Abstract: A method and apparatus for simulating breakdown of an electronic component are provided. The method includes: when a terminal of an equivalent circuit model receives test charges, pulling up a voltage level of a first node of the equivalent circuit model; when the voltage level of the first node reaches a first threshold, turning on a first voltage controlled switch to pull up a voltage level of a second node of the equivalent circuit model; when the voltage level of the second mode reaches a second threshold, turning on a second voltage controlled switch to pull down a voltage level of the terminal to a holding voltage level to simulate snapback breakdown of the electronic component; and turning on a third voltage controlled switch to pull down the voltage level of the second node to turn off the second voltage controlled switch, thereby simulating second breakdown of the electronic component.

Abstract: An integrated circuit for power clamping is provided. The integrated circuit for power clamping is electrically coupled to an internal circuit of an integrated circuit through a power line and a ground line, and includes a switch, a first resistor, a capacitor, an inverter and a voltage detection circuit. The voltage detection circuit detects a voltage of the power line, and when the voltage of the power line exceeds a threshold value, the voltage detection circuit electrically connects a first node to the ground line, such that a low potential signal from the ground line is input to the input terminal of the inverter, and then the switch is turned on to form a discharge path.

Abstract: An IC layout of a pre-driving circuit, comprising: a plurality of type one transistor regions, having a density smaller than a predetermined level; and a type two bulk region, surrounding the type one transistor regions.

Abstract: An integrated circuit includes a load circuit and an electrostatic discharge (ESD) circuit. The load circuit includes a first and a second I/O terminal. The ESD circuit is coupled to the first and the second I/O terminal. The ESD circuit includes a first protection circuit configured to conduct a first ESD current from the first to the second I/O terminal. The first protection circuit includes a first, a second, a third doped region, and a well. The first doped region is coupled to the first I/O terminal, and has a first conductive type. The well is coupled to the first doped region, and has a second conductive type different from the first conductive type. The second doped region is coupled to the well, and has the first conductive type. The third doped region couples the second doped region to the second I/O terminal, and has the second conductive type.

Abstract: The present invention discloses an electrostatic discharge protection circuit having time-extended discharging mechanism. A RC circuit is coupled between an ESD input terminal that receives an ESD input and a ground terminal and includes an input control terminal. An inverter includes a P-type transistor coupled between the ESD input terminal and an output control terminal and an N-type transistor circuit including N-type transistors coupled in series and between the output control terminal and a ground terminal, wherein two of the N-type transistors has an internal connection terminal. Gates of the P-type transistor and N-type transistors are controlled by the input control terminal. A switch transistor is coupled between the ESD input terminal and the internal connection terminal. A discharging transistor is coupled between the ESD input terminal and the ground terminal. The gates of the switch transistor and the discharging transistor are controlled by the output control terminal.

Abstract: An electrostatic discharge protection circuit includes a voltage drop circuit, a detector circuit, and a clamping circuit. The voltage drop circuit is configured to generate a second voltage according to a first voltage. The second voltage is smaller than the first voltage. The detector circuit is coupled to the voltage drop circuit. The detector circuit is configured to generate a control signal according to the second voltage and an input voltage. The clamping circuit is coupled to the voltage drop circuit and the detector circuit. The clamping circuit is configured to provide an electrostatic discharge path according to a voltage level of the control signal.

Abstract: The present invention discloses an electrostatic discharge protection circuit having false-trigger prevention mechanism. A RC circuit, including an input control terminal, is coupled between an electrostatic discharge input terminal for receiving an input power and a ground terminal. An inverter includes a P-type transistor circuit, including P-type transistors coupled between the electrostatic discharge input terminal and an output control terminal in series and having an internal connection terminal between two of the P-type transistors, and an N-type transistor, coupled between the output control terminal and the ground terminal. Gates of the P-type and N-type transistors are controlled by the input control terminal A switch transistor, having the gate controlled by the input control terminal, is coupled between the internal connection terminal and the ground terminal.

