Patents by Inventor Steven Robert Hayashi
Steven Robert Hayashi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20130026380Abstract: Radiations detectors with angled walls and methods of fabrication are provided. One radiation detector module includes a plurality of sensor tiles configured to detect radiation. The plurality of sensor tiles have (i) top and bottom edges defining top and bottom surfaces of the plurality of sensor tiles, (ii) sidewall edges defining sides of the plurality of sensor tiles, and (iii) corners defined by the top and bottom edges and the sidewall edges. The radiation detector module also has at least one beveled surface having an oblique angle, wherein the beveled surface includes beveling of at least one of top or bottom edges, the side wall edges, or the corners.Type: ApplicationFiled: July 26, 2011Publication date: January 31, 2013Applicant: General Electric CompanyInventors: John Eric Tkaczyk, Steven Robert Hayashi, Haochuan Jiang, Wenwu Zhang, Kristian William Andreini, Nitin Garg, Tan Zhang
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Publication number: 20120285820Abstract: A machining system is provided and includes a machining tool comprising a spindle, one or more electrodes configured to perform the electromachining, and one or more tool holding elements configure to conductively hold the respective one or more electrodes and be assembled onto the spindle of the machining tool. The machining system further comprises one or more adapters and one or more power sources configured to electrically connect to the respective one or more adapters and the workpiece. The one or more adapters are configured to conductively contact the respective one or more tool holding elements. Further, the machining system comprises one or more machining solution sources provided to pass one or more machining solutions between the workpiece and the respective one or more electrodes. A tool adapter assembly is also presented.Type: ApplicationFiled: January 20, 2011Publication date: November 15, 2012Inventors: Hongtao Li, Bin Wei, Xiaobin Chen, Steven Robert Hayashi, Renwei Yuan, Yuanfeng Luo
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Publication number: 20120147383Abstract: A measurement system comprising a light source unit, a projection unit and an optics unit is disclosed. The light source unit is configured to generate a plurality of modulated phase shifted light beams. The projection unit is configured to reflect the modulated phase shifted light beams onto an object surface. The optics unit is configured to capture the modulated phase shifted light beams from the object surface. The measurement system further comprises a photodetector and a processor. The photodetector is configured to receive the modulated phase shifted light beams from the optics unit to generate electrical signals. The processor is configured to retrieve position information of the object surface based on the electrical signals from the photodetector. A measurement method is also presented.Type: ApplicationFiled: December 6, 2011Publication date: June 14, 2012Inventors: Li TAO, Guiju Song, Xinjun Wan, Kevin George Harding, Steven Robert Hayashi, James Joseph Hoffman, Charles Walter Muekmore, Yana Zhang Williams, Shukuan Xu
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Publication number: 20120149281Abstract: A distance measurement system comprises an optical distance sensor configured to generate a light beam, a first optical module, and a processor. The first optical module is configured to receive the light beam, and generate and selectively transmit a plurality of light beams having different light channels for projection onto one or more points of an object to generate one or more reflected light beams scattered from the respective one or more points of the object, and capture and transmit the one or more reflected light beams into the optical distance sensor to retrieve a plurality of distance data to the respective one or more points of the object. The processor is configured to process the distance data to determine position information of the respective one or more points of the object. A distance measurement method is also presented.Type: ApplicationFiled: December 6, 2011Publication date: June 14, 2012Inventors: Xinjun WAN, Guju Song, Kevin George Harding, Shukuan Xu, Steven Robert Hayashi, Robert William Tait, James Joseph Hoffman, Charles Walter Muchmore, Matthew Michael Gluesenkamp
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Patent number: 8112172Abstract: A method for extracting gash parameters of a cutting tool, comprises positioning the cutting tool on a moveable stage, scanning two or more gash sections of the cutting tool to generate two or more gash section scanning point clouds, indexing multiple points of the gash section scanning point clouds, detecting multiple gash features using the indexed gash section scanning point clouds, projecting multiple point clouds of the gash features of the indexed gash section scanning point clouds to form one or more projected gash feature point clouds, identifying one or more types of the one or more projected gash feature point clouds, segmenting the one or more projected gash feature point clouds based on the type identification, and extracting one or more gash parameters based on the segmentation of the one or more projected gash feature point clouds. A system for extracting the parameters is also presented.Type: GrantFiled: April 29, 2009Date of Patent: February 7, 2012Assignee: General Electric CompanyInventors: Tian Chen, Kevin George Harding, Steven Robert Hayashi, Xiaoming Du, Howard Paul Weaver, James Allen Baird, Xinjue Zou, Kevin William Meyer
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Patent number: 7924439Abstract: A method for extracting parameters of a cutting tool is provided. The method comprises positioning the cutting tool on a moveable stage, performing one or more rotary scans of a first section of the cutting tool to generate a scanning point cloud, indexing a plurality of points of the scanning point cloud, detecting one or more feature points based on the indexed scanning point cloud, and extracting one or more parameters based on the detected feature points. A system for extracting the parameters is also presented.Type: GrantFiled: April 6, 2009Date of Patent: April 12, 2011Assignee: General Electric CompanyInventors: Tian Chen, Kevin George Harding, Steven Robert Hayashi, Xiaoming Du, Jianming Zheng, Howard Paul Weaver, James Allen Baird, Xinjue Zou, Kevin William Meyer
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Patent number: 7912572Abstract: A method of calibrating an inspection system is provided. The method includes contacting a test part with a run-out measurement device and rotating the test part and measuring a first run-out using the run-out measurement device. The method also includes moving the run-out measurement device to a new position and repeating the steps of contacting and rotating the test part to measure a second run-out at the new position. The method further includes using the first and second run-outs to adjust measurements of the inspection system.Type: GrantFiled: September 20, 2007Date of Patent: March 22, 2011Assignee: General Electric CompanyInventors: Xiaoming Du, Kevin George Harding, Steven Robert Hayashi, Jianming Zheng, Tian Chen, Howard Paul Weaver, Yong Yang, Guofei Hu, James Allen Baird, Jr.
