Patents by Inventor Takahiro Nagata

Takahiro Nagata has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20200391186
    Abstract: An exhaust gas cleaning catalyst for inhibiting particulates grain growth includes composite metal particulates containing Pd and Rh, where the average proportion of the total Rh atoms relative to the total Pd and Rh atoms is 0.5 atom %, and given an X-ray wavelength of 1.5403 ?, when the diffraction surface in XRD analysis is the crystal lattice face of the Pd(111), and diffraction angles 2? indicating the diffraction peak positions on the diffraction surface are identified, the absolute value of the difference between the theoretical lattice constant B from a formula related to Vegard's law using the identified values, and the actual lattice constant C from a formula related to lattice constants and Bragg's law does not exceed 1.020×10?3 (?). A smaller absolute value of the difference between the theoretical and actual lattice constants is associated with a higher degree to which the Pd and Rh are combined with one another.
    Type: Application
    Filed: April 13, 2017
    Publication date: December 17, 2020
    Applicants: TOYOTA JIDOSHA KABUSHIKI KAISHA, CATALER CORPORATION
    Inventors: Shogo SHIRAKAWA, Masahide MIURA, Toshihiro IKAI, Kosuke IIZUKA, Hiroki NIHASHI, Isao NAITO, Takahiro NAGATA
  • Patent number: 10866265
    Abstract: The inspection jig includes a rigid substrate, a flexible substrate connected to the rigid substrate, a support for supporting a part of the flexible substrate in a state that the part of the flexible substrate is protruded with respect to the rigid substrate, and a stretchable contactor provided on a protruding portion of the flexible substrate.
    Type: Grant
    Filed: September 27, 2018
    Date of Patent: December 15, 2020
    Assignee: YOKOWO CO., LTD.
    Inventor: Takahiro Nagata
  • Publication number: 20200300889
    Abstract: A first signal line pattern has one end electrically connected to a first connector. A second signal line pattern has one end electrically connected to a second connector. The second signal line pattern has the other end facing the other end of the first signal line pattern. A conductive block has a convex portion. The convex portion of the conductive block is electrically connected to a third portion of the conductive pattern positioned between the other end of the first signal line pattern and the other end of the second signal line pattern of the wiring board.
    Type: Application
    Filed: March 6, 2020
    Publication date: September 24, 2020
    Applicant: YOKOWO CO., LTD.
    Inventors: Masaki NOGUCHI, Takahiro NAGATA, Tsuyoshi YAMATO
  • Patent number: 10756372
    Abstract: A first proton-donating layer (20a) is a layer having a proton-donative functional group on the surface, for example, a silicon oxide layer. A second proton-donating layer (20b) is also a layer having a proton-donative functional group on the surface, for example, a silicon oxide layer. Negative surface charges are formed on the main surface section of a first base (10a) and the main surface section of a second base (10b), and these negative charges increased the proton conductivity in an aqueous solution fed to a nano channel. Although, in the aqueous solution, proton migration through hopping between water molecules contributes to its diffusion, the negative charges formed on the main surfaces of the bases (10a, 10b) attract protons in the aqueous solution, and the conduction of protons is efficiently achieved in “high-speed transfer regions” formed in the vicinity of the proton-donating layers (20a, 20b).
    Type: Grant
    Filed: October 21, 2015
    Date of Patent: August 25, 2020
    Assignee: JAPAN SCIENCE AND TECHNOLOGY AGENCY
    Inventors: Yutaka Kazoe, Yuriy Pihosh, Kazuma Mawatari, Takehiko Kitamori, Kenji Kitamura, Takahiro Nagata, Osamu Tabata, Toshiyuki Tsuchiya
  • Patent number: 10715262
    Abstract: A testing device for testing an antenna-incorporated semiconductor device which is integrated with an antenna is provided. The testing device includes a non-contact probe configured to receive a radio wave emitted from the antenna in a state that the non-contact probe is not in contact with the antenna. The testing device may further include a movable base body configured to be lifted and lowered.
    Type: Grant
    Filed: February 8, 2019
    Date of Patent: July 14, 2020
    Assignee: YOKOWO CO., LTD.
    Inventor: Takahiro Nagata
  • Patent number: 10712383
    Abstract: An inspection jig includes a rigid substrate, a flexible substrate connected to the rigid substrate, a support supporting a part of the flexible substrate in a state that the part of the flexible substrate is protruded with respect to the rigid substrate in a first direction, a biasing unit configured to bias the support in the first direction with respect to the rigid substrate, and a contactor provided on a protruding portion of the flexible substrate, the protruding portion being protruded with respect to the rigid substrate. The contactor includes a contact housing, and a probe supported on the contact housing. One end of the probe is in contact with a contact portion on the protruding portion.
    Type: Grant
    Filed: November 28, 2018
    Date of Patent: July 14, 2020
    Assignee: YOKOWO CO., LTD.
    Inventor: Takahiro Nagata
  • Patent number: 10676858
    Abstract: The present disclosure provides a drying chamber (condenser) including a container having a steam intake opening, the condenser liquefying steam taken from the steam intake opening into the container, and the drying chamber including a cooling pipe which is disposed in the container and through which coolant circulates.
