Abstract: A control apparatus, system, method and program that enable simultaneous measurement of counts of multiple energy ranges in an efficient configuration are provided. A control apparatus 200 for controlling an X-ray detector 100 and outputting a measurement result comprises a setting section 220 configured to set the energy range of X-rays to be detected for each unit region of the X-ray detector 100, a data management section 250 configured to acquire a count value of the set energy range for each unit region as measurement data by a result of the X-ray measurement, and an outputting section 270 configured to output the measurement data. Thus, counting of multiple energy ranges can simultaneously be measured.

Abstract: There are provided a storage section 220 that stores an output value read out by counting a pulse signal of incident X-rays, by a photon-counting type semiconductor detector; and a calculation section 230 that calculates a count value based on the output value that has been read out, wherein the calculation section 230 uses a model in which an apparent time constant of the pulse signal monotonously decreases against increase in pulse detection ratio with respect to exposure. According to such a model, the corresponding apparent time constant is able to be obtained even in any higher count rate. As a result of this, reduced can be the influence of count loss even on the count rate that has not been able to be covered by the conventional method.

Abstract: A detector capable of securing space for arranging pixels in the vicinity of edges of adjacent readout chips according to design of counting circuits. A 2-dimensional hybrid pixel array detector configured to detect radiation rays, including a detection unit configured to detect the radiation rays incident in a region of each pixel 115, and a plurality of the readout chips including counting circuits 121 respectively connected to each of the pixels 115, the counting circuits 121 having a smaller set pitch than the pixels 115 along a certain direction in a detection surface. The regions occupied by the pixels and counting circuits corresponding to the pixels overlapping at least partially, and the connection being made in the overlapping regions.

Abstract: There are provided a storage section 220 that stores an output value read out by counting a pulse signal of incident X-rays, by a photon-counting type semiconductor detector; and a calculation section 230 that calculates a count value based on the output value that has been read out, wherein the calculation section 230 uses a model in which an apparent time constant of the pulse signal monotonously decreases against increase in pulse detection ratio with respect to exposure. According to such a model, the corresponding apparent time constant is able to be obtained even in any higher count rate. As a result of this, reduced can be the influence of count loss even on the count rate that has not been able to be covered by the conventional method.

Abstract: A processing apparatus that enables margin correction of X-ray intensity data includes a calculation unit configured to calculate an expansion rate of X-ray intensity data detected in a unit region on a marginal side on a basis of an intensity distribution resulted from detection of uniform X-ray and a first function generation unit configured to generate an allocation function that allocates the X-ray intensity data detected in the unit region on the marginal side to an outside unit region, on the basis of the expansion rate. Enabling margin correction on the basis of the intensity distribution resulting from detection of uniform X-ray makes it possible to correct the distortion of intensity distribution on the marginal side. As a result, it is possible to expand the detection region of X-ray intensity data.

Abstract: Provided are a data processing apparatus a method of obtaining the characteristic of each pixel and a method of data processing, and a program. A data processing apparatus 100 to correct X-ray intensity data measured by a pixel detector includes a characteristic storage unit 130 to store the characteristic of each pixel in a specific detector, a correction table generation unit 120 to apply a measurement condition input as that in measurement by a specific detector and a value expressing the characteristic of each pixel to an approximate formula expressing the count value of each pixel and to generate a correction table for the specific detector using the calculation result of the approximate formula, and a correction unit 160 to correct the X-ray intensity data measured by the specific detector using the generated correction table.

Abstract: A detector capable of securing space for arranging pixels in the vicinity of edges of adjacent readout chips according to design of counting circuits. A 2-dimensional hybrid pixel array detector configured to detect radiation rays, including a detection unit configured to detect the radiation rays incident in a region of each pixel 115, and a plurality of the readout chips including counting circuits 121 respectively connected to each of the pixels 115, the counting circuits 121 having a smaller set pitch than the pixels 115 along a certain direction in a detection surface. The regions occupied by the pixels and counting circuits corresponding to the pixels overlapping at least partially, and the connection being made in the overlapping regions.

