Patents by Inventor Takao Sukegawa

Takao Sukegawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20190172486
    Abstract: Disclosed is a perpendicularly magnetized film structure using a highly heat resistant underlayer film on which a cubic or tetragonal perpendicularly magnetized film can grow, comprising a substrate of a cubic single crystal substrate having a (001) plane or a substrate having a cubic oriented film that grows to have the (001) plane; an underlayer formed on the substrate from a thin film of a metal having an hcp structure in which the [0001] direction of the thin metal film forms an angle in the range of 42° to 54° with respect to the <001> direction or the (001) orientation of the substrate; and a perpendicularly magnetized layer located on the metal underlayer and formed from a cubic material selected from a Co-based Heusler alloy and a cobalt-iron (CoFe) alloy having a bcc structure a constituent material, and grown to have the (001) plane.
    Type: Application
    Filed: December 10, 2018
    Publication date: June 6, 2019
    Applicant: NATIONAL INSTITUTE FOR MATERIALS SCIENCE
    Inventors: Hiroaki SUKEGAWA, Zhenchao WEN, Seiji MITANI, Koichiro INOMATA, Takao FURUBAYASHI, Jason Paul HADORN, Tadakatsu OHKUBO, Kazuhiro HONO, Jungwoo KOO
  • Patent number: 8842178
    Abstract: The object of the invention is to provide a supervising system for image to detect a scheme at high accuracy. The supervising system for image is provided with a first portion for detecting change of time detecting the change of time in amount of feature of an image taken pictures by a image forming device, a second portion for detecting change of time in the illuminance detected by an illuminance sensor, and a scheme judging portion detecting a scheme against the image forming device in accordance with the change of time in amount of feature and the change of time in the illuminance as detected.
    Type: Grant
    Filed: February 19, 2010
    Date of Patent: September 23, 2014
    Assignee: Hitachi, Ltd.
    Inventors: Takashi Saeki, Masaya Itoh, Masato Kazui, Masanori Miyoshi, Hisao Oodawa, Kouichi Shiraishi, Takao Sukegawa
  • Patent number: 8817102
    Abstract: A device which can support a determination of a camera layout by automatically preparing the camera layout that satisfies a customer request based on the customer request including a surveillance layout. Specifically, a need table that is a data set of a plurality of arrangement candidate cameras satisfying the customer request is prepared from the customer request including the surveillance layout. An arrangement of the plurality of the arrangement candidate cameras on a map is calculated based on the need table using a clustering method and a temporary layout of cameras is prepared. Then, an arrangement layout of the cameras in the surveillance layout is determined based on the temporary layout.
    Type: Grant
    Filed: June 28, 2011
    Date of Patent: August 26, 2014
    Assignee: Hitachi, Ltd.
    Inventors: Takashi Saeki, Ryo Yumiba, Masaya Itoh, Takao Sukegawa, Yasuhiro Suda, Masanori Miyoshi
  • Publication number: 20110317016
    Abstract: A device which can support a determination of a camera layout by automatically preparing the camera layout that satisfies a customer request based on the customer request including a surveillance layout. Specifically, a need table that is a data set of a plurality of arrangement candidate cameras satisfying the customer request is prepared from the customer request including the surveillance layout. An arrangement of the plurality of the arrangement candidate cameras on a map is calculated based on the need table using a clustering method and a temporary layout of cameras is prepared. Then, an arrangement layout of the cameras in the surveillance layout is determined based on the temporary layout.
    Type: Application
    Filed: June 28, 2011
    Publication date: December 29, 2011
    Inventors: Takashi SAEKI, Ryo Yumiba, Masaya Itoh, Takao Sukegawa, Yasuhiro Suda, Masanori Miyoshi
  • Publication number: 20110205360
    Abstract: The object of the invention is to provide a supervising system for image to detect a scheme at high accuracy. The supervising system for image is provided with a first portion for detecting change of time detecting the change of time in amount of feature of an image taken pictures by a image forming device, a second portion for detecting change of time in the illuminance detected by an illuminance sensor, and a scheme judging portion detecting a scheme against the image forming device in accordance with the change of time in amount of feature and the change of time in the illuminance as detected.
    Type: Application
    Filed: February 19, 2010
    Publication date: August 25, 2011
    Inventors: Takashi SAEKI, Masaya Itoh, Masato Kazui, Masanori Miyoshi, Hisao Oodawa, Kouichi Shiraishi, Takao Sukegawa
  • Patent number: 6972681
    Abstract: An monitoring apparatus, when detecting an abnormality in objects to be monitored by the monitoring apparatus or an abnormal state in the monitoring apparatus, which indicates the location or contents of the abnormality or abnormal state and also indicates a method for coping with it by sound or by OSD. When an administrator pushes a security-navi button, abnormality information in the objects to be monitored and a method for coping with it are displayed as a menu on the OSD. When the administrator operates the monitoring apparatus according to the displayed menu, the cause of the abnormality and a method for overcoming it can be provided.
    Type: Grant
    Filed: January 30, 2004
    Date of Patent: December 6, 2005
    Assignee: Hitachi, Ltd.
    Inventors: Yoshiaki Matsuoka, Mitsuru Terakado, Kouji Nosato, Takao Sukegawa
  • Publication number: 20040257217
    Abstract: An monitoring apparatus, when detecting an abnormality in objects to be monitored by the monitoring apparatus or an abnormal state in the monitoring apparatus, which indicates the location or contents of the abnormality or abnormal state and also indicates a method for coping with it by sound or by OSD. When an administrator pushes a security-navi button, abnormality information in the objects to be monitored and a method for coping with it are displayed as a menu on the OSD. When the administrator operates the monitoring apparatus according to the displayed menu, the cause of the abnormality and a method for overcoming it can be provided.
    Type: Application
    Filed: January 30, 2004
    Publication date: December 23, 2004
    Inventors: Yoshiaki Matsuoka, Mitsuru Terakado, Kouji Nosato, Takao Sukegawa