Patents by Inventor Stephen Jeffrey Gross

Stephen Jeffrey Gross has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8103938
    Abstract: The quality of data stored in a memory system is assessed by different methods, and the memory system is operated according to the assessed quality. The data quality can be assessed during read operations. Subsequent use of an Error Correction Code can utilize the quality indications to detect and reconstruct the data with improved effectiveness. Alternatively, a statistics of data quality can be constructed and digital data values can be associated in a modified manner to prevent data corruption. In both cases the corrective actions can be implemented specifically on the poor quality data, according to suitably chosen schedules, and with improved effectiveness because of the knowledge provided by the quality indications. These methods can be especially useful in high-density memory systems constructed of multi-level storage memory cells.
    Type: Grant
    Filed: March 4, 2008
    Date of Patent: January 24, 2012
    Assignee: SanDisk Technologies Inc.
    Inventors: Daniel C. Guterman, Stephen Jeffrey Gross, Geoffrey S. Gongwer
  • Publication number: 20080155380
    Abstract: The quality of data stored in a memory system is assessed by different methods, and the memory system is operated according to the assessed quality. The data quality can be assessed during read operations. Subsequent use of an Error Correction Code can utilize the quality indications to detect and reconstruct the data with improved effectiveness. Alternatively, a statistics of data quality can be constructed and digital data values can be associated in a modified manner to prevent data corruption. In both cases the corrective actions can be implemented specifically on the poor quality data, according to suitably chosen schedules, and with improved effectiveness because of the knowledge provided by the quality indications. These methods can be especially useful in high-density memory systems constructed of multi-level storage memory cells.
    Type: Application
    Filed: March 4, 2008
    Publication date: June 26, 2008
    Inventors: Daniel C. Guterman, Stephen Jeffrey Gross, Geoffrey S. Gongwer
  • Patent number: 7360136
    Abstract: The quality of data stored in a memory system is assessed by different methods, and the memory system is operated according to the assessed quality. The data quality can be assessed during read operations. Subsequent use of an Error Correction Code can utilize the quality indications to detect and reconstruct the data with improved effectiveness. Alternatively, a statistics of data quality can be constructed and digital data values can be associated in a modified manner to prevent data corruption. In both cases the corrective actions can be implemented specifically on the poor quality data, according to suitably chosen schedules, and with improved effectiveness because of the knowledge provided by the qualify indications. These methods can be especially useful in high-density memory systems constructed of multi-level storage memory cells.
    Type: Grant
    Filed: June 10, 2004
    Date of Patent: April 15, 2008
    Assignee: Sandisk Corporation
    Inventors: Daniel C. Guterman, Stephen Jeffrey Gross, Geoffrey S. Gongwer
  • Publication number: 20040225947
    Abstract: The quality of data stored in a memory system is assessed by different methods, and the memory system is operated according to the assessed quality. The data quality can be assessed during read operations. Subsequent use of an Error Correction Code can utilize the quality indications to detect and reconstruct the data with improved effectiveness. Alternatively, a statistics of data quality can be constructed and digital data values can be associated in a modified manner to prevent data corruption. In both cases the corrective actions can be implemented specifically on the poor quality data, according to suitably chosen schedules, and with improved effectiveness because of the knowledge provided by the qualify indications. These methods can be especially useful in high-density memory systems constructed of multi-level storage memory cells.
    Type: Application
    Filed: June 10, 2004
    Publication date: November 11, 2004
    Inventors: Daniel C. Guterman, Stephen Jeffrey Gross, Geoffrey S. Gongwer
  • Patent number: 6751766
    Abstract: The quality of data stored in a memory system is assessed by different methods, and the memory system is operated according to the assessed quality. The data quality can be assessed during read operations. Subsequent use of an Error Correction Code can utilize the quality indications to detect and reconstruct the data with improved effectiveness. Alternatively, a statistics of data quality can be constructed and digital data values can be associated in a modified manner to prevent data corruption. In both cases the corrective actions can be implemented specifically on the poor quality data, according to suitably chosen schedules, and with improved effectiveness because of the knowledge provided by the quality indications. These methods can be especially useful in high-density memory systems constructed of multi-level storage memory cells.
    Type: Grant
    Filed: May 20, 2002
    Date of Patent: June 15, 2004
    Assignee: SanDisk Corporation
    Inventors: Daniel C. Guterman, Stephen Jeffrey Gross, Geoffrey S. Gongwer
  • Publication number: 20030217323
    Abstract: The quality of data stored in a memory system is assessed by different methods, and the memory system is operated according to the assessed quality. The data quality can be assessed during read operations. Subsequent use of an Error Correction Code can utilize the quality indications to detect and reconstruct the data with improved effectiveness. Alternatively, a statistics of data quality can be constructed and digital data values can be associated in a modified manner to prevent data corruption. In both cases the corrective actions can be implemented specifically on the poor quality data, according to suitably chosen schedules, and with improved effectiveness because of the knowledge provided by the quality indications. These methods can be especially useful in high-density memory systems constructed of multi-level storage memory cells.
    Type: Application
    Filed: May 20, 2002
    Publication date: November 20, 2003
    Applicant: SanDisk Corporation
    Inventors: Daniel C. Guterman, Stephen Jeffrey Gross, Geoffrey S. Gongwer