    Type: Grant
    Filed: November 22, 2016
    Date of Patent: June 9, 2020
    Assignees: IHI CORPORATION, IHI MACHINERY AND FURNACE CO., LTD.
    Inventors: Kazuhiko Katsumata, Masatoshi Mitsuzuka, Osamu Sakamoto, Takahiro Nagata
  • Patent number: 10598694
    Abstract: The inspection jig includes a rigid substrate, a flexible substrate connected to the rigid substrate, a contactor block for supporting a part of the flexible substrate in a state that the part of the flexible substrate is protruded with respect to the rigid substrate, a contactor provided on a protruding portion of the flexible substrate, and a spring probe supported by the contactor block, one end of which is in contact with a contact pad provided on a lower surface of the rigid substrate, and the other end of which protrudes from a protruding portion of the flexible substrate.
    Type: Grant
    Filed: October 30, 2018
    Date of Patent: March 24, 2020
    Assignee: YOKOWO CO., LTD.
    Inventor: Takahiro Nagata
  • Publication number: 20200030780
    Abstract: The present invention provides an exhaust gas purification catalyst including an alkaline earth metal supported in a highly dispersed state on a porous carrier. A catalyst layer of the exhaust gas purification catalyst provided by the invention has an alkaline earth metal-supporting region including a porous carrier, a catalyst metal belonging to the platinum group, and a sulfate of at least one type of alkali earth metal supported on the porous carrier. In a cross-section of this region, a Pearson correlation coefficient RAe/M is at least 0.5 as calculated using ? and ? for each pixel obtained by carrying out area analysis by FE-EPMA under conditions of pixel size of 0.34 ?m×0.34 ?m, and measured pixel number 256×256, and by measuring the characteristic X-ray intensity (?: cps) of the alkaline earth metal element (Ae) and the characteristic X-ray intensity (?: cps) of the main constituent element of the inorganic compound constituting the porous carrier for each pixel.
    Type: Application
    Filed: April 9, 2018
    Publication date: January 30, 2020
    Inventors: Shunsuke Oishi, Shogo KAWAMURA, Takahiro NAGATA, Hirotaka ORI, Minoru ITOU
  • Publication number: 20190372687
    Abstract: A testing device for testing an antenna-incorporated semiconductor device which is integrated with an antenna is provided. The testing device includes a non-contact probe configured to receive a radio wave emitted from the antenna in a state that the non-contact probe is not in contact with the antenna. The testing device may further include a movable base body configured to be lifted and lowered.
    Type: Application
    Filed: February 8, 2019
    Publication date: December 5, 2019
    Applicant: YOKOWO CO., LTD.
    Inventor: Takahiro NAGATA
  • Patent number: 10450216
    Abstract: A glass sheet processing method is provided for irradiating a laser beam on a glass sheet and forming a cleavage in the glass sheet with thermal stress. If each of an irradiation area of the laser beam on the surface and an irradiation area of the laser beam on the back face of the glass sheet includes a peak position of a power density of the laser beam, each irradiation area has an asymmetrical power density distribution that is asymmetrical with respect to a reference line that passes through the peak position and is parallel to a moving direction of the peak position. If each irradiation area has no peak position, each irradiation area has an asymmetrical shape that is asymmetrical with respect to a reference line that passes through a centroid position of the irradiation area and is parallel to a moving direction of the centroid position.
    Type: Grant
    Filed: September 23, 2015
    Date of Patent: October 22, 2019
    Assignee: AGC Inc.
    Inventors: Isao Saito, Takahiro Nagata
  • Patent number: 10392676
    Abstract: A heat treatment device includes: a heating device that heats a treatment object; a cooling device including a cooling room that accommodates the treatment object heated by the heating device and into which a cooling medium used for cooling the treatment object is supplied; a pressurized gas supplier that supplies pressurized gas into the cooling room; a pressure relief valve that communicates internal and external areas of the cooling room with each other when the pressure relief valve is opened; a pressure sensor that measures the pressure inside the cooling room; and a controller that controls the pressure relief valve such that the pressure relief valve is opened when a measurement result of the pressure sensor is higher than or equal to a threshold value.
    Type: Grant
    Filed: March 1, 2017
    Date of Patent: August 27, 2019
    Assignees: IHI CORPORATION, IHI MACHINERY AND FURNACE CO., LTD.
    Inventors: Kazuhiko Katsumata, Kaoru Isomoto, Gen Nishitani, Akira Nakayama, Takahiro Nagata, Yuusuke Shimizu
  • Patent number: 10393771
    Abstract: An exchangeable contact unit which can be attached to or detached from a main body of an inspection jig, includes: a flexible board which is provided with a contact part with respect to an object to be inspected; and a coaxial connector which is directly and electrically connected to the flexible board.
    Type: Grant
    Filed: December 28, 2015
    Date of Patent: August 27, 2019
    Assignee: YOKOWO CO., LTD.
