Patents by Inventor Shugo Akiyama

Shugo Akiyama has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20200300753
    Abstract: A spectral curve acquiring device comprising: a light receiving optical system (6) for irradiating an irradiating light, a light receiving optical system (8) for dispersing and receiving a reflected irradiating light reflected by an object to be measured (7), a distance meter (4) for measuring a distance to the object to be measured, a storage module (25) for storing a plurality of reference spectral curves prepared based on a light receiving intensity for each wavelength at the time of measuring a white reference plate with different distances, and a control arithmetic module (24), wherein the control arithmetic module obtains a light receiving intensity of the dispersed reflected irradiating light for each wavelength based on the reference spectral curve corresponding to a distance to be measured, corrects a measurement spectral curve prepared based on the light receiving intensity, and prepares a spectral reflectance curve.
    Type: Application
    Filed: March 24, 2017
    Publication date: September 24, 2020
    Inventors: Issei Hanya, Shugo Akiyama, Ryosuke Tomizawa, Naoto Kasori, Yoshimitsu Nakajima, Yuji Shirane, Satoshi Suenaga
  • Patent number: 10690499
    Abstract: An analysis system for analyzing inclination of column members includes a laser scanner, a server, and an information terminal. The server includes a data acquisition unit configured to acquire three-dimensional point cloud data of the column members generated by the laser scanner, a surface detector configured to detect surfaces of the column members based on the three-dimensional point cloud data, and an inclination analyzer configured to analyze inclination of the column members by calculating inclination of the surfaces detected by the surface detector.
    Type: Grant
    Filed: September 24, 2018
    Date of Patent: June 23, 2020
    Assignee: TOPCON CORPORATION
    Inventors: Daisuke Sasaki, Koji Onishi, Masaki Takanashi, Kiyoyasu Takahashi, Shugo Akiyama
  • Patent number: 10408678
    Abstract: To provide a plant sensor device capable of obtaining a parameter to determine a growth status other than a spectroscopy vegetation index without increasing its configuration. The plant sensor device includes a light emission part for emitting a measurement light to irradiate a target plant, a light receiving part for receiving a reflected light from the target plant, and a control section for controlling the light emission part and light receiving part. The control section determines a spectroscopy vegetation index of the target plant by obtaining a reflection rate of the target plant based on the measurement light and reflected light. The control section calculates a distance from the target plant to the light emission part in accordance with the measurement light and reflected light, and determines a plant height of the target plant based on the distance.
    Type: Grant
    Filed: April 20, 2016
    Date of Patent: September 10, 2019
    Assignee: TOPCON CORPORATION
    Inventors: Peng Zhao, Shugo Akiyama, Issei Hanya
  • Patent number: 10345232
    Abstract: A method of measuring a state of concrete includes emitting an irradiation light to the concrete, the irradiation light including a wavelength range of near infrared light related to concrete measurement; and receiving a reflection light of the irradiation light P reflected on the concrete. At least five wavelengths ?1 to ?5, ?6 to ?10, different from each other by PLS regression analysis within a wavelength range of 900 nm to 2500 nm of absorption spectrum, are determined, and a degree of neutralization of the concrete caused by calcium hydroxide and a concentration of chloride ion is estimated.
    Type: Grant
    Filed: December 21, 2016
    Date of Patent: July 9, 2019
    Assignee: TOPCON CORPORATION
    Inventors: Kaoru Kumagai, Shugo Akiyama, Issei Hanya, Peng Zhao, Masashi Funahashi, Yoshimitsu Nakajima, Yuji Shirane
  • Publication number: 20190116725
    Abstract: A fertilization map creating system includes a growth sensor, a GPS device, and a growth information accumulating part that stores data, a fertilization map being created based on growth data and position data stored in the growth information accumulating part, and the growth information accumulating part storing the position data and the growth data while a tractor drives in a field. The system further includes a growth condition calculation part that obtains a growth condition of previously set each area in the field based on the data stored in the memory; a fertilization amount calculation part that obtains an amount of fertilization of each area based on the growth condition of each area; and a map creating part that creates the fertilization map showing the amount of fertilization of each area obtained by the fertilization calculation part.
    Type: Application
    Filed: March 31, 2017
    Publication date: April 25, 2019
    Applicant: Topcon Corporation
    Inventors: Issei HANYA, Shinkai SHU, Peng ZHAO, Shugo AKIYAMA, Hiroshi OKAMOTO, Keisuke HARA
  • Publication number: 20190101390
    Abstract: An analysis system for analyzing inclination of column members includes a laser scanner, a server, and an information terminal. The server includes a data acquisition unit configured to acquire three-dimensional point cloud data of the column members generated by the laser scanner, a surface detector configured to detect surfaces of the column members based on the three-dimensional point cloud data, and an inclination analyzer configured to analyze inclination of the column members by calculating inclination of the surfaces detected by the surface detector.
    Type: Application
    Filed: September 24, 2018
    Publication date: April 4, 2019
    Applicant: TOPCON CORPORATION
    Inventors: Daisuke SASAKI, Koji ONISHI, Masaki TAKANASHI, Kiyoyasu TAKAHASHI, Shugo AKIYAMA
  • Publication number: 20190102624
    Abstract: A pile head analysis system captures a plurality of images of a construction site including a pile using a camera mounted on an unmanned aerial vehicle (UAV), acquires the images, generates a three-dimensional model of the construction site, detects a pile head from the three-dimensional model, and determines consistency between the detected pile head and preliminarily acquired design information.
