Patents by Inventor Si-Zhao J. Qin

Si-Zhao J. Qin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10876867
    Abstract: Methods and systems for detecting a fault in a data set from an industrial process are disclosed. One method includes forming a first data matrix at a data processing framework from time-series training data, and performing a principal component pursuit on the first data matrix to form an uncorrupted, unscaled matrix and a sparse matrix in the memory, and scaling the uncorrupted, unscaled matrix to form an uncorrupted scaled matrix. The method also includes performing a dynamic principal component analysis (DPCA) on the uncorrupted scaled matrix to form a DPCA model, and determining a squared prediction error from the DPCA model. Based on the squared prediction error, faults are detected in a different data set from operation of the industrial process. At least one of (1) correcting the one or more faults in the different data set or (2) performing a repair operation on a sensor is performed.
    Type: Grant
    Filed: November 13, 2017
    Date of Patent: December 29, 2020
    Assignees: Chevron U.S.A. Inc., University of Southern California
    Inventors: Alisha Deshpande, Si-Zhao J. Qin, Lisa Ann Brenskelle
  • Publication number: 20180136019
    Abstract: Methods and systems for detecting a fault in a data set from an industrial process are disclosed. One method includes forming a first data matrix at a data processing framework from time-series training data, and performing a principal component pursuit on the first data matrix to form an uncorrupted, unscaled matrix and a sparse matrix in the memory, and scaling the uncorrupted, unscaled matrix to form an uncorrupted scaled matrix. The method also includes performing a dynamic principal component analysis (DPCA) on the uncorrupted scaled matrix to form a DPCA model, and determining a squared prediction error from the DPCA model. Based on the squared prediction error, faults are detected in a different data set from operation of the industrial process. At least one of (1) correcting the one or more faults in the different data set or (2) performing a repair operation on a sensor is performed.
    Type: Application
    Filed: November 13, 2017
    Publication date: May 17, 2018
    Applicants: Chevron U.S.A. Inc., University of Southern California
    Inventors: ALISHA DESHPANDE, SI-ZHAO J. QIN, LISA ANN BRENSKELLE
  • Patent number: 7424392
    Abstract: A method and an apparatus are provided for applying a self-adaptive filter to a drifting process. The method includes processing a workpiece, measuring an output characteristic of the processed workpiece and modifying a previous estimated process state based at least on the measured output characteristic. The method further includes estimating a next process state based at least on the modified previous estimated process state.
    Type: Grant
    Filed: December 18, 2002
    Date of Patent: September 9, 2008
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Jin Wang, Robert J. Chong, Christopher A. Bode, Si-Zhao J. Qin, Alexander J. Pasadyn
  • Patent number: 6268270
    Abstract: Methods of optimizing a preheat recipe for rapid thermal processing workpieces are provided. In one aspect, a method of manufacturing is provided that includes preheating a rapid thermal processing chamber according to a preheating recipe and processing a first plurality of workpieces in the rapid thermal processing chamber. Parameter measurements are performed on a first workpiece and a second workpiece of the first plurality of workpieces. The parameter measurements are indicative of processing differences between the first and second workpieces. An output signal is formed corresponding to the parameter measurements and a control signal based on the output signal is used to adjust the preheating recipe for preheating the rapid thermal processing chamber for processing a second plurality of workpieces in the rapid thermal processing chamber to reduce processing differences between first and second workpieces of the second plurality of workpieces.
    Type: Grant
    Filed: October 29, 1999
    Date of Patent: July 31, 2001
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Glen W. Scheid, Terrence J. Riley, Qingsu Wang, Michael Miller, Si-Zhao J. Qin