Patents by Inventor Takamasa Asano
Takamasa Asano has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20250014979Abstract: A through electrode substrate includes a substrate provided with a through hole, a through electrode positioned in the through hole, and a first wiring structure including at least a first wiring layer positioned on a first surface of the substrate, and a second wiring layer positioned on the first wiring layer. The first wiring layer and the second wiring layer respectively have an insulation layer and an electroconductive layer. A first insulation layer of the first wiring layer includes at least an organic layer. At least one wiring layer of the first wiring structure includes an inorganic layer having insulation properties, the inorganic layer being positioned to a first side of the organic layer of the first insulation layer of the first wiring layer.Type: ApplicationFiled: September 25, 2024Publication date: January 9, 2025Applicant: DAI NIPPON PRINTING CO., LTD.Inventors: Shinji MAEKAWA, Hiroshi Kudo, Takamasa Takano, Hiroshi Mawatari, Masaaki Asano
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Patent number: 12119293Abstract: A through electrode substrate includes a substrate provided with a through hole, a through electrode positioned in the through hole, and a first wiring structure including at least a first wiring layer positioned on a first surface of the substrate, and a second wiring layer positioned on the first wiring layer. The first wiring layer and the second wiring layer respectively have an insulation layer and an electroconductive layer. A first insulation layer of the first wiring layer includes at least an organic layer. At least one wiring layer of the first wiring structure includes an inorganic layer having insulation properties, the inorganic layer being positioned to a first side of the organic layer of the first insulation layer of the first wiring layer.Type: GrantFiled: October 8, 2021Date of Patent: October 15, 2024Assignee: DAI NIPPON PRINTING CO., LTD.Inventors: Shinji Maekawa, Hiroshi Kudo, Takamasa Takano, Hiroshi Mawatari, Masaaki Asano
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Patent number: 10510202Abstract: A coin identification device includes: a first magnetic sensor detecting an amount of magnetic variation while the coin passes in the carrying direction; a second magnetic sensor installed where the second magnetic sensor detects a passage of an arc of a small-diameter coin when the first magnetic sensor detects a passage of the small-diameter coin; and a third magnetic sensor installed where the third magnetic sensor does not detect a passage of an arc of the small-diameter coin when the first magnetic sensor and the second magnetic sensor detect a passage of the small-diameter coin and detects a passage of an arc of a large-diameter coin; and an identification control unit identifying an outer diameter of the small-diameter coin and the large-diameter coin based on the amount of magnetic variation of the first magnetic sensor.Type: GrantFiled: October 23, 2017Date of Patent: December 17, 2019Assignee: FUJI ELECTRIC CO., LTD.Inventors: Kazutoshi Machida, Takamasa Asano, Yu Taniguchi, Yoshihiro Nakamura, Nobuyuki Niizuma, Shuhei Saito
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Patent number: 10283337Abstract: Despite the desire to measure the composition and concentration of the microparticles included in a gaseous body sample serving as the measurement target, there is a problem that measurement cannot be performed accurately due to the effect of substances other than the gaseous body sample adsorbing to a trapping body of the analyzing apparatus that traps the microparticles, for example. Therefore, provided is a microparticle composition analyzing apparatus that analyzes composition of microparticles contained in a gaseous body sample, comprising a gas analyzer and a control section that sequentially introduces into the gas analyzer a comparative gas and a sample gas caused by the microparticles generated by irradiating the gaseous body sample with a laser.Type: GrantFiled: July 22, 2016Date of Patent: May 7, 2019Assignee: FUJI ELECTRIC CO., LTD.Inventors: Naoki Takeda, Kazuhiro Koizumi, Takamasa Asano, Yoshiki Hasegawa
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Patent number: 10061034Abstract: A signal processing device (1) includes a noise generator (11) configured to have a noise strength set therein and to output a noise with a set noise strength; a noise adder (12) configured to add the noise to an input signal including a weak signal as a measurement target to generate a noise-added signal; a threshold processing circuit (13) configured to perform threshold processing on the noise-added signal; an evaluating circuit (20) configured to extract, from an output signal output from the threshold processing circuit, a pulse signal component that meets a pulse waveform condition and to evaluate the extracted pulse signal; and a strength setting circuit (31) configured to set, in the noise generator, a noise strength to a desired value based on an output from the evaluating circuit.Type: GrantFiled: March 10, 2016Date of Patent: August 28, 2018Assignee: FUJI ELECTRIC CO., LTD.Inventors: Yasuyuki Masunaga, Takamasa Asano, Kazuhiro Koizumi