Abstract: A semiconductor device includes an active area structure, at least one gate and at least one isolation structure. The active area structure is arranged along a first direction. The at least one gate is arranged above the active area structure and along a second direction. The second direction is different from the first direction. The at least one isolation structure is arranged in the active area structure. A length of the at least one isolation structure is shorter than a width of the active area structure in the second direction.

Abstract: The present invention discloses an electrostatic discharge protection circuit having time-extended discharging mechanism. A RC circuit is coupled between an ESD input terminal that receives an ESD input and a ground terminal and includes an input control terminal. An inverter includes a P-type transistor coupled between the ESD input terminal and an output control terminal and an N-type transistor circuit including N-type transistors coupled in series and between the output control terminal and a ground terminal, wherein two of the N-type transistors has an internal connection terminal. Gates of the P-type transistor and N-type transistors are controlled by the input control terminal. A switch transistor is coupled between the ESD input terminal and the internal connection terminal. A discharging transistor is coupled between the ESD input terminal and the ground terminal. The gates of the switch transistor and the discharging transistor are controlled by the output control terminal.

Abstract: The present invention discloses an electrostatic discharge protection circuit having false-trigger prevention mechanism. A RC circuit, including an input control terminal, is coupled between an electrostatic discharge input terminal for receiving an input power and a ground terminal An inverter includes a P-type transistor circuit, including P-type transistors coupled between the electrostatic discharge input terminal and an output control terminal in series and having an internal connection terminal between two of the P-type transistors, and an N-type transistor, coupled between the output control terminal and the ground terminal. Gates of the P-type and N-type transistors are controlled by the input control terminal A switch transistor, having the gate controlled by the input control terminal, is coupled between the internal connection terminal and the ground terminal.

Abstract: The present disclosure discloses an output circuit having a voltage-withstanding mechanism that includes a PMOS, a NMOS, a voltage-withstanding auxiliary NMOS and a voltage-withstanding auxiliary circuit. The PMOS includes a first source terminal and a first drain terminal coupled to a voltage source and an output terminal and a first gate receiving a first input signal. The NMOS includes a second source terminal and a second drain terminal coupled to a ground terminal and a connection terminal and a second gate receiving a second input signal. The auxiliary NMOS includes a third drain terminal and a third source terminal coupled to the output terminal and the connection terminal. The auxiliary circuit is coupled to the voltage source and a third gate of the auxiliary NMOS and provides a current conducting mechanism and a resistive mechanism respectively when the output terminal is operated at a logic high level and a logic low level.

Abstract: A diode, which is implemented in a semiconductor structure, includes a substrate, and first, second, third and fourth conductors. The substrate contains first and second doped regions. The first and second doped regions are used respectively as a first electrode and a second electrode of the diode. The first and third conductors are in a first conductor layer of the semiconductor structure and are connected to the first and second doped regions, respectively. The second and fourth conductors are in a second conductor layer of the semiconductor structure and are connected to the first and third conductors, respectively. In a side view of the semiconductor structure, an overlapping area between the first conductor and the third conductor is larger than an overlapping between of the second conductor and the fourth conductor.

Abstract: An electrostatic discharge (ESD) protection device includes a voltage divider circuit, a detection circuit, and a clamping circuit. The voltage divider circuit outputs N?1 bias voltages according to a first voltage and a second voltage, in which N is a positive integer greater than or equal to 2. The detection circuit detects an ESD event according to a voltage level at a predetermined node associated with the first voltage and the second voltage, and to generate N control signals according to the first voltage, the second voltage, and the N?1 bias voltages. When the ESD event occurs, the voltage level of the N control signals are the same as the first voltage. The clamping circuit is turned on according to the N control signals when the ESD event occurs, in order to provide a discharging path of a current associated with the ESD event.

