Patents by Inventor Takako Onishi

Takako Onishi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240062401
    Abstract: A measurement system includes a first feature point data generator, a second feature point data generator, and a calculator. The first feature point data generator generates first feature point data from first image data or from first shape data. The first image data is obtained from imaging of a measurement target and includes a predetermined portion of the measurement target. The first shape data is generated based on the first image data. The second feature point data generator generates second feature point data from second image data different from the first image data or from second shape data. The calculator calculates a positional correspondence of the predetermined portion of the measurement target between the first image data and the second image data or between the first shape data and the second shape data based on the first feature point data and the second feature point data.
    Type: Application
    Filed: March 8, 2021
    Publication date: February 22, 2024
    Inventors: Takako ONISHI, Takayuki NISHI, Shimpei FUJII, Hironori KASAHARA, Yuji KARITA, Hiroyuki MORI
  • Publication number: 20240043187
    Abstract: Provided is an ejection cap capable of smoothly and reliably breaking through a film closing a mouth part of a container body and ejecting a content inside a container. An ejection cap (1) comprising an asymmetric cutter (6) that hangs from a lower surface of a top plate part of a substantially cylindrical dispensing cylinder (4) threadedly engaging a mouth part (3a) of a container body (3) closed by a film (2) and penetrating the film to eject a content, and that has a notch part (7) at a lateral surface on a side opposite to a threadedly engaging rotating direction on a substantially circumference at the tip of the dispensing cylinder.
    Type: Application
    Filed: October 9, 2020
    Publication date: February 8, 2024
    Inventors: Megumi KINOSHITA, Toshifumi YOSHIDA, Jun ISHII, Masahiko NAGOSHI, Takako ONISHI
  • Publication number: 20220073360
    Abstract: Provided are a zeolite with increased hydrothermal durability and a method of manufacturing the same. One aspect of the present invention provides a method of producing the zeolite, comprising the steps of: preparing a raw material zeolite (excluding FAU-type zeolite material) containing at least Si but not Al in the framework or having a Si/Al atomic ratio of 50 or more, and bringing the zeolite material into contact with a solution containing fluoride ions or with hot water at a temperature of 50° C. or more and 250° C. or less.
    Type: Application
    Filed: November 27, 2019
    Publication date: March 10, 2022
    Inventors: Toru Wakihara, Kenta Iyoki, Takako Onishi, Kakeru Kikumasa
  • Patent number: 11154001
    Abstract: An inspection management system having a plurality of processes and managing final inspection performed to inspect a completed product and one or more intermediate inspections performed to inspect an intermediate product manufactured in the processes earlier than a final process includes: an inspection content data acquisition unit that acquires inspection content data including an inspection standard for each inspection item of the product; an inspection content setting unit that sets inspection content based on the inspection content data acquired by the inspection content data acquisition unit; a simulation unit that simulates inspection in accordance with assumed inspection content; an inspection standard calculation unit that calculates an inspection standard more appropriate than a current inspection standard based on the simulation; and an output unit that outputs base information indicating that at least the inspection standard calculated by the inspection standard calculation unit is more appropriate
    Type: Grant
    Filed: October 16, 2018
    Date of Patent: October 19, 2021
    Assignee: OMRON Corporation
    Inventors: Hiroyuki Mori, Katsuki Nakajima, Takako Onishi, Isao Nakanishi, Mayuko Tanaka
  • Patent number: 10876977
    Abstract: An inspection management system that manages inspection of an inspection apparatus in a production line including a manufacturing apparatus of a product and the inspection apparatus includes: an acquisition unit configured to acquire inspection content data including an inspection standard for each component; an inspection content setting unit configured to set inspection content; a setting-related information acquisition unit configured to acquire setting-related information including at least a time at which new inspection content is set when the inspection content setting unit sets the new inspection content; a storage unit configured to retain the setting-related information in association with a history of the setting of the inspection content; a setting-related information reading unit configured to read the setting-related information retained in the storage unit; and an output unit configured to be able to output the setting-related information.