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Patent number: 10012628Abstract: A multifunctional particle analysis device includes a particle measuring device and a particle composition analysis device. Calibration particles for which at least the number, size, and composition thereof are known are input to the particle measuring device and the particle composition analysis device and analyzed. The sensitivity of the particle measuring device is calibrated in accordance with the number and size of the calibration particles as measured by the particle measuring device, and the sensitivity of the particle composition analysis device is calibrated in accordance with the mass composition of the calibration particles as measured by the particle composition analysis device. Moreover, the irradiation axis of particles that enter the particle composition analysis device relative to a capturing unit is calibrated in accordance with a state in which the calibration particles are captured on the capturing unit of the particle composition analysis device.Type: GrantFiled: March 11, 2016Date of Patent: July 3, 2018Assignee: FUJI ELECTRIC CO., LTD.Inventors: Yoshiki Hasegawa, Kazuhiro Koizumi, Takamasa Asano, Naoki Takeda
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Publication number: 20180151016Abstract: A coin identification device includes: a first magnetic sensor detecting an amount of magnetic variation while the coin passes in the carrying direction; a second magnetic sensor installed where the second magnetic sensor detects a passage of an arc of a small-diameter coin when the first magnetic sensor detects a passage of the small-diameter coin; and a third magnetic sensor installed where the third magnetic sensor does not detect a passage of an arc of the small-diameter coin when the first magnetic sensor and the second magnetic sensor detect a passage of the small-diameter coin and detects a passage of an arc of a large-diameter coin; and an identification control unit identifying an outer diameter of the small-diameter coin and the large-diameter coin based on the amount of magnetic variation of the first magnetic sensor.Type: ApplicationFiled: October 23, 2017Publication date: May 31, 2018Applicant: FUJI ELECTRIC CO., LTD.Inventors: Kazutoshi MACHIDA, Takamasa ASANO, Yu TANIGUCHI, Yoshihiro NAKAMURA, Nobuyuki NllZUMA, Shuhei SAITO
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Patent number: 9983317Abstract: A signal processing device for detecting a weak signal in an input signal. The device includes first and second pulse detectors and a determining circuit. The first pulse detector adds noise to the input signal, and processes the noise-added signal using a first threshold, to thereby output a first signal having a first pulse waveform component, which corresponds to an interval in which a level of the noise-added input signal exceeds the first threshold. The second pulse detector receives the input signal in parallel with the first pulse detector, and processes the input signal using a second threshold, to thereby output a second signal having a second pulse waveform component, which corresponds to an interval in which a level of the input signal exceeds the second threshold. The determining circuit determines whether each of the first and second pulse waveform components conforms to the weak signal.Type: GrantFiled: June 30, 2016Date of Patent: May 29, 2018Assignee: FUJI ELECTRIC CO., LTD.Inventors: Yasuyuki Masunaga, Takamasa Asano, Kazuhiro Koizumi
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Patent number: 9857282Abstract: A particle analyzing apparatus including a particle measuring section that measures a number or concentration of particles in a sample gas; a component analyzing section that measures an amount of each component of the particles in the sample gas; a flow path that branches into a first flow path that introduces the sample gas to the particle measuring section and a second flow path that introduces the sample gas to the component analyzing section; a first adjusting section that is provided in the first flow path and dilutes the sample gas with a dilution gas and introduces the diluted sample gas to the particle measuring section to adjust a measurement range of the particle measuring section; and a second adjusting section that is provided in the second flow path and adjusts an introduction time during which the sample gas is introduced to the component analyzing section.Type: GrantFiled: November 30, 2016Date of Patent: January 2, 2018Assignee: FUJI ELECTRIC CO., LTD.Inventors: Yoshiki Hasegawa, Naoki Takeda, Kazuhiro Koizumi, Takamasa Asano