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Patent number: 7876454Abstract: A method for measurement of a cutting tool is provided. The method comprises positioning the cutting tool on a moveable stage, performing a first rotary scan of a first section of the cutting tool to generate a first scanning point cloud, segmenting the first scanning point cloud, performing a second rotary scan of the first section based on the segmentation of the first scanning point cloud, and extracting the parameters of the first section based on the second rotary scan of the first section. A system for extracting parameters of a cutting tool is also presented.Type: GrantFiled: September 29, 2008Date of Patent: January 25, 2011Assignee: General Electric CompanyInventors: Xiaoming Du, Kevin George Harding, Steven Robert Hayashi, Tian Chen, Jianming Zheng, Howard Paul Weaver, James Allen Baird, Xinjue Zou
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Publication number: 20100280649Abstract: A method for extracting gash parameters of a cutting tool, comprises positioning the cutting tool on a moveable stage, scanning two or more gash sections of the cutting tool to generate two or more gash section scanning point clouds, indexing multiple points of the gash section scanning point clouds, detecting multiple gash features using the indexed gash section scanning point clouds, projecting multiple point clouds of the gash features of the indexed gash section scanning point clouds to form one or more projected gash feature point clouds, identifying one or more types of the one or more projected gash feature point clouds, segmenting the one or more projected gash feature point clouds based on the type identification, and extracting one or more gash parameters based on the segmentation of the one or more projected gash feature point clouds. A system for extracting the parameters is also presented.Type: ApplicationFiled: April 29, 2009Publication date: November 4, 2010Applicant: GENERAL ELECTRIC COMPANYInventors: Tian Chen, Kevin George Harding, Steven Robert Hayashi, Xiaoming Du, Howard Paul Weaver, James Allen Baird, Xinjue Zou, Kevin William Meyer
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Patent number: 7768655Abstract: A method of measuring an object includes positioning the object on a moveable stage, performing a rotary scan of the object with a range sensor, and determining geometric parameters of the object based on the rotary scan.Type: GrantFiled: December 20, 2006Date of Patent: August 3, 2010Assignee: General Electric CompanyInventors: Steven Robert Hayashi, Zhongguo Li, Kevin George Harding, Jianming Zheng, Howard Paul Weaver, Xiaoming Du, Tian Chen
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Publication number: 20100126877Abstract: An electrochemical grinding electrode comprises an electrically conductive material; an arc resistance material; and an abrasive material different from the arc resistance material. An electrochemical grinding apparatus and a method are also presented.Type: ApplicationFiled: November 24, 2008Publication date: May 27, 2010Applicant: GENERAL ELECTRIC COMPANYInventors: Yuanfeng Luo, Bin Wei, Steven Robert Hayashi, Andrew Lee Trimmer, Jian Wu
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Publication number: 20100079769Abstract: A method for extracting parameters of a cutting tool is provided. The method comprises positioning the cutting tool on a moveable stage, performing one or more rotary scans of a first section of the cutting tool to generate a scanning point cloud, indexing a plurality of points of the scanning point cloud, detecting one or more feature points based on the indexed scanning point cloud, and extracting one or more parameters based on the detected feature points. A system for extracting the parameters is also presented.Type: ApplicationFiled: April 6, 2009Publication date: April 1, 2010Applicant: GENERAL ELECTRIC COMPANYInventors: Tian Chen, Kevin George Harding, Steven Robert Hayashi, Xiaoming Du, Jianming Zheng, Howard Paul Weaver, James Allen Baird, Xinjue Zou, Kevin William Meyer
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Patent number: 7577491Abstract: A method for extracting parameters of a cutting tool is provided. The method includes obtaining a measurement data set having a point cloud corresponding to a surface of the cutting tool and virtually slicing the point cloud at a pre-determined section to obtain a set of points on the pre-determined section. The method also includes generating a plurality of curves through the set of points and optimizing the plurality of curves to generate optimized fitting curves and extracting the parameters of the cutting tool from the optimized fitting curves. Furthermore, based on the presented rotary angle projection technique, a plurality of parameters can be extracted for the cutting tool.Type: GrantFiled: November 30, 2005Date of Patent: August 18, 2009Assignee: General Electric CompanyInventors: Tian Chen, Kevin George Harding, Zhongguo Li, Jianming Zheng, Steven Robert Hayashi, Xiaoming Du
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Publication number: 20090082899Abstract: A method of calibrating an inspection system is provided. The method includes contacting a test part with a run-out measurement device and rotating the test part and measuring a first run-out using the run-out measurement device. The method also includes moving the run-out measurement device to a new position and repeating the steps of contacting and rotating the test part to measure a second run-out at the new position. The method further includes using the first and second run-outs to adjust measurements of the inspection system.Type: ApplicationFiled: September 20, 2007Publication date: March 26, 2009Applicant: General Electric CompanyInventors: Xiaoming Du, Kevin George Harding, Steven Robert Hayashi, Jianming Zheng, Tian Chen, Howard Paul Weaver, Yong Yang, Guofei Hu, James Allen Baird, JR.
