Patents by Inventor Steven Robert Hayashi

Steven Robert Hayashi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20130026380
    Abstract: Radiations detectors with angled walls and methods of fabrication are provided. One radiation detector module includes a plurality of sensor tiles configured to detect radiation. The plurality of sensor tiles have (i) top and bottom edges defining top and bottom surfaces of the plurality of sensor tiles, (ii) sidewall edges defining sides of the plurality of sensor tiles, and (iii) corners defined by the top and bottom edges and the sidewall edges. The radiation detector module also has at least one beveled surface having an oblique angle, wherein the beveled surface includes beveling of at least one of top or bottom edges, the side wall edges, or the corners.
    Type: Application
    Filed: July 26, 2011
    Publication date: January 31, 2013
    Applicant: General Electric Company
    Inventors: John Eric Tkaczyk, Steven Robert Hayashi, Haochuan Jiang, Wenwu Zhang, Kristian William Andreini, Nitin Garg, Tan Zhang
  • Publication number: 20120285820
    Abstract: A machining system is provided and includes a machining tool comprising a spindle, one or more electrodes configured to perform the electromachining, and one or more tool holding elements configure to conductively hold the respective one or more electrodes and be assembled onto the spindle of the machining tool. The machining system further comprises one or more adapters and one or more power sources configured to electrically connect to the respective one or more adapters and the workpiece. The one or more adapters are configured to conductively contact the respective one or more tool holding elements. Further, the machining system comprises one or more machining solution sources provided to pass one or more machining solutions between the workpiece and the respective one or more electrodes. A tool adapter assembly is also presented.
    Type: Application
    Filed: January 20, 2011
    Publication date: November 15, 2012
    Inventors: Hongtao Li, Bin Wei, Xiaobin Chen, Steven Robert Hayashi, Renwei Yuan, Yuanfeng Luo
  • Publication number: 20120147383
    Abstract: A measurement system comprising a light source unit, a projection unit and an optics unit is disclosed. The light source unit is configured to generate a plurality of modulated phase shifted light beams. The projection unit is configured to reflect the modulated phase shifted light beams onto an object surface. The optics unit is configured to capture the modulated phase shifted light beams from the object surface. The measurement system further comprises a photodetector and a processor. The photodetector is configured to receive the modulated phase shifted light beams from the optics unit to generate electrical signals. The processor is configured to retrieve position information of the object surface based on the electrical signals from the photodetector. A measurement method is also presented.
    Type: Application
    Filed: December 6, 2011
    Publication date: June 14, 2012
    Inventors: Li TAO, Guiju Song, Xinjun Wan, Kevin George Harding, Steven Robert Hayashi, James Joseph Hoffman, Charles Walter Muekmore, Yana Zhang Williams, Shukuan Xu
  • Publication number: 20120149281
    Abstract: A distance measurement system comprises an optical distance sensor configured to generate a light beam, a first optical module, and a processor. The first optical module is configured to receive the light beam, and generate and selectively transmit a plurality of light beams having different light channels for projection onto one or more points of an object to generate one or more reflected light beams scattered from the respective one or more points of the object, and capture and transmit the one or more reflected light beams into the optical distance sensor to retrieve a plurality of distance data to the respective one or more points of the object. The processor is configured to process the distance data to determine position information of the respective one or more points of the object. A distance measurement method is also presented.
    Type: Application
    Filed: December 6, 2011
    Publication date: June 14, 2012
    Inventors: Xinjun WAN, Guju Song, Kevin George Harding, Shukuan Xu, Steven Robert Hayashi, Robert William Tait, James Joseph Hoffman, Charles Walter Muchmore, Matthew Michael Gluesenkamp
  • Patent number: 8112172
    Abstract: A method for extracting gash parameters of a cutting tool, comprises positioning the cutting tool on a moveable stage, scanning two or more gash sections of the cutting tool to generate two or more gash section scanning point clouds, indexing multiple points of the gash section scanning point clouds, detecting multiple gash features using the indexed gash section scanning point clouds, projecting multiple point clouds of the gash features of the indexed gash section scanning point clouds to form one or more projected gash feature point clouds, identifying one or more types of the one or more projected gash feature point clouds, segmenting the one or more projected gash feature point clouds based on the type identification, and extracting one or more gash parameters based on the segmentation of the one or more projected gash feature point clouds. A system for extracting the parameters is also presented.
    Type: Grant
    Filed: April 29, 2009
    Date of Patent: February 7, 2012
    Assignee: General Electric Company
    Inventors: Tian Chen, Kevin George Harding, Steven Robert Hayashi, Xiaoming Du, Howard Paul Weaver, James Allen Baird, Xinjue Zou, Kevin William Meyer
  • Patent number: 7924439
    Abstract: A method for extracting parameters of a cutting tool is provided. The method comprises positioning the cutting tool on a moveable stage, performing one or more rotary scans of a first section of the cutting tool to generate a scanning point cloud, indexing a plurality of points of the scanning point cloud, detecting one or more feature points based on the indexed scanning point cloud, and extracting one or more parameters based on the detected feature points. A system for extracting the parameters is also presented.
