Patents by Inventor Shuji Kaneto
Shuji Kaneto has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 7599052Abstract: A defect marking device includes a flaw inspection device which has a plurality of light-receiving parts that identify reflected lights coming from an inspection plane of a metal strip under two or more of optical conditions different from each other; a signal processing section that judges the presence/absence of surface flaw on the inspection plane based on a combination of reflected light components identified under these optical conditions different from each other; and a marking device which applies marking that indicates information relating to the flaw on the surface of the metal strip.Type: GrantFiled: August 13, 2008Date of Patent: October 6, 2009Assignee: NKK CorporationInventors: Mitsuaki Uesugi, Shoji Yoshikawa, Masaichi Inomata, Tsutomu Kawamura, Takahiko Oshige, Hiroyuki Sugiura, Akira Kazama, Tsuneo Suyama, Yasuo Kushida, Shuichi Harada, Hajime Tanaka, Osamu Uehara, Shuji Kaneto, Masahiro Iwabuchi, Kozo Harada, Shinichi Tomonaga, Shigemi Fukuda
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Publication number: 20090086209Abstract: A defect marking device includes a flaw inspection device which has a plurality of light-receiving parts that identify reflected lights coming from an inspection plane of a metal strip under two or more of optical conditions different from each other; a signal processing section that judges the presence/absence of surface flaw on the inspection plane based on a combination of reflected light components identified under these optical conditions different from each other; and a marking device which applies marking that indicates information relating to the flaw on the surface of the metal strip.Type: ApplicationFiled: August 13, 2008Publication date: April 2, 2009Applicant: NKK CorporationInventors: Mitsuaki Uesugi, Shoji Yoshikawa, Masaichi Inomata, Tsutomu Kawamura, Takahiko Oshige, Hiroyuki Sugiura, Akira Kazama, Tsuneo Suyama, Yasuo Kushida, Shuichi Harada, Hajime Tanaka, Osamu Uehara, Shuji Kaneto, Masahiro Iwabuchi, Kozo Harada, Shinichi Tomonaga, Shigemi Fukuda
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Patent number: 7423744Abstract: A defect marking device includes a flaw inspection device which has a plurality of light-receiving parts that identify reflected lights coming from an inspection plane of a metal strip under two or more of optical conditions different from each other; a signal processing section that judges the presence/absence of surface flaw on the inspection plane based on a combination of reflected light components identified under these optical conditions different from each other; and a marking device which applies marking that indicates information relating to the flaw on the surface of the metal strip.Type: GrantFiled: October 24, 2006Date of Patent: September 9, 2008Assignee: NKK CorporationInventors: Mitsuaki Uesugi, Shoji Yoshikawa, Masaichi Inomata, Tsutomu Kawamura, Takahiko Oshige, Hiroyuki Sugiura, Akira Kazama, Tsuneo Suyama, Yasuo Kushida, Shuichi Harada, Hajime Tanaka, Osamu Uehara, Shuji Kaneto, Masahiro Iwabuchi, Kozo Harada, Shinichi Tomonaga, Shigemi Fukuda
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Patent number: 7248366Abstract: The defect marking method comprises the steps of: installing a surface defect tester to detect surface flaw and a marker device to apply marking at defect position, in a continuous processing line of steel sheet; detecting the surface flaw on the steel sheet using the surface defect tester; determining defect name, defect grade, defect length, and defect position in the width direction of the steel sheet, on the basis of thus detected flaw information, further identifying the defect in terms of harmful defect, injudgicable defect, and harmless defect; applying tracking of the defect position for each of the harmful defect and the injudgicable defect; and applying marking to the defect position. The defect marking device comprises a defect inspection means having plurality of light-receiving parts and a signal processing section, and a marking means.Type: GrantFiled: September 17, 2001Date of Patent: July 24, 2007Assignee: NKK CorporationInventors: Mitsuaki Uesugi, Shoji Yoshikawa, Masaichi Inomata, Tsutomu Kawamura, Takahiko Oshige, Hiroyuki Sugiura, Akira Kazama, Tsuneo Suyama, Yasuo Kushida, Shuichi Harada, Hajime Tanaka, Osamu Uehara, Shuji Kaneto, Masahiro Iwabuchi, Kozo Harada, Shinichi Tomonaga, Shigemi Fukuda