    Type: Application
    Filed: September 25, 2018
    Publication date: April 4, 2019
    Applicant: TOPCON CORPORATION
    Inventors: Daisuke SASAKI, Koji ONISHI, Masaki TAKANASHI, Kiyoyasu TAKAHASHI, Shugo AKIYAMA
  • Publication number: 20190017929
    Abstract: To provide a method of measuring a state of concrete capable of easily determining or measuring deterioration of the concrete without using a spectroscopy while maintaining the estimation accuracy. The method of the present disclosure emits an irradiation light to the concrete, the irradiation light including a wavelength range of near infrared light related to concrete measurement; and receives a reflection light of the irradiation light P reflected on the concrete. The method determines at least five wavelengths ?1 to ?5, ?6 to ?10, different from each other by PLS regression analysis within a wavelength range of 900 nm to 2500 nm of absorption spectrum, and estimates a degree of neutralization of the concrete caused by calcium hydroxide and a concentration of chloride ion.
    Type: Application
    Filed: December 21, 2016
    Publication date: January 17, 2019
    Inventors: Kaoru KUMAGAI, Shugo AKIYAMA, Issei HANYA, Peng ZHAO, Masashi FUNAHASHI, Yoshimitsu NAKAJIMA, Yuji SHIRANE
  • Publication number: 20180299327
    Abstract: To provide a plant sensor device capable of obtaining a parameter to determine a growth status other than a spectroscopy vegetation index without increasing its configuration. The plant sensor device includes a light emission part for emitting a measurement light to irradiate a target plant, a light receiving part for receiving a reflected light from the target plant, and a control section for controlling the light emission part and light receiving part. The control section determines a spectroscopy vegetation index of the target plant by obtaining a reflection rate of the target plant based on the measurement light and reflected light. The control section calculates a distance from the target plant to the light emission part in accordance with the measurement light and reflected light, and determines a plant height of the target plant based on the distance.
    Type: Application
    Filed: April 20, 2016
    Publication date: October 18, 2018
    Inventors: Peng ZHAO, Shugo AKIYAMA, Issei HANYA
  • Publication number: 20180292312
    Abstract: A plant wavelength sensor device includes a light emission portion for emitting a measurement light P to irradiate a target plant, a light receiving portion for receiving the measurement light reflected on the target plant as a reflected light; and a control section for controlling the light emission portion and the light receiving portion. The control section is configured to emit the measurement light having a wavelength range corresponding to a selected growth parameter from the light emission portion, to receive the reflected light from the target plant with the light receiving portion with respect to the measurement light having the wavelength range corresponding to the selected growth parameter, and to calculate a volume of the reflected light from the target plant as a reflected light volume with respect to the wavelength range corresponding to the growth parameter.
    Type: Application
    Filed: April 20, 2016
    Publication date: October 11, 2018
    Inventors: Shugo AKIYAMA, Peng ZHAO, Issei HANYA
  • Patent number: 9816921
    Abstract: A material analytical sensor includes an emitter that irradiates a material with irradiation light including a wavelength region related to estimation of an amount of a component of the material, a controller that controls an irradiation cycle of the irradiation light, a receiver that receives reflected light from the material to output as a pulse signal and receives disturbance light to output as a noise signal, an integrator that samples N pulse signals during a predetermined period and integrates the sampled N pulse signals to obtain a first integrated value, and samples N noise signals during a same period as the predetermined period with a same cycle as the irradiation cycle and integrates the sampled N noise signals to obtain a second integrated value, and an extractor that deducts the second integrated value from the first integrated value to extract an amount of the reflected light.
    Type: Grant
    Filed: December 15, 2015
    Date of Patent: November 14, 2017
    Assignee: Kabushiki Kaisha TOPCON
    Inventors: Kaoru Kumagai, Shugo Akiyama
  • Publication number: 20160169795
    Abstract: A material analytical sensor includes an emitter that irradiates a material with irradiation light including a wavelength region related to estimation of an amount of a component of the material, a controller that controls an irradiation cycle of the irradiation light, a receiver that receives reflected light from the material to output as a pulse signal and receives disturbance light to output as a noise signal, an integrator that samples N pulse signals during a predetermined period and integrates the sampled N pulse signals to obtain a first integrated value, and samples N noise signals during a same period as the predetermined period with a same cycle as the irradiation cycle and integrates the sampled N noise signals to obtain a second integrated value, and an extractor that deducts the second integrated value from the first integrated value to extract an amount of the reflected light.
    Type: Application
    Filed: December 15, 2015
    Publication date: June 16, 2016
    Applicant: Kabushiki Kaisha TOPCON
    Inventors: Kaoru Kumagai, Shugo Akiyama
  • Patent number: 7910876
    Abstract: A plant sensor includes a light source section having first and second light emitters configured to irradiate first and second measuring light toward an object to be measured, respectively, and a light receiver configured to receive reflected light from the object to be measured, and output light-receiving signals.
    Type: Grant
    Filed: August 25, 2009
    Date of Patent: March 22, 2011
    Assignee: Kabushiki Kaisha Topcon
    Inventors: Kaoru Kumagai, Shugo Akiyama
  • Publication number: 20100053628
    Abstract: A plant sensor includes a light source section having first and second light emitters configured to irradiate the first and second measuring light toward the object to be measured, respectively, and a light receiver configured to receive reflected light from the object to be measured, and output light-receiving signals, a controller configured to control emission of the first and second light emitters at a different timing, an integrator configured to integrate the light-receiving signals, and output an integration signal, and a calculator configured to calculate, according to the integration signal, a reflection rate as a ratio of light volume of the reflected light of the first measuring light from the object to be measured to light volume of the first measuring light, a reflection rate as a ratio of light volume of the reflected light of the second measuring light from the object to be measured to light volume of the second measuring light, and obtains information regarding a growing condition of the objec
    Type: Application
    Filed: August 25, 2009
    Publication date: March 4, 2010
    Inventors: Kaoru Kumagai, Shugo Akiyama