Patents by Inventor Takayuki Fukai
Takayuki Fukai has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 9368796Abstract: A graphite material having pores which, when 200 rectangular regions of 6 ?m×8 ?m are randomly selected in a surface image of the graphite material observed by a scanning electron microscope, in the surface of the graphite material appearing in the regions, a pore appearing on the surface and having an aperture in a shape having a diameter of 15 nm to 200 nm, a circularity degree of 0.75 to 1.0 and a major axis/minor axis ratio of 1.0 to 1.5 is visible in two regions or more. Also disclosed is a carbon material for battery electrodes, a paste for electrodes, an electrode and a lithium ion secondary battery including the graphite material.Type: GrantFiled: October 19, 2012Date of Patent: June 14, 2016Assignee: SHOW A DENKO K.K.Inventors: Yasuaki Wakizaka, Yuuichi Kamijou, Masataka Takeuchi, Takayuki Fukai, Chiaki Sotowa, Akinori Sudoh, Masako Tanaka
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Patent number: 9284192Abstract: A method for producing a graphie material for an electrode material for lithium ion batteries, including a step for exothermically graphitizing a carbon material by directly passing an electric current therethrough. The carbon material has an compact powder resistivity of 0.4 ?·cm or less when compressed to a density of 1.4 g/cm3, has an angle of repose in the range of 20° to 50° inclusive, and has a particle size (D90) in the volume-based particle size distribution measured using laser diffraction of 120 ?m or less. The average surface interval (d002) of a surface (002) of the carbon material after graphitization, measured using x-ray diffraction, is in the range of 0.3354 nm-0.3450 nm inclusive.Type: GrantFiled: October 19, 2012Date of Patent: March 15, 2016Assignee: SHOWA DENKO K.K.Inventors: Masataka Takeuchi, Yuuichi Kamijou, Yoshiyuki Nishimura, Ryusuke Miura, Takayuki Fukai, Chiaki Sotowa
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Patent number: 9059467Abstract: A method for producing a graphite material for lithium ion batteries, including a step for exothermically graphitizing a carbon material by directly applying an electric current therethrough. The carbon material is obtained by heating at a temperature in the range of 800° C.-1500° C. inclusive and subsequently pulverizing an organic carbon starting material, has a compact powder resistivity of 0.3 ? cm or less when compressed to a density of 1.4 g/cm3, has an angle of repose in the range of 20° to 50° inclusive, and has a particle size (D90) in the volume-based particle size distribution measured using laser diffraction of 120 ?m or less. The average surface interval (d002) of a surface (002) of the carbon material after graphitization, measured using x-ray diffraction, is in the range of 0.3354 nm-0.3450 nm inclusive.Type: GrantFiled: October 19, 2012Date of Patent: June 16, 2015Assignee: SHOWA DENKO K.K.Inventors: Yasuaki Wakizaka, Yuuichi Kamijou, Masataka Takeuchi, Yoshiyuki Nishimura, Ryusuke Miura, Takayuki Fukai
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Publication number: 20140335428Abstract: A graphite material having pores which, when 200 rectangular regions of 6 ?m×8 ?m are randomly selected in a surface image of the graphite material observed by a scanning electron microscope, in the surface of the graphite material appearing in the regions, a pore appearing on the surface and having an aperture in a shape having a diameter of 15 nm to 200 nm, a circularity degree of 0.75 to 1.0 and a major axis/minor axis ratio of 1.0 to 1.5 is visible in two regions or more. Also disclosed is a carbon material for battery electrodes, a paste for electrodes, an electrode and a lithium ion secondary battery including the graphite material.Type: ApplicationFiled: October 19, 2012Publication date: November 13, 2014Applicant: SHOWA DENKO K.K.Inventors: Yasuaki Wakizaka, Yuuichi Kamijou, Masataka Takeuchi, Takayuki Fukai, Chiaki Sotowa, Akinori Sudoh, Masako Tanaka
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Publication number: 20140255292Abstract: A method for producing a graphite material for lithium ion batteries, including a step for exothermically graphitizing a carbon material by directly applying an electric current therethrough. The carbon material is obtained by heating at a temperature in the range of 800° C.-1500° C. inclusive and subsequently pulverizing an organic carbon starting material, has a compact powder resistivity of 0.3 ?cm or less when compressed to a density of 1.4 g/cm3, has an angle of repose in the range of 20° to 50° inclusive, and has a particle size (D90) in the volume-based particle size distribution measured using laser diffraction of 120 ?m or less. The average surface interval (d002) of a surface (002) of the carbon material after graphitization, measured using x-ray diffraction, is in the range of 0.3354 nm-0.3450 nm inclusive.Type: ApplicationFiled: October 19, 2012Publication date: September 11, 2014Applicant: SHOWA DENKO K.K.Inventors: Yasuaki Wakizaka, Yuuichi Kamijou, Masataka Takeuchi, Yoshiyuki Nishimura, Ryusuke Miura, Takayuki Fukai