    Type: Grant
    Filed: October 17, 2018
    Date of Patent: December 29, 2020
    Assignee: OMRON Corporation
    Inventors: Hiroyuki Mori, Katsuki Nakajima, Mayuko Tanaka, Takako Onishi, Isao Nakanishi
  • Patent number: 10605748
    Abstract: An X-ray inspection apparatus includes a stage that moves an inspection object, an X-ray source, and/or an X-ray camera by driving a motor, a position detection unit that periodically obtains a position detection value of the motor, and stores the value in association with time, an imaging timing obtaining unit that stores an imaging timing at which imaging is performed by the X-ray camera in association with time, an imaging position calculation unit that calculates relative positions of the inspection object, and the X-ray source and the X-ray camera corresponding to the imaging timing using the position detection value of the motor at the imaging timing, and a reconstruction unit that performs reconstruction using image data captured by the X-ray camera and the relative positions in the image data at the imaging timing.
    Type: Grant
    Filed: May 24, 2017
    Date of Patent: March 31, 2020
    Assignee: OMRON Corporation
    Inventors: Shinji Sugita, Yuji Umemoto, Takako Onishi
  • Patent number: 10545101
    Abstract: An inspection apparatus includes a feed-in preparation chamber, an imaging chamber, and a feed-out preparation chamber. Each preparation chamber includes a feed-in unit that receives an inspection object through a first opening, a traverser that translates the received object to a second opening in a direction different from the receiving direction of the object, and a feed-out unit that moves the object in a direction different from a moving direction of the traverser and discharges the object through the second opening. The imaging chamber includes an imaging unit that images the object fed from the feed-in preparation chamber. The traverser includes a mount for the object, and a shield that moves together with the mount and prevents radioactive rays entering one of the first and second openings and propagating in the moving direction of the traverser from reaching the other opening.
    Type: Grant
    Filed: May 24, 2017
    Date of Patent: January 28, 2020
    Assignee: OMRON Corporation
    Inventors: Shinji Sugita, Takako Onishi, Yoshihide Ota
  • Publication number: 20190223337
    Abstract: An inspection management system having a plurality of processes and managing final inspection performed to inspect a completed product and one or more intermediate inspections performed to inspect an intermediate product manufactured in the processes earlier than a final process includes: an inspection content data acquisition unit that acquires inspection content data including an inspection standard for each inspection item of the product; an inspection content setting unit that sets inspection content based on the inspection content data acquired by the inspection content data acquisition unit; a simulation unit that simulates inspection in accordance with assumed inspection content; an inspection standard calculation unit that calculates an inspection standard more appropriate than a current inspection standard based on the simulation; and an output unit that outputs base information indicating that at least the inspection standard calculated by the inspection standard calculation unit is more appropriate
    Type: Application
    Filed: October 16, 2018
    Publication date: July 18, 2019
    Applicant: OMRON Corporation
    Inventors: Hiroyuki MORI, Katsuki NAKAJIMA, Takako ONISHI, Isao NAKANISHI, Mayuko TANAKA
  • Publication number: 20190219521
    Abstract: An inspection management system that manages inspection of an inspection apparatus in a production line including a manufacturing apparatus of a product and the inspection apparatus includes: an acquisition unit configured to acquire inspection content data including an inspection standard for each component; an inspection content setting unit configured to set inspection content; a setting-related information acquisition unit configured to acquire setting-related information including at least a time at which new inspection content is set when the inspection content setting unit sets the new inspection content; a storage unit configured to retain the setting-related information in association with a history of the setting of the inspection content; a setting-related information reading unit configured to read the setting-related information retained in the storage unit; and an output unit configured to be able to output the setting-related information.
    Type: Application
    Filed: October 17, 2018
    Publication date: July 18, 2019
    Applicant: OMRON Corporation
    Inventors: Hiroyuki MORI, Katsuki NAKAJIMA, Mayuko TANAKA, Takako ONISHI, Isao NAKANISHI
  • Patent number: 10054432
    Abstract: An X-ray inspection apparatus includes a 3D processing unit that performs 3D imaging of a first area in an inspection area, a 2D processing unit that performs 2D imaging of a second area in the inspection area, an extraction unit that extracts 3D information for a first inspection target from a 3D image of the first area, and 2D information for a second inspection target from a 2D image of the second area, a 3D information estimation unit that estimates 3D information for the second inspection target using the extracted 3D information for the first inspection target, and an inspection unit that inspects the second inspection target using the 2D information for the second inspection target and the estimated 3D information for the second inspection target.