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Publication number: 20170292903Abstract: A particle component analyzing device is provided. The particle component analyzing device comprises: a catching body which catches a particle in an aerosol which is subject to measurement, an energy beam irradiating unit which irradiates an energy beam to the particle which is caught by the catching body, and an analyzer which analyzes at least any of a component and an amount of the particle based on a desorbed component of the particle which is desorbed from the catching body by irradiation of the energy beam, wherein the catching body has a temperature measuring unit, the particle component analyzing device further comprising a controlling unit which controls an output of the energy beam irradiating unit based on a temperature of the catching body which is measured by the temperature measuring unit.Type: ApplicationFiled: March 30, 2017Publication date: October 12, 2017Inventors: Yoshiki HASEGAWA, Naoki TAKEDA, Kazuhiro KOIZUMI, Takamasa ASANO
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Publication number: 20170212030Abstract: A particle analyzing apparatus including a particle measuring section that measures a number or concentration of particles in a sample gas; a component analyzing section that measures an amount of each component of the particles in the sample gas; a flow path that branches into a first flow path that introduces the sample gas to the particle measuring section and a second flow path that introduces the sample gas to the component analyzing section; a first adjusting section that is provided in the first flow path and dilutes the sample gas with a dilution gas and introduces the diluted sample gas to the particle measuring section to adjust a measurement range of the particle measuring section; and a second adjusting section that is provided in the second flow path and adjusts an introduction time during which the sample gas is introduced to the component analyzing section.Type: ApplicationFiled: November 30, 2016Publication date: July 27, 2017Inventors: Yoshiki HASEGAWA, Naoki TAKEDA, Kazuhiro KOIZUMI, Takamasa ASANO
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Patent number: 9671325Abstract: A particle measuring device includes: an optical resonator that reflects laser light back and forth between two facing reflective mirrors in order to amplify an energy of that laser light and form resonant laser light; a particle transport unit that transports particles in an aerosol to be measured across a beam path of the resonant laser light; a scattered light receiving unit that receives scattered light produced when the particles in the aerosol are irradiated by the resonant laser light; and a processor that receives light reception signals from the scattered light receiving unit, wherein the processor outputs light reception pulses according to the light reception signals and calculates time intervals between the light reception pulses that are temporally adjacent.Type: GrantFiled: March 11, 2016Date of Patent: June 6, 2017Assignee: FUJI ELECTRIC CO., LTD.Inventors: Naoki Takeda, Kazuhiro Koizumi, Takamasa Asano, Yoshiki Hasegawa
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Publication number: 20170154762Abstract: In a microparticle composition analyzing apparatus, when a depressurized chamber is opened to atmospheric pressure in order to replace a trap, a certain amount of time is needed to vacuum out the entire depressurized chamber again and return the depressurized chamber to the reduced pressure state, and this causes an increase in the dead time of the measurement. Provided is a trap replacement mechanism including a rod that supports a trap for trapping microparticles and a connection portion that includes at least a portion of an auxiliary space connected to a depressurized space in which the trap is provided. The trap can be withdrawn from the depressurized space to the auxiliary space side and opened to atmospheric pressure while the depressurized space is kept in a depressurized state, by moving the rod.Type: ApplicationFiled: October 25, 2016Publication date: June 1, 2017Inventors: Naoki TAKEDA, Yoshiki HASEGAWA, Kazuhiro KOIZUMI, Takamasa ASANO
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Publication number: 20170069476Abstract: Despite the desire to measure the composition and concentration of the microparticles included in a gaseous body sample serving as the measurement target, there is a problem that measurement cannot be performed accurately due to the effect of substances other than the gaseous body sample adsorbing to a trapping body of the analyzing apparatus that traps the microparticles, for example. Therefore, provided is a microparticle composition analyzing apparatus that analyzes composition of microparticles contained in a gaseous body sample, comprising a gas analyzer and a control section that sequentially introduces into the gas analyzer a comparative gas and a sample gas caused by the microparticles generated by irradiating the gaseous body sample with a laser.Type: ApplicationFiled: July 22, 2016Publication date: March 9, 2017Inventors: Naoki TAKEDA, Kazuhiro KOIZUMI, Takamasa ASANO, Yoshiki HASEGAWA
