaves the prism through the light exiting surface to be received by the photo detector array.
    Type: Application
    Filed: April 13, 2009
    Publication date: March 4, 2010
    Applicant: NATIONAL TAIWAN UNIVERSITY
    Inventors: Chih-Kung Lee, Shu-Sheng Lee, Chih-Hsiang Sung, Yi-Hao Chen
  • Patent number: 6919561
    Abstract: A diffraction laser encoder apparatus for positional and movement information measurement of a target made with a diffraction grating. The diffraction laser encoder has a laser light source for generating a source beam. A polarization beam splitter assembly comprises a polarization beam splitter for receiving the source beam for splitting a P-polarization component and an S-polarization component of the source beam into parallel and offset beams. A focusing lens focuses the P-polarization component and the S-polarization component beams onto the target diffraction grating and returning diffracted P-polarization and diffracted S-polarization beams back into the polarization beam splitter for generating a detector beam coaxially containing the diffracted P-polarization and the diffracted S-polarization beams. A detector assembly receives the detector beam for electrical processing and analysis for resolving the positional and movement information.
    Type: Grant
    Filed: February 9, 2004
    Date of Patent: July 19, 2005
    Inventors: Chih-Kung Lee, Liang-Bin Yu, Chyan-Chyi Wu, Shu-Sheng Lee, Wen-Jong Wu, Ming-Hua Wen, Shih-Jui Chen, Giin-Yuan Wu
  • Patent number: 6870237
    Abstract: A symmetric or asymmetric multilayer structure based on the technique of surface plasmon resonance (SPR) has been applied for modulation of resonant angle and wavelength. The fabrication of this invention can have nanoscale thin film layers up to several hundreds, while each layer has its own material of a high or low refractive index value, and the total layers in a thickness of tens to hundreds nanometers are grown in this single structure. This invention is intended for optimizing the scanning of mechanism by modulating SPR resonant angle and wavelength, and for developing the prospect of portable instruments.
    Type: Grant
    Filed: August 26, 2003
    Date of Patent: March 22, 2005
    Assignee: National Taiwan University
    Inventors: Chii-Wann Lin, Chen Kung Huang, Shiming Lin, Chih Kung Lee, Peizen Chang, Shu Sheng Lee
  • Patent number: 6844935
    Abstract: A multi-function opto-electronic detection apparatus for detecting molecular characteristics of a test sample. The appratuses comprises functional mode subsystems including a detecting light source subsystem for generating sampling beams for illuminating the test sample; a manipulation optics subsystem for aligning the sampling beam onto the test sample; a target signal processing subsystem for analyzing target beams emerging from the test sample resulting from the illuminating of the sampling beam; and a sample fixation subsystem for holding the test sample. The detecting light source subsystem, manipulation optics subsystem and target signal processing subsystem are assembled into one of several possible optical sampling setups for the detection characteristics of the test sample. The functional mode setups include at least ellispometer, confocal image scanner, photon tunneling scanning microscope and interferometer.
    Type: Grant
    Filed: January 20, 2004
    Date of Patent: January 18, 2005
    Assignee: National Taiwan University
    Inventors: Chih-Kung Lee, Shuen-Chen Shiue, Shu-Sheng Lee, Jiun-Yan Wu, Chii-Wann Lin, Shiming Lin
  • Publication number: 20040155179
    Abstract: A diffraction laser encoder apparatus for positional and movement information measurement of a target made with a diffraction grating. The diffraction laser encoder has a laser light source for generating a source beam. A polarization beam splitter assembly comprises a polarization beam splitter for receiving the source beam for splitting a P-polarization component and an S-polarization component of the source beam into parallel and offset beams. A focusing lens focuses the P-polarization component and the S-polarization component beams onto the target diffraction grating and returning diffracted P-polarization and diffracted S-polarization beams back into the polarization beam splitter for generating a detector beam coaxially containing the diffracted P-polarization and the diffracted S-polarization beams. A detector assembly receives the detector beam for electrical processing and analysis for resolving the positional and movement information.