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Publication number: 20070052964Abstract: A defect marking device includes a flaw inspection device which has a plurality of light-receiving parts that identify reflected lights coming from an inspection plane of a metal strip under two or more of optical conditions different from each other; a signal processing section that judges the presence/absence of surface flaw on the inspection plane based on a combination of reflected light components identified under these optical conditions different from each other; and a marking device which applies marking that indicates information relating to the flaw on the surface of the metal strip.Type: ApplicationFiled: October 24, 2006Publication date: March 8, 2007Applicant: NKK CorporationInventors: Mitsuaki Uesugi, Shoji Yoshikawa, Masaichi Inomata, Tsutomu Kawamura, Takahiko Oshige, Hiroyuki Sugiura, Akira Kazama, Tsuneo Suyama, Yasuo Kushida, Shuichi Harada, Hajime Tanaka, Osamu Uehara, Shuji Kaneto, Masahiro Iwabuchi, Kozo Harada, Shinichi Tomonaga, Shigemi Fukuda
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Publication number: 20020154308Abstract: The defect marking method comprises the steps of: installing a surface defect tester to detect surface flaw and a marker device to apply marking at defect position, in a continuous processing line of steel sheet; detecting the surface flaw on the steel sheet using the surface defect tester; determining defect name, defect grade, defect length, and defect position in the width direction of the steel sheet, on the basis of thus detected flaw information, further identifying the defect in terms of harmful defect, injudgicable defect, and harmless defect; applying tracking of the defect position for each of the harmful defect and the injudgicable defect; and applying marking to the defect position. The defect marking device comprises a defect inspection means having plurality of light-receiving parts and a signal processing section, and a marking means.Type: ApplicationFiled: September 17, 2001Publication date: October 24, 2002Applicant: NKK Corporation, a Japanese CorporationInventors: Mitsuaki Uesugi, Shoji Yoshikawa, Masaichi Inomata, Tsutomu Kawamura, Takahiko Oshige, Hiroyuki Sugiura, Akira Kazama, Tsuneo Suyama, Yasuo Kushida, Shuichi Harada, Hajime Tanaka, Osamu Uehara, Shuji Kaneto, Masahiro Iwabuchi, Kozo Harada, Shinichi Tomonaga, Shigemi Fukuda
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Patent number: 5081857Abstract: A method for cold rolling a strip is wherein brushing roll are provided to both the work rolls and the back up rolls of the temper mill, to remove particles from the surface of the rolls of the mill and suction ducts adjacent to the brushing rolls transport the foreign objects out of the mill system. The sucking speed at the duct is at least 5 m/sec., and preferably 8 m/sec. The length of the bristle is from 15 to 60 mm, the diameter thereof being from 0.15 mm to 1.0 mm, and the material thereof is selected from a group of nylon, propyrene, or a the mixture thereof. The density of the bristle with respect to the peripheral surface area of the brushing rolls for the work roll is from 55 to 85% by area. Abrasive grains with a grain size of #300 to #1200 are incorporated in the brush of said brushing roll which enhance the brushing ability.Type: GrantFiled: March 5, 1990Date of Patent: January 21, 1992Assignee: NKK CorporationInventors: Naoki Matsui, Shuichi Iwato, Shuji Kaneto, Takami Kubo, Masayuki Yamazaki, Shigeru Moriyama
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Patent number: 4760995Abstract: This invention relates to a continuously treating line for a steel band, having a heating furnace by directly flaming. For heating the steel band with causing reduction, the heating furnace of directly flaming system is provided with a plurality of heating burners of reduction system which may form non-equilibrium range of the air and the fuel in a flame, that is, a reduction range, wherein the heating burners are positioned at predetermined arrangement with respect to the steel band and at a certain pitch predetermined in relation with an inner diameter of the burner in a line running direction.The treating line has said heating furnace constructed as mentioned above and a subsequent atmosphere furnace, and said atmosphere furnace may be provided with a sealing chamber having various means for avoiding invasion of the outer air.Type: GrantFiled: March 2, 1987Date of Patent: August 2, 1988Assignee: Nippon Kokan Kabushiki KaishaInventors: Shuzo Fukuda, Masahiro Abe, Shiro Fukunaka, Michio Nakayama, Shuji Kaneto, Masayuki Yamazaki, Kouichiro Arima