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Publication number: 20140205532Abstract: A method for producing a graphie material for an electrode material for lithium ion batteries, including a step for exothermically graphitizing a carbon material by directly passing an electric current therethrough. The carbon material has an compact powder resistivity of 0.4 ?·cm or less when compressed to a density of 1.4 g/cm3, has an angle of repose in the range of 20° to 50° inclusive, and has a particle size (D90) in the volume-based particle size distribution measured using laser diffraction of 120 ?m or less. The average surface interval (d002) of a surface (002) of the carbon material after graphitization, measured using x-ray diffraction, is in the range of 0.3354 nm-0.3450 nm inclusive.Type: ApplicationFiled: October 19, 2012Publication date: July 24, 2014Inventors: Masataka Takeuchi, Yuuichi Kamijou, Yoshiyuki Nishimura, Ryusuke Miura, Takayuki Fukai, Chiaki Sotowa
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Patent number: 7587025Abstract: In an X-ray analysis apparatus and an X-ray analysis method, a quantitative analysis is stably performed by stably behaving an X-ray source. There are possessed an X-ray tubular bulb irradiating a primary X-ray to a sample, a primary X-ray adjustment mechanism capable of adjusting an intensity of the primary X-ray, an X-ray detector detecting a characteristic X-ray radiated from the sample, thereby outputting a signal including energy informations of the characteristic X-ray and a scattered X-ray, an analyzer analyzing the above signal, and an incident X-ray adjustment mechanism disposed between the sample and the X-ray detector, and capable of adjusting a total intensity of the characteristic X-ray and the scattered x-ray, which are entered to the X-ray detector.Type: GrantFiled: January 10, 2008Date of Patent: September 8, 2009Assignee: SII NanoTechnology Inc.Inventors: Takayuki Fukai, Yoshiki Matoba, Kiyoshi Hasegawa
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Patent number: 7529337Abstract: To provide an energy dispersion type radiation detecting system and a method of measuring a content of an object element capable of carrying out a measurement by determining an intensity of an incidence radiation to constitute an optimum minimum limit of detection by restraining an influence of a pile up, the energy dispersion type radiation detecting system includes an incidence system of irradiating the incidence radiation to a sample by a predetermined intensity, a detection system of detecting a radiation emitted from the sample by irradiating the incidence radiation for specifying a content of an object element of the sample based on a spectrum of the detected radiation, and the energy dispersion type radiation detecting system includes a control portion capable of irradiating the incidence radiation by an optimum intensity by determining the optimum intensity of the incidence radiation minimizing a minimum limit of detection of the object element based on the spectrum of the detected radiation.Type: GrantFiled: June 21, 2007Date of Patent: May 5, 2009Assignee: SII Nano Technology Inc.Inventors: Yoshiki Matoba, Kiyoshi Hasegawa, Takayuki Fukai
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Patent number: 7436926Abstract: A sample sealing vessel 8 includes a plurality of wall faces comprising a material for transmitting X-ray, an X-ray source 1 is arranged at a wall face 11 to irradiate primary X-ray, a face 12 different from the face irradiated with the primary X-ray is arranged to be opposed to an X-ray detector 10, and the primary X-ray from the X-ray source 1 is arranged to be able to irradiate the wall face 12 of the sample sealing vessel to which the X-ray detector 10 is opposed.Type: GrantFiled: May 3, 2007Date of Patent: October 14, 2008Assignee: SII Nano Technology Inc.Inventors: Yoshiki Matoba, Takayuki Fukai, Masanori Takahashi, Yutaka Ikku
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Patent number: 7428293Abstract: There is provided a fluorescent X-ray analysis apparatus in which a detection lower limit has been improved by reducing an X-ray generating subsidiarily and detected. The fluorescent X-ray analysis apparatus is one which possesses an X-ray source irradiating a primary X-ray, and a detector in which a collimator having a through-hole in its center part has been placed in a front face, and in which, by the detector, there is detected a primary fluorescent X-ray which generates from a sample by irradiating the primary X-ray to a sample, and passes through the through-hole of the collimator.Type: GrantFiled: March 28, 2007Date of Patent: September 23, 2008Assignee: SII Nanotechnology Inc.Inventors: Takayuki Fukai, Yoshiki Matoba
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Patent number: 7424093Abstract: To provide a fluorescent X-ray analysis apparatus, whereby a peak-back ratio is improved by effectively exciting a focused element and a detection limit of the focused element is improved by decreasing a scattered X-ray to be a background. A sample housing has one or more wall surfaces made of a material through which an X-ray transmits and an X-ray source is arranged so that a primary X-ray is irradiated on the wall surface. In addition, the sample housing is arranged so that a wall surface different from a wall surface on which the primary X-ray is irradiated is opposed to an X-ray detector incident window. Further, the primary X-ray from the X-ray source is arranged so as to be able to irradiate the wall surface of the sample housing to which the X-ray detector incident window is opposed. The sample housing has a shape extending in response to extension of a viewing filed that a detection element in the X-ray detector is seen from the X-ray detector incident window.Type: GrantFiled: May 24, 2007Date of Patent: September 9, 2008Assignee: SII NanoTechnology Inc.Inventors: Takayuki Fukai, Yoshiki Matoba, Masanori Takahashi