    Inventors: Takahiro Nagata, Takeshi Todoroki, Takahiro Nakamura
  • Publication number: 20190193123
    Abstract: A cleaning device includes at least: a main body including a vapor cleaning chamber configured to perform vapor-cleaning on a workpiece and a dipping cleaning chamber configured to perform dip-cleaning on the workpiece; and a condenser provided on the vapor cleaning chamber to be capable of switching between a communication state and a non-communication state with the vapor cleaning chamber via a vapor inlet port, and configured to condense vapor taken in from the vapor inlet port, in which the condenser includes: a condenser casing in which the vapor inlet port is formed; a cooling pipe through which a coolant flows; and a holding member that holds the cooling pipe to detachably house the cooling pipe in the condenser casing.
    Type: Application
    Filed: March 4, 2019
    Publication date: June 27, 2019
    Applicants: IHI Corporation, IHI Machinery and Furnace Co., Ltd.
    Inventors: Masatoshi MITSUZUKA, Noboru KIYA, Takahiro NAGATA
  • Publication number: 20190187205
    Abstract: An inspection jig includes a rigid substrate, a flexible substrate connected to the rigid substrate, a support supporting a part of the flexible substrate in a state that the part of the flexible substrate is protruded with respect to the rigid substrate in a first direction, a biasing unit configured to bias the support in the first direction with respect to the rigid substrate, and a contactor provided on a protruding portion of the flexible substrate, the protruding portion being protruded with respect to the rigid substrate. The contactor includes a contact housing, and a probe supported on the contact housing. One end of the probe is in contact with a contact portion on the protruding portion.
    Type: Application
    Filed: November 28, 2018
    Publication date: June 20, 2019
    Applicant: YOKOWO CO., LTD.
    Inventor: Takahiro NAGATA
  • Publication number: 20190187178
    Abstract: The inspection jig includes a rigid substrate, a flexible substrate connected to the rigid substrate, a contactor block for supporting a part of the flexible substrate in a state that the part of the flexible substrate is protruded with respect to the rigid substrate, a contactor provided on a protruding portion of the flexible substrate, and a spring probe supported by the contactor block, one end of which is in contact with a contact pad provided on a lower surface of the rigid substrate, and the other end of which protrudes from a protruding portion of the flexible substrate.
    Type: Application
    Filed: October 30, 2018
    Publication date: June 20, 2019
    Applicant: YOKOWO CO., LTD.
    Inventor: Takahiro NAGATA
  • Publication number: 20190187181
    Abstract: The inspection jig includes a rigid substrate, a flexible substrate connected to the rigid substrate, a support for supporting a part of the flexible substrate in a state that the part of the flexible substrate is protruded with respect to the rigid substrate, and a stretchable contactor provided on a protruding portion of the flexible substrate.
    Type: Application
    Filed: September 27, 2018
    Publication date: June 20, 2019
    Applicant: YOKOWO CO., LTD.
    Inventor: Takahiro NAGATA
  • Patent number: 10323315
    Abstract: A carburizing device includes a furnace body that performs heat treatment on a treatment object to perform carburization treatment on the treatment object, in which: a heater configured to perform heat treatment on the treatment object is provided upright in a vertical direction within the furnace body; a gas supply section configured to supply a gas for burnout toward the heater is provided at a lower end part of the heater; the heater is inserted through a protective tube provided upright in the vertical direction; and the gas supply section is configured to supply the gas for burnout to between the protective tube and the heater.
    Type: Grant
    Filed: October 7, 2016
    Date of Patent: June 18, 2019
    Assignees: IHI CORPORATION, IHI MACHINERY AND FURNACE CO., LTD.
    Inventors: Kazuhiko Katsumata, Masatoshi Mitsuzuka, Osamu Sakamoto, Takahiro Nagata
  • Patent number: 10324110
    Abstract: A probe cover which is to be attached to a socket that is configured to support a plurality of contact probes, includes: a base; two positioning pins which are disposed on the base; and at least one supporting member which is disposed on the base. The two positioning pins and the supporting member are capable of positioning the base in a state where the base is separated from the socket by a predetermined distance, and a mutual separation distance between the two positioning pins is changeable.
    Type: Grant
    Filed: March 20, 2015
    Date of Patent: June 18, 2019
    Assignee: Yokowo Co., Ltd.
    Inventors: Takahiro Nagata, Yoshiji Miyashita, Katsuo Miki, Kazumi Ookawara, Isao Samata
  • Patent number: 10317430
    Abstract: Provided is a contactor that can be manufactured easily and secure a long stroke. A contactor includes: a flexible board; a plurality of contact point portions that are provided in the flexible board; a plurality of springs that urge the contact point portions respectively toward an inspection target device; and a housing that receives the plurality of springs. Each of the springs has a flat winding portion that is provided at least at an end portion of the spring on the contact point portion side, and a diagonal tight winding portion that is provided at a longitudinally intermediate portion of the spring. A gap is present between the flat winding portion and the diagonal tight winding portion in an uncompressed state of the spring.
    Type: Grant
    Filed: September 6, 2016
    Date of Patent: June 11, 2019
    Assignee: Yokowo Co., Ltd.
    Inventor: Takahiro Nagata