Patents by Inventor Timothy R. Piwonka-Corle
Timothy R. Piwonka-Corle has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11366036Abstract: A gauge having a housing formed of a polymer material and one or more electrical feedthrough pins disposed in the housing. The electrical feedthrough pins can be oriented substantially perpendicular to each other and have complex shapes.Type: GrantFiled: December 11, 2020Date of Patent: June 21, 2022Assignee: MKS Instruments, Inc.Inventors: Brandon J. Kelly, Clinton L. Percy, Scott C. Heinbuch, Gerardo A. Brucker, Timothy C. Swinney, Timothy R. Piwonka-Corle
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Publication number: 20210096035Abstract: A gauge having a housing formed of a polymer material and one or more electrical feedthrough pins disposed in the housing. The electrical feedthrough pins can be oriented substantially perpendicular to each other and have complex shapes.Type: ApplicationFiled: December 11, 2020Publication date: April 1, 2021Inventors: Brandon J. Kelly, Clinton L. Percy, Scott C. Heinbuch, Gerardo A. Brucker, Timothy C. Swinney, Timothy R. Piwonka-Corle
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Patent number: 10876917Abstract: A gauge having a housing formed of a polymer material and one or more electrical feedthrough pins disposed in the housing. The electrical feedthrough pins can be oriented substantially perpendicular to each other and have complex shapes.Type: GrantFiled: May 17, 2019Date of Patent: December 29, 2020Assignee: MKS Instruments, Inc.Inventors: Brandon J. Kelly, Clinton L. Percy, Scott C. Heinbuch, Gerardo A. Brucker, Timothy C. Swinney, Timothy R. Piwonka-Corle
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Publication number: 20190271607Abstract: A gauge having a housing formed of a polymer material and one or more electrical feedthrough pins disposed in the housing. The electrical feedthrough pins can be oriented substantially perpendicular to each other and have complex shapes.Type: ApplicationFiled: May 17, 2019Publication date: September 5, 2019Inventors: Brandon J. Kelly, Clinton L. Percy, Scott C. Heinbuch, Gerardo A. Brucker, Timothy C. Swinney, Timothy R. Piwonka-Corle
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Patent number: 10359332Abstract: A gauge having a housing formed of a polymer material and one or more electrical feedthrough pins disposed in the housing. The electrical feedthrough pins can be oriented substantially perpendicular to each other and have complex shapes.Type: GrantFiled: January 13, 2016Date of Patent: July 23, 2019Assignee: MKS Instruments, Inc.Inventors: Brandon J. Kelly, Clinton L. Percy, Scott C. Heinbuch, Gerardo A. Brucker, Timothy C. Swinney, Timothy R. Piwonka-Corle
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Publication number: 20160209288Abstract: A gauge having a housing formed of a polymer material and one or more electrical feedthrough pins disposed in the housing. The electrical feedthrough pins can be oriented substantially perpendicular to each other and have complex shapes.Type: ApplicationFiled: January 13, 2016Publication date: July 21, 2016Inventors: Brandon J. Kelly, Clinton L. Percy, Scott C. Heinbuch, Gerardo A. Brucker, Timothy C. Swinney, Timothy R. Piwonka-Corle
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Patent number: 9040907Abstract: An apparatus includes an electrostatic ion trap and electronics configured to measure parameters of the ion trap and configured to adjust ion trap settings based on the measured parameters. A method of tuning the electrostatic ion trap includes, under automatic electronic control, measuring parameters of the ion trap and adjusting ion trap settings based on the measured parameters.Type: GrantFiled: October 30, 2012Date of Patent: May 26, 2015Assignee: MKS Instruments, Inc.Inventors: Gerardo A. Brucker, G. Jeffery Rathbone, Brian J. Horvath, Timothy C. Swinney, Stephen C. Blouch, Jeffrey G. McCarthy, Timothy R. Piwonka-Corle
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Publication number: 20140264068Abstract: An apparatus includes an electrostatic ion trap and electronics configured to measure parameters of the ion trap and configured to adjust ion trap settings based on the measured parameters. A method of tuning the electrostatic ion trap includes, under automatic electronic control, measuring parameters of the ion trap and adjusting ion trap settings based on the measured parameters.Type: ApplicationFiled: October 30, 2012Publication date: September 18, 2014Inventors: Gerardo A. Brucker, G. Jefferey Rathbone, Brian J. Horvath, Timothy C. Swinney, Stephen C. Blouch, Jeffrey G. McCarthy, Timothy R. Piwonka-Corle