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Publication number: 20080212739Abstract: In an X-ray analysis apparatus and an X-ray analysis method, a quantitative analysis is stably performed by stably behaving an X-ray source. There are possessed an X-ray tubular bulb irradiating a primary X-ray to a sample, a primary X-ray adjustment mechanism capable of adjusting an intensity of the primary X-ray, an X-ray detector detecting a characteristic X-ray radiated from the sample, thereby outputting a signal including energy informations of the characteristic X-ray and a scattered X-ray, an analyzer analyzing the above signal, and an incident X-ray adjustment mechanism disposed between the sample and the X-ray detector, and capable of adjusting a total intensity of the characteristic X-ray and the scattered x-ray, which are entered to the X-ray detector.Type: ApplicationFiled: January 10, 2008Publication date: September 4, 2008Inventors: Takayuki Fukai, Yoshiki Matoba, Kiyoshi Hasegawa
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Publication number: 20080013681Abstract: There is provided a fluorescent X-ray analysis apparatus in which a detection lower limit has been improved by reducing an X-ray generating subsidiarily and detected. The fluorescent X-ray analysis apparatus is one which possesses an X-ray source irradiating a primary X-ray, and a detector in which a collimator having a through-hole in its center part has been placed in a front face, and in which, by the detector, there is detected a primary fluorescent X-ray which generates from a sample by irradiating the primary X-ray to a sample, and passes through the through-hole of the collimator.Type: ApplicationFiled: March 28, 2007Publication date: January 17, 2008Inventors: Takayuki Fukai, Yoshiki Matoba
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Publication number: 20080008293Abstract: To provide an energy dispersion type radiation detecting system and a method of measuring a content of an object element capable of carrying out a measurement by determining an intensity of an incidence radiation to constitute an optimum minimum limit of detection by restraining an influence of a pile up, the energy dispersion type radiation detecting system includes an incidence system of irradiating the incidence radiation to a sample by a predetermined intensity, a detection system of detecting a radiation emitted from the sample by irradiating the incidence radiation for specifying a content of an object element of the sample based on a spectrum of the detected radiation, and the energy dispersion type radiation detecting system includes a control portion capable of irradiating the incidence radiation by an optimum intensity by determining the optimum intensity of the incidence radiation minimizing a minimum limit of detection of the object element based on the spectrum of the detected radiation.Type: ApplicationFiled: June 21, 2007Publication date: January 10, 2008Inventors: Yoshiki Matoba, Kiyoshi Hasegawa, Takayuki Fukai
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Publication number: 20070274441Abstract: To provide a fluorescent X-ray analysis apparatus, whereby a peak-back ratio is improved by effectively exciting a focused element and a detection limit of the focused element is improved by decreasing a scattered X-ray to be a background. A sample housing has one or more wall surfaces made of a material through which an X-ray transmits and an X-ray source is arranged so that a primary X-ray is irradiated on the wall surface. In addition, the sample housing is arranged so that a wall surface different from a wall surface on which the primary X-ray is irradiated is opposed to an X-ray detector incident window. Further, the primary X-ray from the X-ray source is arranged so as to be able to irradiate the wall surface of the sample housing to which the X-ray detector incident window is opposed. The sample housing has a shape extending in response to extension of a viewing filed that a detection element in the X-ray detector is seen from the X-ray detector incident window.Type: ApplicationFiled: May 24, 2007Publication date: November 29, 2007Inventors: Takayuki Fukai, Yoshiki Matoba, Masanori Takahashi
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Publication number: 20070269004Abstract: A sample sealing vessel 8 includes a plurality of wall faces comprising a material for transmitting X-ray, an X-ray source 1 is arranged at a wall face 11 to irradiate primary X-ray, a face 12 different from the face irradiated with the primary X-ray is arranged to be opposed to an X-ray detector 10, and the primary X-ray from the X-ray source 1 is arranged to be able to irradiate the wall face 12 of the sample sealing vessel to which the X-ray detector 10 is opposed.Type: ApplicationFiled: May 3, 2007Publication date: November 22, 2007Applicant: SII NANO TECHNOLOGY INC.Inventors: Yoshiki Matoba, Takayuki Fukai, Masanori Takahashi, Yutaka Ikku
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Patent number: 5870424Abstract: In order to prevent the rupturing of a graphite electrode comprising electrode sections joined with one another by a socket and a nipple, electrical insulating material is applied on the joined surfaces to decrease the current across the nipple.Type: GrantFiled: June 20, 1996Date of Patent: February 9, 1999Assignee: Showa Denko KabushikikaishaInventors: Masao Todoriki, Takayuki Fukai, Yoshishige Sekiguchi, Osamu Kanazawa, Hiroyuki Yamashita