Patents by Inventor Shugo Akiyama
Shugo Akiyama has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20230296500Abstract: A grain-component sensor comprises a white LED for emitting a white light as a light emission source, a sample holder in which a sample is filled, a spectroscope for receiving a reflected light from the sample and performing a spectroscopic analysis, and as optical filter provided on an optical path between the white LED and the sample holder, the optical filter has an optical characteristic that is a transmittance of substantially 100% in a wavelength band from 950 nm to 1100 nm and cuts a light in a visible light region to substantially 0%, a light emitted from the white LED transmits through the optical filter and is irradiated to the sample as a detection light in a wavelength band from 950 nm to 1100 nm, and a diffused reflected light from the sample is condensed by a condenser lens and is entered the spectroscope.Type: ApplicationFiled: March 13, 2023Publication date: September 21, 2023Inventors: Shun Yamauchi, Shugo Akiyama
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Publication number: 20220132735Abstract: A grain measuring device 10 includes a reaping determination unit 11 in a combine harvester 1 to determine a state of reaping grains; and a measurement unit 12 configured to measure a component of the grains and save a result of measurement when the reaping determination unit 11 determines that the combine harvester 1 is in in the state of reaping the grains.Type: ApplicationFiled: January 24, 2020Publication date: May 5, 2022Applicant: Topcon CorporationInventor: Shugo AKIYAMA
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Publication number: 20220099835Abstract: A scan using a pulsed distance measuring light with two wavelengths of which reflectances are different with respect to a content of a nitrogen by a laser scanner, the two wavelengths are separated, lights are received, a distance measurement value and a light amount are detected for each pulsed distance measuring light and for each of the two wavelengths, a height of a crop is detected based on the distance measurement value, a received light amount ratio of the two wavelengths is detected, and a growth condition of the crop is detected based on the detected height and the received light amount ratio.Type: ApplicationFiled: September 22, 2021Publication date: March 31, 2022Inventor: Shugo Akiyama
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Publication number: 20220057375Abstract: A growth information management apparatus is provided, which can accurately ascertain a growth situation of plants or the like regardless of a positional change of an equipment where the apparatus is mounted. A growth information management apparatus 100 emits a measuring beam to a plant P and acquires growth information on the plant, based on received reflected light, with the growth information management apparatus being mounted on another equipment 1. The growth information is corrected based on change information on the irradiation direction of the measuring beam according to a positional change of the other equipment.Type: ApplicationFiled: December 26, 2019Publication date: February 24, 2022Applicant: Topcon CorporationInventor: Shugo AKIYAMA
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Patent number: 11195016Abstract: A pile head analysis system captures a plurality of images of a construction site including a pile using a camera mounted on an unmanned aerial vehicle (UAV), acquires the images, generates a three-dimensional model of the construction site, detects a pile head from the three-dimensional model, and determines consistency between the detected pile head and preliminarily acquired design information.Type: GrantFiled: September 25, 2018Date of Patent: December 7, 2021Assignee: TOPCON CORPORATIONInventors: Daisuke Sasaki, Koji Onishi, Masaki Takanashi, Kiyoyasu Takahashi, Shugo Akiyama
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Patent number: 11009453Abstract: A spectral curve acquiring device comprising: a light receiving optical system (6) for irradiating an irradiating light, a light receiving optical system (8) for dispersing and receiving a reflected irradiating light reflected by an object to be measured (7), a distance meter (4) for measuring a distance to the object to be measured, a storage module (25) for storing a plurality of reference spectral curves prepared based on a light receiving intensity for each wavelength at the time of measuring a white reference plate with different distances, and a control arithmetic module (24), wherein the control arithmetic module obtains a light receiving intensity of the dispersed reflected irradiating light for each wavelength based on the reference spectral curve corresponding to a distance to be measured, corrects a measurement spectral curve prepared based on the light receiving intensity, and prepares a spectral reflectance curve.Type: GrantFiled: March 24, 2017Date of Patent: May 18, 2021Assignee: TOPCON CorporationInventors: Issei Hanya, Shugo Akiyama, Ryosuke Tomizawa, Naoto Kasori, Yoshimitsu Nakajima, Yuji Shirane, Satoshi Suenaga
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Publication number: 20200300753Abstract: A spectral curve acquiring device comprising: a light receiving optical system (6) for irradiating an irradiating light, a light receiving optical system (8) for dispersing and receiving a reflected irradiating light reflected by an object to be measured (7), a distance meter (4) for measuring a distance to the object to be measured, a storage module (25) for storing a plurality of reference spectral curves prepared based on a light receiving intensity for each wavelength at the time of measuring a white reference plate with different distances, and a control arithmetic module (24), wherein the control arithmetic module obtains a light receiving intensity of the dispersed reflected irradiating light for each wavelength based on the reference spectral curve corresponding to a distance to be measured, corrects a measurement spectral curve prepared based on the light receiving intensity, and prepares a spectral reflectance curve.Type: ApplicationFiled: March 24, 2017Publication date: September 24, 2020Inventors: Issei Hanya, Shugo Akiyama, Ryosuke Tomizawa, Naoto Kasori, Yoshimitsu Nakajima, Yuji Shirane, Satoshi Suenaga