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Publication number: 20170059718Abstract: A signal processing device for detecting a weak signal in an input signal. The device includes first and second pulse detectors and a determining circuit. The first pulse detector adds noise to the input signal, and processes the noise-added signal using a first threshold, to thereby output a first signal having a first pulse waveform component, which corresponds to an interval in which a level of the noise-added input signal exceeds the first threshold. The second pulse detector receives the input signal in parallel with the first pulse detector, and processes the input signal using a second threshold, to thereby output a second signal having a second pulse waveform component, which corresponds to an interval in which a level of the input signal exceeds the second threshold. The determining circuit determines whether each of the first and second pulse waveform components conforms to the weak signal.Type: ApplicationFiled: June 30, 2016Publication date: March 2, 2017Applicant: FUJI ELECTRIC CO., LTD.Inventors: Yasuyuki MASUNAGA, Takamasa ASANO, Kazuhiro KOIZUMI
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Publication number: 20170003221Abstract: A particle measuring device includes: an optical resonator that reflects laser light back and forth between two facing reflective mirrors in order to amplify an energy of that laser light and form resonant laser light; a particle transport unit that transports particles in an aerosol to be measured across a beam path of the resonant laser light; a scattered light receiving unit that receives scattered light produced when the particles in the aerosol are irradiated by the resonant laser light; and a processor that receives light reception signals from the scattered light receiving unit, wherein the processor outputs light reception pulses according to the light reception signals and calculates time intervals between the light reception pulses that are temporally adjacent.Type: ApplicationFiled: March 11, 2016Publication date: January 5, 2017Applicant: Fuji Electric Co., Ltd.Inventors: Naoki TAKEDA, Kazuhiro KOIZUMI, Takamasa ASANO, Yoshiki HASEGAWA
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Publication number: 20160377539Abstract: A multifunctional particle analysis device includes a particle measuring device and a particle composition analysis device. Calibration particles for which at least the number, size, and composition thereof are known are input to the particle measuring device and the particle composition analysis device and analyzed. The sensitivity of the particle measuring device is calibrated in accordance with the number and size of the calibration particles as measured by the particle measuring device, and the sensitivity of the particle composition analysis device is calibrated in accordance with the mass composition of the calibration particles as measured by the particle composition analysis device. Moreover, the irradiation axis of particles that enter the particle composition analysis device relative to a capturing unit is calibrated in accordance with a state in which the calibration particles are captured on the capturing unit of the particle composition analysis device.Type: ApplicationFiled: March 11, 2016Publication date: December 29, 2016Applicant: Fuji Electric Co., Ltd.Inventors: Yoshiki HASEGAWA, Kazuhiro KOIZUMI, Takamasa ASANO, Naoki TAKEDA
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Publication number: 20160356896Abstract: A signal processing device (1) includes a noise generator (11) configured to have a noise strength set therein and to output a noise with a set noise strength; a noise adder (12) configured to add the noise to an input signal including a weak signal as a measurement target to generate a noise-added signal; a threshold processing circuit (13) configured to perform threshold processing on the noise-added signal; an evaluating circuit (20) configured to extract, from an output signal output from the threshold processing circuit, a pulse signal component that meets a pulse waveform condition and to evaluate the extracted pulse signal; and a strength setting circuit (31) configured to set, in the noise generator, a noise strength to a desired value based on an output from the evaluating circuit.Type: ApplicationFiled: March 10, 2016Publication date: December 8, 2016Applicant: FUJI ELECTRIC CO., LTD.Inventors: Yasuyuki MASUNAGA, Takamasa ASANO, Kazuhiro KOIZUMI
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Patent number: 4421887Abstract: A biaxially oriented polyester film composed of a polyester composition comprising (A) 100 parts by weight of a substantially linear polyalkylene terephthalate having ethylene terephthalate as a main structural component, (B) 0.01 to 5 parts by weight of an ester of an aliphatic polyol having at least 4 hydroxyl groups in the molecule with an aliphatic monocarboxylic acid having at least 8 carbon atoms, and (C) not more than 0.8 part by weight of fine inorganic particles having an average particle diameter of not more than about 1 micron and being substantially insoluble in the polyalkylene terephthalate. The aforesaid biaxially oriented polyester film is useful as a base of magnetic tapes.Type: GrantFiled: May 20, 1982Date of Patent: December 20, 1983Assignee: Teijin, LimitedInventors: Shigeru Horie, Takamasa Asano, Tetsuo Ichihashi, Hideo Katoh