    Type: Grant
    Filed: April 6, 2009
    Date of Patent: April 12, 2011
    Assignee: General Electric Company
    Inventors: Tian Chen, Kevin George Harding, Steven Robert Hayashi, Xiaoming Du, Jianming Zheng, Howard Paul Weaver, James Allen Baird, Xinjue Zou, Kevin William Meyer
  • Patent number: 7912572
    Abstract: A method of calibrating an inspection system is provided. The method includes contacting a test part with a run-out measurement device and rotating the test part and measuring a first run-out using the run-out measurement device. The method also includes moving the run-out measurement device to a new position and repeating the steps of contacting and rotating the test part to measure a second run-out at the new position. The method further includes using the first and second run-outs to adjust measurements of the inspection system.
    Type: Grant
    Filed: September 20, 2007
    Date of Patent: March 22, 2011
    Assignee: General Electric Company
    Inventors: Xiaoming Du, Kevin George Harding, Steven Robert Hayashi, Jianming Zheng, Tian Chen, Howard Paul Weaver, Yong Yang, Guofei Hu, James Allen Baird, Jr.
  • Patent number: 7876454
    Abstract: A method for measurement of a cutting tool is provided. The method comprises positioning the cutting tool on a moveable stage, performing a first rotary scan of a first section of the cutting tool to generate a first scanning point cloud, segmenting the first scanning point cloud, performing a second rotary scan of the first section based on the segmentation of the first scanning point cloud, and extracting the parameters of the first section based on the second rotary scan of the first section. A system for extracting parameters of a cutting tool is also presented.
    Type: Grant
    Filed: September 29, 2008
    Date of Patent: January 25, 2011
    Assignee: General Electric Company
    Inventors: Xiaoming Du, Kevin George Harding, Steven Robert Hayashi, Tian Chen, Jianming Zheng, Howard Paul Weaver, James Allen Baird, Xinjue Zou
  • Publication number: 20100280649
    Abstract: A method for extracting gash parameters of a cutting tool, comprises positioning the cutting tool on a moveable stage, scanning two or more gash sections of the cutting tool to generate two or more gash section scanning point clouds, indexing multiple points of the gash section scanning point clouds, detecting multiple gash features using the indexed gash section scanning point clouds, projecting multiple point clouds of the gash features of the indexed gash section scanning point clouds to form one or more projected gash feature point clouds, identifying one or more types of the one or more projected gash feature point clouds, segmenting the one or more projected gash feature point clouds based on the type identification, and extracting one or more gash parameters based on the segmentation of the one or more projected gash feature point clouds. A system for extracting the parameters is also presented.
    Type: Application
    Filed: April 29, 2009
    Publication date: November 4, 2010
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Tian Chen, Kevin George Harding, Steven Robert Hayashi, Xiaoming Du, Howard Paul Weaver, James Allen Baird, Xinjue Zou, Kevin William Meyer
  • Patent number: 7768655
    Abstract: A method of measuring an object includes positioning the object on a moveable stage, performing a rotary scan of the object with a range sensor, and determining geometric parameters of the object based on the rotary scan.
    Type: Grant
    Filed: December 20, 2006
    Date of Patent: August 3, 2010
    Assignee: General Electric Company
    Inventors: Steven Robert Hayashi, Zhongguo Li, Kevin George Harding, Jianming Zheng, Howard Paul Weaver, Xiaoming Du, Tian Chen
  • Publication number: 20100126877
    Abstract: An electrochemical grinding electrode comprises an electrically conductive material; an arc resistance material; and an abrasive material different from the arc resistance material. An electrochemical grinding apparatus and a method are also presented.
    Type: Application
    Filed: November 24, 2008
    Publication date: May 27, 2010
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Yuanfeng Luo, Bin Wei, Steven Robert Hayashi, Andrew Lee Trimmer, Jian Wu
  • Publication number: 20100079769
    Abstract: A method for extracting parameters of a cutting tool is provided. The method comprises positioning the cutting tool on a moveable stage, performing one or more rotary scans of a first section of the cutting tool to generate a scanning point cloud, indexing a plurality of points of the scanning point cloud, detecting one or more feature points based on the indexed scanning point cloud, and extracting one or more parameters based on the detected feature points. A system for extracting the parameters is also presented.
    Type: Application
    Filed: April 6, 2009
    Publication date: April 1, 2010
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Tian Chen, Kevin George Harding, Steven Robert Hayashi, Xiaoming Du, Jianming Zheng, Howard Paul Weaver, James Allen Baird, Xinjue Zou, Kevin William Meyer
  • Patent number: 7577491
    Abstract: A method for extracting parameters of a cutting tool is provided. The method includes obtaining a measurement data set having a point cloud corresponding to a surface of the cutting tool and virtually slicing the point cloud at a pre-determined section to obtain a set of points on the pre-determined section. The method also includes generating a plurality of curves through the set of points and optimizing the plurality of curves to generate optimized fitting curves and extracting the parameters of the cutting tool from the optimized fitting curves. Furthermore, based on the presented rotary angle projection technique, a plurality of parameters can be extracted for the cutting tool.