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Patent number: 10690499Abstract: An analysis system for analyzing inclination of column members includes a laser scanner, a server, and an information terminal. The server includes a data acquisition unit configured to acquire three-dimensional point cloud data of the column members generated by the laser scanner, a surface detector configured to detect surfaces of the column members based on the three-dimensional point cloud data, and an inclination analyzer configured to analyze inclination of the column members by calculating inclination of the surfaces detected by the surface detector.Type: GrantFiled: September 24, 2018Date of Patent: June 23, 2020Assignee: TOPCON CORPORATIONInventors: Daisuke Sasaki, Koji Onishi, Masaki Takanashi, Kiyoyasu Takahashi, Shugo Akiyama
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Patent number: 10408678Abstract: To provide a plant sensor device capable of obtaining a parameter to determine a growth status other than a spectroscopy vegetation index without increasing its configuration. The plant sensor device includes a light emission part for emitting a measurement light to irradiate a target plant, a light receiving part for receiving a reflected light from the target plant, and a control section for controlling the light emission part and light receiving part. The control section determines a spectroscopy vegetation index of the target plant by obtaining a reflection rate of the target plant based on the measurement light and reflected light. The control section calculates a distance from the target plant to the light emission part in accordance with the measurement light and reflected light, and determines a plant height of the target plant based on the distance.Type: GrantFiled: April 20, 2016Date of Patent: September 10, 2019Assignee: TOPCON CORPORATIONInventors: Peng Zhao, Shugo Akiyama, Issei Hanya
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Patent number: 10345232Abstract: A method of measuring a state of concrete includes emitting an irradiation light to the concrete, the irradiation light including a wavelength range of near infrared light related to concrete measurement; and receiving a reflection light of the irradiation light P reflected on the concrete. At least five wavelengths ?1 to ?5, ?6 to ?10, different from each other by PLS regression analysis within a wavelength range of 900 nm to 2500 nm of absorption spectrum, are determined, and a degree of neutralization of the concrete caused by calcium hydroxide and a concentration of chloride ion is estimated.Type: GrantFiled: December 21, 2016Date of Patent: July 9, 2019Assignee: TOPCON CORPORATIONInventors: Kaoru Kumagai, Shugo Akiyama, Issei Hanya, Peng Zhao, Masashi Funahashi, Yoshimitsu Nakajima, Yuji Shirane
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Publication number: 20190116725Abstract: A fertilization map creating system includes a growth sensor, a GPS device, and a growth information accumulating part that stores data, a fertilization map being created based on growth data and position data stored in the growth information accumulating part, and the growth information accumulating part storing the position data and the growth data while a tractor drives in a field. The system further includes a growth condition calculation part that obtains a growth condition of previously set each area in the field based on the data stored in the memory; a fertilization amount calculation part that obtains an amount of fertilization of each area based on the growth condition of each area; and a map creating part that creates the fertilization map showing the amount of fertilization of each area obtained by the fertilization calculation part.Type: ApplicationFiled: March 31, 2017Publication date: April 25, 2019Applicant: Topcon CorporationInventors: Issei HANYA, Shinkai SHU, Peng ZHAO, Shugo AKIYAMA, Hiroshi OKAMOTO, Keisuke HARA
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Publication number: 20190102624Abstract: A pile head analysis system captures a plurality of images of a construction site including a pile using a camera mounted on an unmanned aerial vehicle (UAV), acquires the images, generates a three-dimensional model of the construction site, detects a pile head from the three-dimensional model, and determines consistency between the detected pile head and preliminarily acquired design information.Type: ApplicationFiled: September 25, 2018Publication date: April 4, 2019Applicant: TOPCON CORPORATIONInventors: Daisuke SASAKI, Koji ONISHI, Masaki TAKANASHI, Kiyoyasu TAKAHASHI, Shugo AKIYAMA
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Publication number: 20190101390Abstract: An analysis system for analyzing inclination of column members includes a laser scanner, a server, and an information terminal. The server includes a data acquisition unit configured to acquire three-dimensional point cloud data of the column members generated by the laser scanner, a surface detector configured to detect surfaces of the column members based on the three-dimensional point cloud data, and an inclination analyzer configured to analyze inclination of the column members by calculating inclination of the surfaces detected by the surface detector.Type: ApplicationFiled: September 24, 2018Publication date: April 4, 2019Applicant: TOPCON CORPORATIONInventors: Daisuke SASAKI, Koji ONISHI, Masaki TAKANASHI, Kiyoyasu TAKAHASHI, Shugo AKIYAMA
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Publication number: 20190017929Abstract: To provide a method of measuring a state of concrete capable of easily determining or measuring deterioration of the concrete without using a spectroscopy while maintaining the estimation accuracy. The method of the present disclosure emits an irradiation light to the concrete, the irradiation light including a wavelength range of near infrared light related to concrete measurement; and receives a reflection light of the irradiation light P reflected on the concrete. The method determines at least five wavelengths ?1 to ?5, ?6 to ?10, different from each other by PLS regression analysis within a wavelength range of 900 nm to 2500 nm of absorption spectrum, and estimates a degree of neutralization of the concrete caused by calcium hydroxide and a concentration of chloride ion.Type: ApplicationFiled: December 21, 2016Publication date: January 17, 2019Inventors: Kaoru KUMAGAI, Shugo AKIYAMA, Issei HANYA, Peng ZHAO, Masashi FUNAHASHI, Yoshimitsu NAKAJIMA, Yuji SHIRANE