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Publication number: 20090067704Abstract: A method for measurement of a cutting tool is provided. The method comprises positioning the cutting tool on a moveable stage, performing a first rotary scan of a first section of the cutting tool to generate a first scanning point cloud, segmenting the first scanning point cloud, performing a second rotary scan of the first section based on the segmentation of the first scanning point cloud, and extracting the parameters of the first section based on the second rotary scan of the first section. A system for extracting parameters of a cutting tool is also presented.Type: ApplicationFiled: September 29, 2008Publication date: March 12, 2009Applicant: GENERAL ELECTRIC COMPANYInventors: Xiaoming Du, Kevin George Harding, Steven Robert Hayashi, Tian Chen, Jianming Zheng, Howard Paul Weaver, James Allen Baird, Xinjue Zou
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Publication number: 20080148590Abstract: A method of measuring an object includes positioning the object on a moveable stage, performing a rotary scan of the object with a range sensor, and determining geometric parameters of the object based on the rotary scan.Type: ApplicationFiled: December 20, 2006Publication date: June 26, 2008Inventors: Steven Robert Hayashi, Zhongguo Li, Kevin George Harding, Jianming Zheng, Howard Paul Weaver, Xiaoming Du, Tian Chen
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Patent number: 7065479Abstract: A method for determining an equilibrium configuration for an object to be subjected to peening includes representing a bulk geometry of the object as a solid body and representing a surface of the object as a surface layer overlying the solid body. The method further includes expanding the surface layer in response to a number of thermal loads to simulate peening and balancing a number of forces on the surface layer and the solid body to determine the equilibrium configuration of the object after peening.Type: GrantFiled: May 28, 2002Date of Patent: June 20, 2006Assignee: General Electric CompanyInventors: David Peter Mika, Apostolos Pavlos Karafillis, Dale Robert Lombardo, Steven Robert Hayashi
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Publication number: 20030225476Abstract: A method for determining an equilibrium configuration for an object to be subjected to peening includes representing a bulk geometry of the object as a solid body and representing a surface of the object as a surface layer overlying the solid body. The method further includes expanding the surface layer in response to a number of thermal loads to simulate peening and balancing a number of forces on the surface layer and the solid body to determine the equilibrium configuration of the object after peening.Type: ApplicationFiled: May 28, 2002Publication date: December 4, 2003Applicant: General Electric CompanyInventors: David Peter Mika, Apostolos Pavlos Karafillis, Dale Robert Lombardo, Steven Robert Hayashi
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Patent number: 6362446Abstract: An apparatus for drilling cooling holes through a wall of a hollow component is disclosed. First, a laser drill is used for drilling at least one rough blind hole within a component wall, for example a turbine airfoil, so as to retain a residual bottom plate portion. Next, an electro discharge machine (EDM), for example a rotating EDM or plunge EDM, is used for finishing at least one rough blind hole so as to create at least one finished hole and breaking through the bottom plate portion.Type: GrantFiled: August 2, 1999Date of Patent: March 26, 2002Assignee: General Electric CompanyInventors: Marshall Gordon Jones, Steven Robert Hayashi, Bin Wei
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Patent number: 5846035Abstract: A drill according to an exemplary embodiment of the invention comprises a shank from which the drill is driven; a body connected to the shank, the body having a surface; a flute in the body; a cutting edge at a drill point; and a peripheral relief surface which extends outwardly from the surface of the body to an outer circumference of the drill, wherein the peripheral relief surface, for a cross section of the drill perpendicular to a drill axis, intersects the outer circumference at a peripheral point at an edge of the flute. The drill has an improved capacity to withstand a loss of coolant during drilling without severe overheating of the drill or workpiece and with little damage to the drill and workpiece.Type: GrantFiled: July 11, 1997Date of Patent: December 8, 1998Assignee: General Electric CompanyInventors: Apostolos Pavlos Karafillis, Steven Robert Hayashi