    Type: Grant
    Filed: August 24, 2017
    Date of Patent: August 21, 2018
    Assignee: OMRON Corporation
    Inventors: Hironori Kasahara, Shinji Sugita, Takako Onishi
  • Publication number: 20180080763
    Abstract: An X-ray inspection apparatus includes a 3D processing unit that performs 3D imaging of a first area in an inspection area, a 2D processing unit that performs 2D imaging of a second area in the inspection area, an extraction unit that extracts 3D information for a first inspection target from a 3D image of the first area, and 2D information for a second inspection target from a 2D image of the second area, a 3D information estimation unit that estimates 3D information for the second inspection target using the extracted 3D information for the first inspection target, and an inspection unit that inspects the second inspection target using the 2D information for the second inspection target and the estimated 3D information for the second inspection target.
    Type: Application
    Filed: August 24, 2017
    Publication date: March 22, 2018
    Applicant: OMRON Corporation
    Inventors: Hironori KASAHARA, Shinji SUGITA, Takako ONISHI
  • Publication number: 20170356860
    Abstract: An inspection apparatus includes a feed-in preparation chamber, an imaging chamber, and a feed-out preparation chamber. Each preparation chamber includes a feed-in unit that receives an inspection object through a first opening, a traverser that translates the received object to a second opening in a direction different from the receiving direction of the object, and a feed-out unit that moves the object in a direction different from a moving direction of the traverser and discharges the object through the second opening. The imaging chamber includes an imaging unit that images the object fed from the feed-in preparation chamber. The traverser includes a mount for the object, and a shield that moves together with the mount and prevents radioactive rays entering one of the first and second openings and propagating in the moving direction of the traverser from reaching the other opening.
    Type: Application
    Filed: May 24, 2017
    Publication date: December 14, 2017
    Applicant: OMRON Corporation
    Inventors: Shinji SUGITA, Takako ONISHI, Yoshihide OTA
  • Publication number: 20170356859
    Abstract: An X-ray inspection apparatus includes a stage that moves an inspection object, an X-ray source, and/or an X-ray camera by driving a motor, a position detection unit that periodically obtains a position detection value of the motor, and stores the value in association with time, an imaging timing obtaining unit that stores an imaging timing at which imaging is performed by the X-ray camera in association with time, an imaging position calculation unit that calculates relative positions of the inspection object, and the X-ray source and the X-ray camera corresponding to the imaging timing using the position detection value of the motor at the imaging timing, and a reconstruction unit that performs reconstruction using image data captured by the X-ray camera and the relative positions in the image data at the imaging timing.
    Type: Application
    Filed: May 24, 2017
    Publication date: December 14, 2017
    Applicant: OMRON Corporation
    Inventors: Shinji SUGITA, Yuji UMEMOTO, Takako ONISHI
  • Publication number: 20160267443
    Abstract: A useful body library having a data structure is prepared. In the data structure, characteristic data expressing a characteristic of a useful body used in object recognition with a computer and containing substance data expressing a kind and a content of a recyclable specified substance contained in the useful body are associated with each other in each kind of the useful body with respect to the useful body, the useful body being a constituent component of an electronic device and an electronic device, the electronic device and the electronic device containing the specified substance.
    Type: Application
    Filed: October 30, 2014
    Publication date: September 15, 2016
    Applicant: OMRON Corporation
    Inventors: Atsushi Hisano, Takako Onishi, Shinji Sugita
  • Patent number: 9211350
    Abstract: A compound represented by the following formula (1), or a salt thereof: wherein R1 is a radioactive halogen substituent, 0 to 2 of A1, A2, A3 and A4 represent N, and the rest represent —(CH)— is effective as a diagnostic imaging probe targeting amyloid. A diagnostic agent for Alzheimer's disease contains a compound represented by the above formula (1) or a salt thereof. After administration to a patient, the compound and the diagnostic agent for Alzheimer's disease transfer into the patient's brain, and indicate good accumulation on amyloid deposited in the brain.