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Publication number: 20180299327Abstract: To provide a plant sensor device capable of obtaining a parameter to determine a growth status other than a spectroscopy vegetation index without increasing its configuration. The plant sensor device includes a light emission part for emitting a measurement light to irradiate a target plant, a light receiving part for receiving a reflected light from the target plant, and a control section for controlling the light emission part and light receiving part. The control section determines a spectroscopy vegetation index of the target plant by obtaining a reflection rate of the target plant based on the measurement light and reflected light. The control section calculates a distance from the target plant to the light emission part in accordance with the measurement light and reflected light, and determines a plant height of the target plant based on the distance.Type: ApplicationFiled: April 20, 2016Publication date: October 18, 2018Inventors: Peng ZHAO, Shugo AKIYAMA, Issei HANYA
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Publication number: 20180292312Abstract: A plant wavelength sensor device includes a light emission portion for emitting a measurement light P to irradiate a target plant, a light receiving portion for receiving the measurement light reflected on the target plant as a reflected light; and a control section for controlling the light emission portion and the light receiving portion. The control section is configured to emit the measurement light having a wavelength range corresponding to a selected growth parameter from the light emission portion, to receive the reflected light from the target plant with the light receiving portion with respect to the measurement light having the wavelength range corresponding to the selected growth parameter, and to calculate a volume of the reflected light from the target plant as a reflected light volume with respect to the wavelength range corresponding to the growth parameter.Type: ApplicationFiled: April 20, 2016Publication date: October 11, 2018Inventors: Shugo AKIYAMA, Peng ZHAO, Issei HANYA
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Patent number: 9816921Abstract: A material analytical sensor includes an emitter that irradiates a material with irradiation light including a wavelength region related to estimation of an amount of a component of the material, a controller that controls an irradiation cycle of the irradiation light, a receiver that receives reflected light from the material to output as a pulse signal and receives disturbance light to output as a noise signal, an integrator that samples N pulse signals during a predetermined period and integrates the sampled N pulse signals to obtain a first integrated value, and samples N noise signals during a same period as the predetermined period with a same cycle as the irradiation cycle and integrates the sampled N noise signals to obtain a second integrated value, and an extractor that deducts the second integrated value from the first integrated value to extract an amount of the reflected light.Type: GrantFiled: December 15, 2015Date of Patent: November 14, 2017Assignee: Kabushiki Kaisha TOPCONInventors: Kaoru Kumagai, Shugo Akiyama
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Publication number: 20160169795Abstract: A material analytical sensor includes an emitter that irradiates a material with irradiation light including a wavelength region related to estimation of an amount of a component of the material, a controller that controls an irradiation cycle of the irradiation light, a receiver that receives reflected light from the material to output as a pulse signal and receives disturbance light to output as a noise signal, an integrator that samples N pulse signals during a predetermined period and integrates the sampled N pulse signals to obtain a first integrated value, and samples N noise signals during a same period as the predetermined period with a same cycle as the irradiation cycle and integrates the sampled N noise signals to obtain a second integrated value, and an extractor that deducts the second integrated value from the first integrated value to extract an amount of the reflected light.Type: ApplicationFiled: December 15, 2015Publication date: June 16, 2016Applicant: Kabushiki Kaisha TOPCONInventors: Kaoru Kumagai, Shugo Akiyama
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Patent number: 7910876Abstract: A plant sensor includes a light source section having first and second light emitters configured to irradiate first and second measuring light toward an object to be measured, respectively, and a light receiver configured to receive reflected light from the object to be measured, and output light-receiving signals.Type: GrantFiled: August 25, 2009Date of Patent: March 22, 2011Assignee: Kabushiki Kaisha TopconInventors: Kaoru Kumagai, Shugo Akiyama
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Publication number: 20100053628Abstract: A plant sensor includes a light source section having first and second light emitters configured to irradiate the first and second measuring light toward the object to be measured, respectively, and a light receiver configured to receive reflected light from the object to be measured, and output light-receiving signals, a controller configured to control emission of the first and second light emitters at a different timing, an integrator configured to integrate the light-receiving signals, and output an integration signal, and a calculator configured to calculate, according to the integration signal, a reflection rate as a ratio of light volume of the reflected light of the first measuring light from the object to be measured to light volume of the first measuring light, a reflection rate as a ratio of light volume of the reflected light of the second measuring light from the object to be measured to light volume of the second measuring light, and obtains information regarding a growing condition of the objecType: ApplicationFiled: August 25, 2009Publication date: March 4, 2010Inventors: Kaoru Kumagai, Shugo Akiyama