Abstract: A processing apparatus that enables margin correction of X-ray intensity data includes a calculation unit configured to calculate an expansion rate of X-ray intensity data detected in a unit region on a marginal side on a basis of an intensity distribution resulted from detection of uniform X-ray and a first function generation unit configured to generate an allocation function that allocates the X-ray intensity data detected in the unit region on the marginal side to an outside unit region, on the basis of the expansion rate. Enabling margin correction on the basis of the intensity distribution resulting from detection of uniform X-ray makes it possible to correct the distortion of intensity distribution on the marginal side. As a result, it is possible to expand the detection region of X-ray intensity data.

Abstract: The X-ray data processing apparatus to estimate a true value from an X-ray count value detected by the pixel array X-ray detector of a photon counting system includes a management unit 210 to receive and manage a detection value for each detection part, an effective area ratio calculation unit 230 to calculate a ratio of a detection ability under the influence of the charge share to an original detection ability in the detection part as an effective area ratio of the detection part using data regarding the detection part and data regarding an X-ray source and a detection energy threshold value, and a correction unit 250 to correct the managed count value using the calculated effective area ratio to estimate a true value.

Abstract: An X-ray data processing apparatus for processing X-ray data that is obtained by simultaneously measuring X-rays of multiple wavelengths. The apparatus includes a management unit 210 to receive and manage X-ray data that is detected by a detector, a calculation unit 230 which calculates a detection amount of charge sharing events in lower energy side data caused by higher energy X-ray, based on the higher energy side data obtained using a threshold value on a higher energy side and the lower energy side data obtained using a threshold value on a lower energy side of the received X-ray data, and a correction unit 250 to reconfigure the lower energy side data using the calculated detection amount. The apparatus can remove a residual image of an X-ray on a higher energy side which remains in data on a lower energy side.

Abstract: Provided are an X-ray data processing apparatus and a method and a program therefor which can eliminate the influence of the phenomenon that the statistical variation of a count value after distribution is estimated differently from that at another position and can prevent the influence of correction from remaining. An X-ray data processing apparatus 200 that corrects the count value of X-ray intensity detected by a pixel array type detector includes a storage unit 220 to store a correspondence relationship of the shape and the position of a virtual pixel with respect to the shape and the position of an actual pixel, and a distribution unit 260 to distribute the count value of the actual pixel to the virtual pixel using a correspondence relationship in which randomness is provided to the stored correspondence relationship, and outputs the count value distributed to the virtual pixel as a correction result.

Abstract: Provided are a data processing apparatus a method of obtaining the characteristic of each pixel and a method of data processing, and a program. A data processing apparatus 100 to correct X-ray intensity data measured by a pixel detector includes a characteristic storage unit 130 to store the characteristic of each pixel in a specific detector, a correction table generation unit 120 to apply a measurement condition input as that in measurement by a specific detector and a value expressing the characteristic of each pixel to an approximate formula expressing the count value of each pixel and to generate a correction table for the specific detector using the calculation result of the approximate formula, and a correction unit 160 to correct the X-ray intensity data measured by the specific detector using the generated correction table.

Abstract: There are provided a radiation detector capable of detecting radiation without occurrence of dead time while maintaining an exposure state in which radiation enters continuously, and an X-ray analysis apparatus and a radiation detection method using the radiation detector. A radiation detector 100 that detects radiation in synchronization with an external apparatus 200, includes: a sensor 110 that generates pulses when radiation particles are detected; a plurality of counters 140a, 140b provided so as to be able to count the pulses; and a control circuit 160 configured to switch a counter to count the pulses among the plurality of counters 140a, 140b, when receiving a synchronization signal from the external apparatus 200.