    Type: Grant
    Filed: May 29, 2012
    Date of Patent: December 15, 2015
    Assignee: NIHON MEDI-PHYSICS CO., LTD.
    Inventors: Yuki Okumura, Yoshifumi Maya, Yoshinari Shoyama, Takako Onishi
  • Patent number: 9149546
    Abstract: A compound that is effective as a diagnostic imaging probe that targets amyloid including is represented by the following formula (1), or salt thereof: wherein R1 is a radioactive halogen substituent, A1 and A2 independently represent CH or N. A diagnostic agent for Alzheimer's disease includes the compound represented by the above formula or a salt thereof. The above compound and the above diagnostic agent for Alzheimer's disease transfer into brain after administration, and indicate good accumulation on amyloid deposited in the brain.
    Type: Grant
    Filed: May 18, 2012
    Date of Patent: October 6, 2015
    Assignee: NIHON MEDI-PHYSICS CO., LTD.
    Inventors: Yuki Okumura, Yoshifumi Maya, Yoshinari Shoyama, Takako Onishi
  • Publication number: 20140228569
    Abstract: A compound that is effective as a diagnostic imaging probe that targets amyloid including is represented by the following formula (1), or salt thereof: wherein R1 is a radioactive halogen substituent, A1 and A2 independently represent CH or N. A diagnostic agent for Alzheimer's disease includes the compound represented by the above formula or a salt thereof. The above compound and the above diagnostic agent for Alzheimer's disease transfer into brain after administration, and indicate good accumulation on amyloid deposited in the brain.
    Type: Application
    Filed: May 18, 2012
    Publication date: August 14, 2014
    Inventors: Yuki Okumura, Yoshifumi Maya, Yoshinari Shoyama, Takako Onishi
  • Publication number: 20140121377
    Abstract: A compound represented by the following formula (1), or a salt thereof: wherein R1 is a radioactive halogen substituent, 0 to 2 of A1, A2, A3 and A4 represent N, and the rest represent —(CH)— is effective as a diagnostic imaging probe targeting amyloid. A diagnostic agent for Alzheimer's disease contains a compound represented by the above formula (1) or a salt thereof. After administration to a patient, the compound and the diagnostic agent for Alzheimer's disease transfer into the patient's brain, and indicate good accumulation on amyloid deposited in the brain.
    Type: Application
    Filed: May 29, 2012
    Publication date: May 1, 2014
    Inventors: Yuki Okumura, Yoshifumi Maya, Yoshinari Shoyama, Takako Onishi
  • Patent number: 7822261
    Abstract: For each teaching image, a plurality of patterns of color pickup regions each include a first region for picking up a color of a first part and a second region for picking up a color of a second part are set, the color of each pixel in the first region and the color of each pixel in the second region are mapped as a target point and an exclusion point respectively, to a color space for each of the patterns of the color pickup regions, a degree in separation between a target point distribution and an exclusion point distribution in the color space is calculated for each of the patterns of the color pickup regions, a pattern of a color pickup region having a maximum degree in separation is selected, a color range which divides the color space and has the largest difference between the number of target points and the number of exclusion points in the selected pattern therein is found, and the found color range is set as a color condition used in a board inspecting process.
    Type: Grant
    Filed: June 21, 2006
    Date of Patent: October 26, 2010
    Assignee: OMRON Corporation
    Inventors: Toshihiro Moriya, Hirotaka Wada, Takako Onishi, Atsushi Shimizu, Akira Nakajima
  • Patent number: 7715616
    Abstract: A PC board inspecting method capable of detecting deviation of an IC component at high speed with small storage capacity utilizes inspection logic particular to a component to be inspected. The inspection logic includes a color condition for specifying a color appearing in the body of the component to be inspected. The component is radiated with a plurality of color rays at different angles of incidence. An image formed by reflection light of the color rays is captured, and an inspection image including at least part of an edge of the body of the component to be inspected is captured. By using the color condition, a component body area satisfying the color condition is extracted from the inspection image by an image process.
    Type: Grant
    Filed: February 21, 2006
    Date of Patent: May 11, 2010
    Assignee: OMRON Corporation
    Inventors: Toshihiro Moriya, Hirotaka Wada, Takako Onishi, Atsushi Shimizu, Akira Nakajima