    Type: Application
    Filed: February 9, 2004
    Publication date: August 12, 2004
    Inventors: Chih-Kung Lee, Liang-Bin Yu, Chyan-Chyi Wu, Shu-Sheng Lee, Wen-Jong Wu, Ming-Hua Wen, Shih-Jui Chen, Giin-Yuan Wu
  • Publication number: 20040145748
    Abstract: A multi-function opto-electronic detection apparatus for detecting molecular characteristics of a test sample. The appratuses comprises functional mode subsystems including a detecting light source subsystem for generating sampling beams for illuminating the test sample; a manipulation optics subsystem for aligning the sampling beam onto the test sample; a target signal processing subsystem for analyzing target beams emerging from the test sample resulting from the illuminating of the sampling beam; and a sample fixation subsystem for holding the test sample. The detecting light source subsystem, manipulation optics subsystem and target signal processing subsystem are assembled into one of several possible optical sampling setups for the detection characteristics of the test sample. The functional mode setups include at least ellispometer, confocal image scanner, photon tunneling scanning microscope and interferometer.
    Type: Application
    Filed: January 20, 2004
    Publication date: July 29, 2004
    Inventors: Chih-Kung Lee, Shuen-Chen Shiue, Shu-Sheng Lee, Jiun-Yan Wu, Chii-Wann Lin, Shiming Lin
  • Patent number: 6688751
    Abstract: A polarization splitting backlight module for efficiently converting a non-polarized light beam emitted from the light source into a single polarization state is disclosed. The polarization splitting backlight module of the present invention comprises an under plate with a ridged lower surface, a light source, a special reflection film, a scattering structure, a substrate and a polarization splitting film. The light beam emitted from the light source is introduced into the scattering structure between the under plate and the substrate. After a series of processes, such as scattering, reflection, phase retardation and polarization beam-splitting, the light beam will pass through the polarization splitting film being of a single polarization state such that it could be utilized by electro-optical systems, such as liquid crystal displays. The present invention converts light beams into a single polarization state, and the efficiency thus is higher than that of a conventional backlight module.
    Type: Grant
    Filed: July 18, 2001
    Date of Patent: February 10, 2004
    Assignee: Slight Opto-Electronics Co., Ltd.
    Inventors: Chih-Kung Lee, Jiun-Yan Wu, Shu-Sheng Lee, Ching-Heng Tang
  • Publication number: 20030169503
    Abstract: A light beam polarization converter for converting non-polarized light beams of an illumination source having a plurality of polarization states into a single polarization state is disclosed. The light beams from the bottom converged by the lower surface of the under plate and further parallelized by the upper surface thereof enter the converter. After a series of optical processes of polarization splitting, reflection or total reflection, and phase retardation within the converter, the light beams will pass through the converter as light beams of a single polarization state.
    Type: Application
    Filed: December 17, 2002
    Publication date: September 11, 2003
    Inventors: Chih-Kung Lee, Chih-Ting Lin, Shu-Sheng Lee, Ching-Heng Tang
  • Patent number: 6590667
    Abstract: A method and apparatus is claimed for measuring the distance between a slider and a transparent disk with sub-nanometer resolution. The flying height is measured by applying ellipsometry. The measurement is done by: providing a sampling light beam with adjustable initial polarization state by phase modulation, and with variable incident angles relative to the air film and reflecting the sampling light off of the specimen at a detection site forming a reflected light beam that is then reflected at the detection site again and then guided to both detectors for detecting the intensity and phase change of the light beam to determine the gap's thickness as well as passing some light to a microscope used for observation of the detecting site on the specimen.