Abstract: There are provided a radiation detector capable of detecting radiation without occurrence of dead time while maintaining an exposure state in which radiation enters continuously, and an X-ray analysis apparatus and a radiation detection method using the radiation detector. A radiation detector 100 that detects radiation in synchronization with an external apparatus 200, includes: a sensor 110 that generates pulses when radiation particles are detected; a plurality of counters 140a, 140b provided so as to be able to count the pulses; and a control circuit 160 configured to switch a counter to count the pulses among the plurality of counters 140a, 140b, when receiving a synchronization signal from the external apparatus 200.

Abstract: To provide an X-ray detector facilitating the installing and replacement work of a module while reducing the possibility of breakage. An X-ray detector 50 detecting X-ray image data for each detection module includes: a detection module 7 provided with a protruding frame on a back side of a detection device detecting X-rays; and a guide frame 12 fitting into the protruding frame and removably supporting the detection device, wherein the guide frame 12 fixes the position of the detection device relative to the guide frame 12 by fitting. Therefore, fitting the protruding frame 8 into the guide frame 12 enables precise and easy installation/removal of the detection module. That is a detection module can be newly installed onto the guide frame without interfering each other with adjacent detection modules already installed while minimizing a space therebetween.

Abstract: An image processing method and an image processing apparatus which remove the effects of cosmic rays, noise and defective pixels without losing data in a specified time and which can correct image data efficiently and with high accuracy are provided. An image processing method of performing correction processing on an abnormal value of X-ray image data is provided which includes the steps of: (S3) determining whether or not there exists a target element with intensity significantly different from intensity of peripheral elements, in a three dimensional space formed with a space axis and a time axis defined by a series of captured image frames; and (S9) replacing the intensity of the target element with a replacement value calculated from the intensity of peripheral elements.

Abstract: Provided are an X-ray data processing apparatus and a method and a program therefor which can eliminate the influence of the phenomenon that the statistical variation of a count value after distribution is estimated differently from that at another position and can prevent the influence of correction from remaining. An X-ray data processing apparatus 200 that corrects the count value of X-ray intensity detected by a pixel array type detector includes a storage unit 220 to store a correspondence relationship of the shape and the position of a virtual pixel with respect to the shape and the position of an actual pixel, and a distribution unit 260 to distribute the count value of the actual pixel to the virtual pixel using a correspondence relationship in which randomness is provided to the stored correspondence relationship, and outputs the count value distributed to the virtual pixel as a correction result.

Abstract: The X-ray data processing apparatus to estimate a true value from an X-ray count value detected by the pixel array X-ray detector of a photon counting system includes a management unit 210 to receive and manage a detection value for each detection part, an effective area ratio calculation unit 230 to calculate a ratio of a detection ability under the influence of the charge share to an original detection ability in the detection part as an effective area ratio of the detection part using data regarding the detection part and data regarding an X-ray source and a detection energy threshold value, and a correction unit 250 to correct the managed count value using the calculated effective area ratio to estimate a true value.

Abstract: A correction information generation method and a correction information generation apparatus enabling easy Flat-Field Correction operation without special accessory equipment are provided. The correction information generation method for performing Flat-Field Correction of X-ray detection sensitivity on a pixel detector, includes the steps of: moving the relative position of a detector 130 with respect to an incident X-ray having a cross-sectional beam shape traversing a detection surface so that the whole of the detection surface is irradiated with the incident X-ray in total time and each of pixels arranged in the moving direction is uniformly irradiated; and generating information for correcting the sensitivity of a pixel based on an intensity value detected for a given energy band of the incident X-ray.

Abstract: A radiation detector 100 has a plurality of single-photon-counting imaging cells, including an imaging cell 1 configured to generate a detection signal in accordance with the intensity of radiation, a digitization circuit 5 configured to digitize the detection signal, a data read structure 11 configured to count the digitized detection signal and to keep the result as a data bit, and a send-out register 13 configured to control the input of a predetermined data bit output from the data read structure 11 by a data shift in accordance with a first clock Pck, to keep the input data bit as a result of the control, and to send out the kept data bit by a data shift in accordance with a second clock Sck.