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Patent number: 7424177Abstract: A variable attenuation signal acquisition probing system and voltage measurement system uses an optical cavity to acquire a signal under test. The probing system has an optical transmitter and receiver that are coupled to the optical cavity via an optical transmission system. The optical cavity has an electrode structure having apertures formed in the optical cavity that are parallel to propagation path of the optical signal within the cavity. A modulated optical signal is generated by the optical cavity in response to the signal under test creating an electro-magnetic field distribution in electro-optic material in the optical cavity that overlaps the optical path of the optical signal propagating in the optical cavity which varies the index of refraction of electro-optic material in the optical path. Changes in the polarization state of the optical signal attenuates the magnitude of the output electrical signal of the optical receiver.Type: GrantFiled: March 2, 2007Date of Patent: September 9, 2008Assignee: Tektronix, Inc.Inventors: Christopher P. Yakymyshyn, Timothy R. Piwonka-Corle, William Q. Law, William A. Hagerup
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Patent number: 7310455Abstract: A variable attenuation signal acquisition probing system and voltage measurement system uses an optical cavity to acquire a signal under test. The probing system has an optical transmitter and receiver that are coupled to the optical cavity via an optical transmission system. The optical cavity has an electrode structure having apertures formed in the optical cavity that are parallel to propagation path of the optical signal within the cavity. A modulated optical signal is generated by the optical cavity in response to the signal under test creating an electromagnetic field distribution in electro-optic material in the optical cavity that overlaps the optical path of the optical signal propagating in the optical cavity which varies the index of refraction of electro-optic material in the optical path. Changes in the polarization state of the optical signal attenuates the magnitude of the output electrical signal of the optical receiver.Type: GrantFiled: March 10, 2005Date of Patent: December 18, 2007Assignee: Tektronix, Inc.Inventors: Christopher P. Yakymyshyn, Timothy R. Piwonka-Corle, William Q. Law, William A. Hagerup
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Patent number: 7221813Abstract: A signal acquisition probing system uses an optical cavity to acquire a signal under test. The probing system has an optical transmitter and receiver that are coupled to the optical cavity via an optical transmission system. The optical cavity has an electrode structure having apertures formed in the optical cavity that are parallel to propagation path of the optical signal within the cavity. A modulated optical signal is generated by the optical cavity in response to the signal under test creating an electro-magnetic field distribution in electro-optic material in the optical cavity that overlaps the optical path of the optical signal propagating in the optical cavity which varies the index of refraction of electro-optic material in the optical path. The signal acquisition probing system is connected to a measurement instrument to form a voltage measurement system.Type: GrantFiled: March 10, 2005Date of Patent: May 22, 2007Assignee: Tektronix, Inc.Inventors: Christopher P. Yakymyshyn, William Q. Law, William A. Hagerup, Timothy R. Piwonka-Corle
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Publication number: 20040100632Abstract: A method and system for spectroscopic ellipsometry employing reflective optics to measure a small region of a sample by reflecting radiation (preferably broadband UV, visible, and near infrared radiation) from the region. The system preferably has an autofocus assembly and a processor programmed to determine from the measurements the thickness and/or complex refractive index of a thin film on the sample. Preferably, only reflective optics are employed along the optical path between the polarizer and analyzer, a sample beam reflects with low incidence angle from each component of the reflective optics, the beam is reflectively focused to a small, compact spot on the sample at a range of high incidence angles, and an incidence angle selection element is provided for selecting for measurement only radiation reflected from the sample at a single, selected angle (or narrow range of angles). The focusing mirror preferably has an elliptical shape to reduce off-axis aberrations in the focused beam.Type: ApplicationFiled: November 18, 2003Publication date: May 27, 2004Inventors: Timothy R. Piwonka-Corle, Karen F. Scoffone, Xing Chen, Lloyd J. Lacomb, Jean-Louis Stehle, Dorian Zahorski, Jean-Pierre Rey