    Type: Grant
    Filed: July 24, 2000
    Date of Patent: July 8, 2003
    Assignee: National Science Council
    Inventors: Jau-Hu Lee, Chih-Kung Lee, Shuen-Chen Shiue, Shu-Sheng Lee, Jiun-Yan Wu
  • Patent number: 6587275
    Abstract: A light beam polarization converter converts non-polarized light beams of an illumination source having a plurality of polarization states into a single polarization state. The light beams from the bottom converged by the lower surface of the under plate and further parallelized by the upper surface thereof enter the converter. After a series of optical processes of polarization splitting, reflection or total reflection, and phase retardation within the converter, the light beams will pass through the converter as light beams of a single polarization state.
    Type: Grant
    Filed: January 19, 2001
    Date of Patent: July 1, 2003
    Assignee: Slight Opto-Electronics Co., Ltd.
    Inventors: Chih-Kung Lee, Chih-Ting Lin, Shu-Sheng Lee, Ching-Heng Tang
  • Publication number: 20030098411
    Abstract: The invention is using the phase information contained in the diffraction light of the grating, to analyze the velocity and the displacement of the object having the grating attached. By using the relative placement of the optical elements, the entire optical scale system has high tolerance to the phase difference that is caused by the grating optical scale and the relative calibration error of the grating optical scale and the laser light head. Due to the light beam is focused on the diffraction grating, the wave-front of the signal light is relatively not impacted by the geometrical characteristics of the diffraction grating, the geometrical characteristics of the diffraction grating includes something like the interval is not even or the surface is bending. The excellent signal visibility can be obtained by applying the linear grating, radial grating, or the cylindrical grating as the grating in the design according to the present invention.
    Type: Application
    Filed: November 27, 2001
    Publication date: May 29, 2003
    Inventors: Chih-Kung Lee, Liang-Bin Yu, Chyan-Chyi Wu, Shu-Sheng Lee, Wen-Jong Wu, Ming-Hua Wen, Zheng-Sheng Pan, Shih-Jui Chen, Yen-Fu Lai, Giin-Yuan Wu
  • Publication number: 20030030817
    Abstract: A multi-functional opto-electronic system is mainly applied to the real-time metrologies of biomedical or biochemical reactions as well as the in-situ manufacturing measurements of biochips. The configuration of this system is built up by integration of at least four different near-field optical metrological principles, which share a part of common optical path design and allow to turn on several functions such as ellipsometer, Laser Doppler vibrometer or interferometer (LDV/I), surface plasmon resonance (SPR) for amplitude and phase detection, phase shifting interference microscope, photon tunneling microscope, optical coherence tomography (OCT) and imaging microscope by switching few components in the system. With the creation of a novel opto-mechanical design and its associated signal processing methodologies, both the signal detection of the biomedical reactions and biomedical imaging concerned for the future trend in the modern biomedical sciences are achieved with high resolutions.
    Type: Application
    Filed: August 10, 2001
    Publication date: February 13, 2003
    Inventors: Chih-Kung Lee, Shuen-Chen Shiue, Shu-Sheng Lee, Jiun-Yan Wu, Chii-Wann Lin, Shiming Lin
  • Publication number: 20020176165
    Abstract: A polarization splitting backlight module for efficiently converting a non-polarized light beam emitted from the light source into a single polarization state is disclosed. The polarization splitting backlight module of the present invention comprises an under plate with a ridged lower surface, a light source, a special reflection film, a scattering structure, a substrate and a polarization splitting film. The light beam emitted from the light source is introduced into the scattering structure between the under plate and the substrate. After a series of processes, such as scattering, reflection, phase retardation and polarization beam-splitting, the light beam will pass through the polarization splitting film being of a single polarization state such that it could be utilized by electro-optical systems, such as liquid crystal displays. The present invention converts light beams into a single polarization state, and the efficiency thus is higher than that of a conventional backlight module.