Abstract: An integrated circuit includes a load circuit and an electrostatic discharge (ESD) circuit. The load circuit includes a first and a second I/O terminal. The ESD circuit is coupled to the first and the second I/O terminal. The ESD circuit includes a first protection circuit configured to conduct a first ESD current from the first to the second I/O terminal. The first protection circuit includes a first, a second, a third doped region, and a well. The first doped region is coupled to the first I/O terminal, and has a first conductive type. The well is coupled to the first doped region, and has a second conductive type different from the first conductive type. The second doped region is coupled to the well, and has the first conductive type. The third doped region couples the second doped region to the second I/O terminal, and has the second conductive type.

Abstract: A semiconductor device includes an active area structure, at least one gate and at least one isolation structure. The active area structure is arranged along a first direction. The at least one gate is arranged above the active area structure and along a second direction. The second direction is different from the first direction. The at least one isolation structure is arranged in the active area structure. A length of the at least one isolation structure is shorter than a width of the active area structure in the second direction.

Abstract: The present disclosure discloses an output circuit having a voltage-withstanding mechanism that includes a PMOS, a NMOS, a voltage-withstanding auxiliary NMOS and a voltage-withstanding auxiliary circuit. The PMOS includes a first source terminal and a first drain terminal coupled to a voltage source and an output terminal and a first gate receiving a first input signal. The NMOS includes a second source terminal and a second drain terminal coupled to a ground terminal and a connection terminal and a second gate receiving a second input signal. The auxiliary NMOS includes a third drain terminal and a third source terminal coupled to the output terminal and the connection terminal The auxiliary circuit is coupled to the voltage source and a third gate of the auxiliary NMOS and provides a current conducting mechanism and a resistive mechanism respectively when the output terminal is operated at a logic high level and a logic low level.

Abstract: An electrostatic discharge protection circuit includes a voltage drop circuit, a detector circuit, and a clamping circuit. The voltage drop circuit is configured to generate a second voltage according to a first voltage. The second voltage is smaller than the first voltage. The detector circuit is coupled to the voltage drop circuit. The detector circuit is configured to generate a control signal according to the second voltage and an input voltage. The clamping circuit is coupled to the voltage drop circuit and the detector circuit. The clamping circuit is configured to provide an electrostatic discharge path according to a voltage level of the control signal.

Abstract: Disclosed is a transmission gate circuit including a control voltage generating circuit, a high voltage transmission circuit and a low voltage transmission circuit. The high and low voltage transmission circuits are coupled between an input terminal and an output terminal. The control voltage generating circuit generates two voltage groups according to an input voltage of the input terminal and an enable voltage and thereby controls the high and low voltage transmission circuits with the two voltage groups respectively. When the enable voltage is high, one voltage group includes identical voltages while a difference between any of the identical voltages and any voltage of the other voltage group is not higher than a predetermined voltage; when the enable voltage is low, each voltage group includes decremental voltages. The high/low voltage transmission circuit is turned on when the enable voltage is high and the input voltage is high/low.

Abstract: Disclosed is an inverter capable of withstanding a high voltage. The inverter includes a control voltage generating circuit, a high voltage transmission circuit, and a low voltage transmission circuit. The control voltage generating circuit generates a first group of control voltages and a second group of control voltages according to an input voltage, in which one group includes decrement voltages and the other group includes identical voltages. The high/low voltage transmission circuit is coupled between a high/low voltage terminal and an output terminal, wherein when the input voltage is low/high, the high/low voltage transmission circuit is turned on according to the first/second group of control voltages so that an output voltage of the output terminal is equal to a high/low voltage of the high/low voltage terminal.

Abstract: An ESD protection device includes a detection circuit and a clamping circuit. The detection circuit is configured to output a first control signal and a second control signal according to a first voltage and a second voltage that is different from the first voltage, in which if an ESD event occurs, the detection circuit is configured to perform an inverse operation according to the second voltage, in order to generate the first control signal and the second control signal. The clamping circuit is configured to be turned on according to the first control signal and the second control signal, in order to provide a discharging path for a current associated with the ESD event.