    Type: Grant
    Filed: November 30, 2005
    Date of Patent: August 18, 2009
    Assignee: General Electric Company
    Inventors: Tian Chen, Kevin George Harding, Zhongguo Li, Jianming Zheng, Steven Robert Hayashi, Xiaoming Du
  • Publication number: 20090082899
    Abstract: A method of calibrating an inspection system is provided. The method includes contacting a test part with a run-out measurement device and rotating the test part and measuring a first run-out using the run-out measurement device. The method also includes moving the run-out measurement device to a new position and repeating the steps of contacting and rotating the test part to measure a second run-out at the new position. The method further includes using the first and second run-outs to adjust measurements of the inspection system.
    Type: Application
    Filed: September 20, 2007
    Publication date: March 26, 2009
    Applicant: General Electric Company
    Inventors: Xiaoming Du, Kevin George Harding, Steven Robert Hayashi, Jianming Zheng, Tian Chen, Howard Paul Weaver, Yong Yang, Guofei Hu, James Allen Baird, JR.
  • Publication number: 20090067704
    Abstract: A method for measurement of a cutting tool is provided. The method comprises positioning the cutting tool on a moveable stage, performing a first rotary scan of a first section of the cutting tool to generate a first scanning point cloud, segmenting the first scanning point cloud, performing a second rotary scan of the first section based on the segmentation of the first scanning point cloud, and extracting the parameters of the first section based on the second rotary scan of the first section. A system for extracting parameters of a cutting tool is also presented.
    Type: Application
    Filed: September 29, 2008
    Publication date: March 12, 2009
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Xiaoming Du, Kevin George Harding, Steven Robert Hayashi, Tian Chen, Jianming Zheng, Howard Paul Weaver, James Allen Baird, Xinjue Zou
  • Publication number: 20080148590
    Abstract: A method of measuring an object includes positioning the object on a moveable stage, performing a rotary scan of the object with a range sensor, and determining geometric parameters of the object based on the rotary scan.
    Type: Application
    Filed: December 20, 2006
    Publication date: June 26, 2008
    Inventors: Steven Robert Hayashi, Zhongguo Li, Kevin George Harding, Jianming Zheng, Howard Paul Weaver, Xiaoming Du, Tian Chen
  • Patent number: 7065479
    Abstract: A method for determining an equilibrium configuration for an object to be subjected to peening includes representing a bulk geometry of the object as a solid body and representing a surface of the object as a surface layer overlying the solid body. The method further includes expanding the surface layer in response to a number of thermal loads to simulate peening and balancing a number of forces on the surface layer and the solid body to determine the equilibrium configuration of the object after peening.
    Type: Grant
    Filed: May 28, 2002
    Date of Patent: June 20, 2006
    Assignee: General Electric Company
    Inventors: David Peter Mika, Apostolos Pavlos Karafillis, Dale Robert Lombardo, Steven Robert Hayashi
  • Publication number: 20030225476
    Abstract: A method for determining an equilibrium configuration for an object to be subjected to peening includes representing a bulk geometry of the object as a solid body and representing a surface of the object as a surface layer overlying the solid body. The method further includes expanding the surface layer in response to a number of thermal loads to simulate peening and balancing a number of forces on the surface layer and the solid body to determine the equilibrium configuration of the object after peening.
    Type: Application
    Filed: May 28, 2002
    Publication date: December 4, 2003
    Applicant: General Electric Company
    Inventors: David Peter Mika, Apostolos Pavlos Karafillis, Dale Robert Lombardo, Steven Robert Hayashi
  • Patent number: 6362446
    Abstract: An apparatus for drilling cooling holes through a wall of a hollow component is disclosed. First, a laser drill is used for drilling at least one rough blind hole within a component wall, for example a turbine airfoil, so as to retain a residual bottom plate portion. Next, an electro discharge machine (EDM), for example a rotating EDM or plunge EDM, is used for finishing at least one rough blind hole so as to create at least one finished hole and breaking through the bottom plate portion.
    Type: Grant
    Filed: August 2, 1999
    Date of Patent: March 26, 2002
    Assignee: General Electric Company
    Inventors: Marshall Gordon Jones, Steven Robert Hayashi, Bin Wei
  • Patent number: 5846035
    Abstract: A drill according to an exemplary embodiment of the invention comprises a shank from which the drill is driven; a body connected to the shank, the body having a surface; a flute in the body; a cutting edge at a drill point; and a peripheral relief surface which extends outwardly from the surface of the body to an outer circumference of the drill, wherein the peripheral relief surface, for a cross section of the drill perpendicular to a drill axis, intersects the outer circumference at a peripheral point at an edge of the flute. The drill has an improved capacity to withstand a loss of coolant during drilling without severe overheating of the drill or workpiece and with little damage to the drill and workpiece.
    Type: Grant
    Filed: July 11, 1997
    Date of Patent: December 8, 1998
    Assignee: General Electric Company
    Inventors: Apostolos Pavlos Karafillis, Steven Robert Hayashi