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Patent number: 6734967Abstract: A method and system for spectroscopic ellipsometry employing reflective optics to measure a small region of a sample by reflecting radiation (preferably broadband UV, visible, and near infrared radiation) from the region. The system preferably has an autofocus assembly and a processor programmed to determine from the measurements the thickness and/or complex refractive index of a thin film on the sample. Preferably, only reflective optics are employed along the optical path between the polarizer and analyzer, a sample beam reflects with low incidence angle from each component of the reflective optics, the beam is reflectively focused to a small, compact spot on the sample at a range of high incidence angles, and an incidence angle selection element is provided for selecting for measurement only radiation reflected from the sample at a single, selected angle (or narrow range of angles). The focusing mirror preferably has an elliptical shape to reduce off-axis aberrations in the focused beam.Type: GrantFiled: February 11, 1999Date of Patent: May 11, 2004Assignee: KLA-Tencor Technologies CorporationInventors: Timothy R. Piwonka-Corle, Karen F. Scoffone, Xing Chen, Lloyd J. Lacomb, Jr., Jean-Louis Stehle, Dorian Zahorski, John-Pierre Rey
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Patent number: 5910842Abstract: A method and system for spectroscopic ellipsometry employing reflective optics to measure a small region of a sample by reflecting radiation (preferably broadband UV, visible, and near infrared radiation) from the region. The system preferably has an autofocus assembly and a processor programmed to determine from the measurements the thickness and/or complex refractive index of a thin film on the sample. Preferably, only reflective optics are employed along the optical path between the polarizer and analyzer, a sample beam reflects with low incidence angle from each component of the reflective optics, the beam is reflectively focused to a small, compact spot on the sample at a range of high incidence angles, and an incidence angle selection element is provided for selecting for measurement only radiation reflected from the sample at a single, selected angle (or narrow range of angles). The focusing mirror preferably has an elliptical shape to reduce off-axis aberrations in the focused beam.Type: GrantFiled: November 27, 1996Date of Patent: June 8, 1999Assignee: Kla-Tencor CorporationInventors: Timothy R. Piwonka-Corle, Xing Chen, Lloyd J. Lacomb, Jr., Jean-Louis Stehle, Dorian Zahorski
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Patent number: 5608526Abstract: A method and system for spectroscopic ellipsometry employing reflective optics to measure a small region of a sample by reflecting radiation (preferably broadband UV, visible, and near infrared radiation) from the region. The system preferably has an autofocus assembly and a processor programmed to determine from the measurements the thickness and/or complex refractive index of a thin film on the sample. Preferably, only reflective optics are employed along the optical path between the polarizer and analyzer, a sample beam reflects with low incidence angle from each component of the reflective optics, the beam is reflectively focused to a small, compact spot on the sample at a range of high incidence angles, and an incidence angle selection element is provided for selecting for measurement only radiation reflected from the sample at a single, selected angle (or narrow range of angles). The focusing mirror preferably has an elliptical shape,to reduce off-axis aberrations in the focused beam.Type: GrantFiled: January 19, 1995Date of Patent: March 4, 1997Assignee: Tencor InstrumentsInventors: Timothy R. Piwonka-Corle, Karen F. Scoffone, Xing Chen, Lloyd J. Lacomb, Jr., Jean-Louis Stehle, Dorian Zahorski, Jean-Pierre Rey