    Type: Application
    Filed: July 18, 2001
    Publication date: November 28, 2002
    Inventors: Chih-Kung Lee, Jiun-Yan Wu, Shu-Sheng Lee, Ching-Heng Tang
  • Patent number: 6483584
    Abstract: An ellipsometer for measuring the complex refractive index of a sample and thin film thickness according to the invention. The ellipsometer includes a linear polarized light source, a reference analyzer, a polarization analyzer and a light direction controller. The linear polarized light source used to generate a measuring beam for detecting the sample. The phase modulator used to control the phase of the measuring beam thereby to generate a sampling beam. The reference analyzer used to generate a reference beam according to part of the sampling beam thereby to adjust the intensity of the sampling beam. The polarization analyzer used to analyze the phase, polarization and intensity of the sampling beam after the sampling beam is reflected by the sample.
    Type: Grant
    Filed: April 14, 2000
    Date of Patent: November 19, 2002
    Assignee: National Science Council
    Inventors: Solomon J. H. Lee, Chih-Kung Lee, Shu-Sheng Lee, Yang Yun-Chang, Lin Chan-Ching, Shuen-Chen Shiue
  • Publication number: 20020121848
    Abstract: An electro-optical display backlight module for generating a light source of a single polarization state, which reduces the optical loss in light beam output, is suitable for mass production, and decreases manufacturing costs, is disclosed. The backlight module is easily integrated with conventional electro-optical display devices and achieves high-quality polarization splitting through suitable designs.
    Type: Application
    Filed: September 7, 2001
    Publication date: September 5, 2002
    Inventors: Chih-Kung Lee, Yuan-Fuu Huang, Shu-Sheng Lee, Ching-Heng Tang
  • Publication number: 20020105710
    Abstract: A light beam polarization converter for converting non-polarized light beams of an illumination source having a plurality of polarization states into a single polarization state is disclosed. The light beams from the bottom converged by the lower surface of the under plate and further parallelized by the upper surface thereof enter the converter. After a series of optical processes of polarization splitting, reflection or total reflection, and phase retardation within the converter, the light beams will pass through the converter as light beams of a single polarization state.
    Type: Application
    Filed: January 19, 2001
    Publication date: August 8, 2002
    Inventors: Chih-Kung Lee, Chih-Ting Lin, Shu-Sheng Lee, Ching-Heng Tang
  • Patent number: 6288841
    Abstract: An optical path overlapping type incident angle changeable optical mechanism according to the invention allows an incident light beam to be incident onto a measured range of a sample within a large incident angle range. The optical mechanism includes a reflecting prism reflecting the incident light beam to generate a reflected light beam having an angle of 90° with respect to the incident light beam; a concave parabolic cylindric mirror guiding the reflected light beam coming from the reflecting prism to a measured range of a detect-waiting sample to thereby be further reflected to generate a detect-waiting light beam; a concave cylindric mirror used to make the detect-waiting light beam incident onto/reflected by the reflecting prism so as to overlap with the incident light beam; and a light beam splitting means used to separate the detect-waiting light beam from the incident light beam.
    Type: Grant
    Filed: December 30, 1999
    Date of Patent: September 11, 2001
    Assignee: National Science Council
    Inventors: Solomon J. H. Lee, Chih-Kung Lee, Tony C. H. Lin, Shih-Jui Chen, Shu-Sheng Lee, Shuen-Chen Shiue
  • Patent number: 6115126
    Abstract: An optical wavefront analyzer based on the phase-shearing interferometry technique for measuring a wavefront of a light beam is disclosed. The analyzer includes a single phase shifter, a driving device, a pattern receiving device, and a phase reconstructing device. A method of measuring a wavefront of a light beam is also provided for solving the problems of two-axial focusing and phase inconsistency encountered the prior art by employing phase-shearing and phase-shifting techniques to improve the method of optical wavefront mesurement. A non-iterative, path-independent unwrapping methodology is used to deal with a complicated wavefront.
    Type: Grant
    Filed: January 22, 1999
    Date of Patent: September 5, 2000
    Assignee: National Science Council
    Inventors: Yi-Chun Chen, Shu-Sheng Lee, Chung-Min Lee, Ching-Wei Chen, Heui-Yung Chang, Gym-Bin Yeh, Chih-Kung Lee, Shih-Tsong Lin, Chi-Tang Hsieh, Wei-Liang Chen