Patents by Inventor Takahiro Funabiki

Takahiro Funabiki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of locating a fault in a logic IC device
    Patent number: 5189365
    Abstract: A fault in a logic IC device including a plurality of logic cells is diagnosed by the use of an intentional fault. The intentional fault is introduced into a portion of logical operation data for the logic cells of the device to produce a faulty logical operation data. That portion of the logical operation data corresponds to a fault candidate which represents a location in the device at which hazard is supposed to have occurred to make it uncertain whether or not a fault exists at the location.
    Type: Grant
    Filed: October 7, 1991
    Date of Patent: February 23, 1993
    Assignee: Hitachi, Ltd.
    Inventors: Masaharu Ikeda, Takahiro Funabiki, Kazuo Kasuga